Coating Thickness Testers

Sensors Monitors & Transducers, Test & Measuring Instruments

Viscosity Tester offers 2 instrument in one option.

May 25, 2016

Used for determination of viscosity in P (Poise) or cP, DV2000 Viscothinner is suitable for paint, coating, and ink industry. Unit features 4-line backlit digital display and stable drive system that creates wide measurement range and accurate readings. Instrument can be used in Manual, Maxhold, and Timed modes. ENTER key starts rotation/measurement, stops motor, and validates selected spindle... Read More

Sensors Monitors & Transducers, Test & Measuring Instruments

Wireless Sensor and App measure coating thickness.

Jan 07, 2016

Combining precise measurements, resistance to interference, and wireless technology, SmarTest version of SIDSP® Sensors relay digitally generated readings to smartphone or tablet via Bluetooth. Readings exceeding set limits are indicated on sensor's green/red LED. SmarTest App provides clear display of current measuring value, statistical evaluation, storage of measuring values in files,... Read More

Sensors Monitors & Transducers, Test & Measuring Instruments

Coating Thickness Gauge uses magnetic and eddy current principles.

Sep 26, 2014

Comprising 3 configurations, rugged 6000GP Series measures paint and coating thickness from 0–60 mils (0–1500 µm) on ferrous and non-ferrous metals with resolution of 0.05 or 0.1 mil (1 or 2 µm). Accuracy ranges from 0.05 mils + 1% for 0–2 mils to 2 µm + 1 for >50 µm. Along with audible and visual Hi/Lo alarm, features include impact-resistant and backlit Lexan® display,... Read More

Sensors Monitors & Transducers, Test & Measuring Instruments

CyberOptics to Debut Its Conformal Coating Inspection Solution at SMTA International

Sep 05, 2014

CyberOptics Corporation (Nasdaq: CYBE) announces that it will launch its CX150i™ Conformal Coating Inspection system in Booth #218 at SMTA International, scheduled to take place Sep. 30 - Oct. 1, 2014 at the Donald Stephens Convention Center in Rosemont, IL. The multi-award winning SE600™ 3D SPI system will also be displayed at the show. All CyberOptics’ inspection solutions come with the... Read More

Sensors Monitors & Transducers, Test & Measuring Instruments

Oxford Instruments Expands Its Comprehensive Product Line of X-Ray Fluorescence (XRF) Coating Thickness Instruments for Quality Control

Aug 25, 2014

Concord, MA – Oxford Instruments, a leader in coating thickness analysis, has added several new analyzers to its product line, now offering the most complete range of products available for coating thickness on the U.S. market today.  Oxford Instruments recently significantly extended its XRF product range for coating thickness by adding the COMPACT Eco, MAXXI Eco and MAXXI 5 models to its... Read More

Machinery & Machining Tools, Sensors Monitors & Transducers, Software, Test & Measuring Instruments, Textile Industry Products

NDC Announces Complete Solutions for Lithium Ion Battery Web Gauging Applications

Sep 11, 2013

Irwindale, California – ( – NDC announces significant new on-line measurement and control products for the manufacture of lithium ion battery (LIB) components. Due to the popularity of lithium ion batteries in our modern society, manufacturers are focusing greater attention toward the critical parts of their manufacturing processes in order to... Read More

Sensors Monitors & Transducers, Software, Test & Measuring Instruments

FISCHER DataCenter IP - Instruments with Detailed Inspection Plans

Nov 26, 2012

Fischer Technology's DUALSCOPE® FMP100 and FMP150 coating thickness measurement instruments harmonize the flexibility and capabilities of PC-based lab instruments with the manageability of compact portable units. The unit has Windows(TM) CE operating system with a graphical user interface and a user definable file and folder structure. The high resolution touchscreen with virtual keypad... Read More

Laboratory and Research Supplies and Equipment, Material Handling & Storage, Test & Measuring Instruments

Rudolph's MetaPULSE System Selected for Advanced Packaging R&D

Sep 10, 2012

Dynamic growth in advanced packaging arena drives need for critical process characterization technologies Flanders, New Jersey - Rudolph Technologies, Inc. (NASDAQ: RTEC), a leading provider of inspection, metrology and process control software for semiconductor manufacturing, announced today that a premier global industry research center in Asia has purchased Rudolph's MetaPULSE® G Metrology... Read More

Sensors Monitors & Transducers, Test & Measuring Instruments

Multipurpose Gauge accepts interchangeable probes.

Jun 15, 2012

By accepting fully interchangeable coating thickness, environmental, surface profile, and ultrasonic wall thickness probes that retain their calibration information, PosiTector gauge body facilitates conversion from coating thickness gauge to surface profile gauge, dew point meter, or ultrasonic wall thickness gauge. Standard and Advanced models feature built-in memory, onscreen statistics, and... Read More

Sensors Monitors & Transducers, Test & Measuring Instruments

Measuring Electroplated Nickel Coatings with the FISCHER MMS NICKELSCOPE®

Jun 07, 2012

Fischer Technology's MMS NICKELSCOPE® is a multi-measurement system using the Hall Effect test method for non-destructive coating thickness measurement of electroplated nickel coatings on electrically non-conductive or non-ferrous substrates as well as non-ferrous metal coatings (copper, aluminum, lead etc...) on steel. It is also ideal for measuring thick non-ferrous coatings.

  • Up to 50... Read More

  • Sensors Monitors & Transducers, Test & Measuring Instruments

    Coating Thickness Tester offers automatic substrate recognition.

    Apr 12, 2012

    Equipped with USB interface and software, CG204 uses magnetic induction for ferrous substrates and eddy current measurement for non-ferrous substrates. Available measuring modes include Single and Continuous, while working modes include Direct and Group. Able to store 80 Direct and 320 Group readings in memory, tester provides Min/Max/Average functions, single- or 2-point calibration, and... Read More

    Material Handling & Storage, Portable Tools, Test & Measuring Instruments

    Thin Film Vacuum Deposition Cluster Tool Delivered to Naval Research Laboratory

    Mar 09, 2011

    Clairton, PA. - Kurt J. Lesker Company recently shipped a multi-technique, production grade cluster tool to the Naval Research Laboratory in Washington, DC. Various stations of the cluster tool operate in high and ultra high vacuum and make use of advanced physical vapor deposition (PVD) processes, including magnetron sputtering, electron beam and thermal evaporation, and ion assisted deposition... Read More

    Laboratory and Research Supplies and Equipment, Test & Measuring Instruments

    Rudolph Wins Multiple System Orders for Its Latest MetaPULSE-G Metrology System

    Feb 15, 2011

    Combining improved sensitivity to copper, on product measurement capability, and cost of ownership improvements drive acceptance for high volume interconnect metrology Flanders, New Jersey - Rudolph Technologies, Inc. (NASDAQ: RTEC), a leading provider of process characterization equipment and software for wafer fabs and advanced packaging facilities, announced today that it has received multiple... Read More

    Sensors Monitors & Transducers, Test & Measuring Instruments

    Coating Thickness Gauges measure non-magnetic, insulating coatings.

    Jun 03, 2010

    MiniTest Models 70 F and 70 FN both measure non-magnetic coatings from 0-3,000 µm thick applied on steel. Additionaly, Model 70 FN measures 0-2,500 µm thick insulating coatings on non-ferrous metals, and automatically identifies substrate maerial and switches to suitable measuring principle upon surface contact. Both gauges offer 4-button operation and run on AA battery. They display number... Read More

    Materials & Material Processing, Test & Measuring Instruments

    Coulometric Titrator performs multi-sample analyses.

    Dec 14, 2009

    Equipped with ultra-trace moisture measurement mode with accuracy of 10 µg H20, AQ-2200 Series AQUACOUNTER® Karl Fischer Coulometric Titrator allows 2 titration stations to run parallel with various coulometric/volumetric combinations. Several electrolytic cells are available including small volume and 1-compartment versions. It features 7.5 in. color touch screen, stores results in... Read More

    Optics & Photonics, Test & Measuring Instruments

    Microspectrophotometer measures thin films.

    Jul 20, 2009

    Combining advanced microspectroscopy with sophisticated software, QDI 2010 Film(TM) non-destructively measures thickness of thin films of photovoltaic cells by either transmission or reflectance. With sampling areas ranging from over 100 microns across to less than 1 micron, instrument can analyze many materials on both transparent and opaque substrates. Features such as contamination analysis... Read More

    Laboratory and Research Supplies and Equipment, Test & Measuring Instruments

    Metrology System offers copper process control solution.

    May 27, 2009

    Measuring 60-80 product wafers/hr, MetaPULSE®-G thin film measurement tool is optimized specifically for copper damascene processes at 45 through 22 nm technology nodes and copper via fill in 3D IC applications. Tool uses green wavelength laser for measurement repeatability better than 0.3%. System's 10 x 10 µm spot size is small enough to measure wafers in 30 x 30 µm or smaller test... Read More

    Sensors Monitors & Transducers, Test & Measuring Instruments

    Portable Touchscreen Instrument measures coating thickness.

    Nov 03, 2008

    Combining 2 physical measurement methods, DUALSCOPE® FMP100 calculates thickness for non-magnetic coatings on ferrous substrate materials and electrically non-conducting coatings on NF-metals. Configuration options promote clear presentation of results, and user can create application-specific interfaces and printform templates. While USB port enables connection to external keyboard, printer,... Read More

    Test & Measuring Instruments

    Rudolph Technologies and Entrepix, Inc. Announce License Agreement

    Dec 26, 2007

    Entrepix to market Rudolph AutoEL Series Ellipsometer FLANDERS, NJ (November 27, 2007)-Rudolph Technologies, Flanders, New Jersey, and Entrepix, Inc., Tempe, Arizona, announced today that Rudolph has granted Entrepix an exclusive license to manufacture, sell, service and support the Rudolph AutoEL(TM)® series of thin-film ellipsometers. The AutoEL(TM)® was the first microprocessor-based... Read More

    Test & Measuring Instruments

    Thin Film Analyzers perform on-line composition analysis.

    Apr 23, 2004

    Non-contact, solid-state AOTF-NIR Thin Film Analyzers measure physical and chemical properties on various substrates and coatings. Able to be placed within production lines, instruments perform on-line specification verification and chemical composition analysis/evaluation of adhesives, coatings thickness, and organic lacquers or lubricants. Sensors provide full spectrum scanning and can be... Read More