Mechanical Components and Assemblies

New Meridian S Inverted Static Optical Fault Isolation System is Used for Semiconductor Failure Analysis
Isolators

New Meridian S Inverted Static Optical Fault Isolation System is Used for Semiconductor Failure Analysis

Can isolate electrical faults that cause semiconductor devices to fail at end-of-line test. Includes FDx with Active Probe amplifier and the device is used in photon emission and static laser stimulation applications. Offers both topside probing, wafer pieces and backside probing for conventionally packaged devices and provides laser marker option with an accuracy level 2 microns.

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