Test & Measurement

New 392x and 295x Optical Inspection Systems Achieve Unparalleled Levels of Sensitivity
Sensors / Detectors / Transducers

New 392x and 295x Optical Inspection Systems Achieve Unparalleled Levels of Sensitivity

Use different wavelength ranges to cover inspection applications for all layers. eDR7380 e-beam wafer defect review system provides fast defect sourcing in development, fast excursion detection and more accurate, actionable data during production. Designed to accelerate time-to-market for leading-edge 3D NAND, DRAM and logic integrated circuits (ICs) throughout their product lifecycle.

Read More »
Richardson RFPD Introduces New Buck Boost Evaluation Kit from Wolfspeed
Test Kits

Richardson RFPD Introduces New Buck Boost Evaluation Kit from Wolfspeed

Optimized to demonstrate high-speed switching capability of Wolfspeed’s 3rd generation silicon carbide MOSFETs July 2, 2019 – Geneva, Ill.: Richardson RFPD, Inc. announced today the availability and full design support capabilities for a new buck boost evaluation kit from Wolfspeed, a Cree Company. The KIT-CRD-3DD12P buck boost evaluation kit is optimized to demonstrate the high-speed...

Read More »
Balluff Named 2019 Best of Sensors Award Winner for SmartLight Indicator
Indicators

Balluff Named 2019 Best of Sensors Award Winner for SmartLight Indicator

Balluff’s SmartLight Indicator recognized for excellence in sensors innovation. FLORENCE, KY. (PRWEB) JUNE 27, 2019 Balluff has been named a 2019 “Best of Sensors” Award winner. The company’s SmartLight Indicator was recognized as the 2019 Innovative Product of the Year which highlights cutting-edge advancements and achievements that are moving the sensors industry forward. The...

Read More »

All Topics