Landrex AOI Technology Chosen by Northeast EMS Provider
Santa Clara, California, USA - Landrex Technologies, Inc. announces the recent sale of its Optima II 7301 Express AOI system to Intelligent Manufacturing Solutions (IMS), Inc., an EMS provider located in Manchester, New Hampshire, USA. In announcing the purchase, Jeff Buxton, Technical Operations Manager at IMS, said, We evaluated a number of systems that we felt would specifically address IMS'...
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Olympus NDT Adds to the OmniScan MX Product Line-Two New Entry-Level, Low-Cost Modules-for Manual Phased Array Inspection
October 2006 Olympus NDT is pleased to announce the addition of the 16:16M and 16:64M manual phased array inspection modules to its OmniScan MX series. Seeing a need for a low-cost, entry-level solution for manual phased array inspection, Olympus NDT, the leader in phased array technology, has added these new entry-level flaw detectors as the newest members of the OmniScan MX product line. The...
Read More »Inspection System can measure stack-up length.
Featuring swivel touch screens and Windows XP OS, automated inspection systems are available in 2-, 6-, or 8-laser configurations and can be outfitted with eddy current and vision add-ons to provide complete part inspection. Integrated length and acceleration analyzer can measure stack-up lengths, head height, partial lengths, and overall length to +.0015 in. with zero mechanical adjustments....
Read More »Optical Inspection System handles up to 650 x 550 mm PCBs.
Model M22XDL-650 benchtop Automatic Optical Inspection system supports board inspection including SMT components, reflow and wave solder joints, and solder paste. With throughput of 100,000 components/hr, it is powered by Intel Pro Mac control system, allowing it to deliver true 24-bit color imaging. Features include 3 PWM LED light sources and up to 6 different lighting combinations. Clearances...
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Key Elements to Designing Sound Enclosures
Download our guide to learn about the crucial factors in designing effective sound enclosures.
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Circuit Edit/Validation System uses ion column technology.
Offering circuit edit capabilities, V600CE accelerates semiconductor design validation and performance optimization on 65 nm and below devices. Etching planarity is promoted with NanoChemix(TM) tri-nozzle gas delivery system, which accommodates range of precursors for etching and deposition. Dynamic end-point solution displays live imaging of active pattern as well as both stage current readings...
Read More »Delkin's Award Winning SensorScope(TM) Now Shipping Separately
Due to an overwhelming demand for Delkin Devices' patent-pending SensorScope, Delkin is now offering the option of purchasing the multiple award winning SensorScope separate from their cleaning system. Camera manufacturers, dealers and DSLR users worldwide have enthusiastically embraced the product, resulting in several prestigious awards like a 2007 Innovative Digital Products Award from the...
Read More »STEM System analyzes multiple wafer samples.
Designed for semiconductor labs, Expida(TM) 1255S DualBeam(TM) System integrates STEM Scanning/Transmission Electron Microscopy sample preparation with high-resolution imaging and analysis in single tool. It features ion beam column for preparing TEM samples, and electron column with 14-segment STEM detector for 30 kV imaging. System assures correct end-pointing and precise lamella thickness by...
Read More »Wafer Inspection System suits price-sensitive applications.
Automated macro defect inspection solution, NSXÃ-® 100, is designed for back-end manufacturing environment as well as front-end quality assurance (QA) applications. Able to handle wafers up to 200 mm at throughputs to 88 wph, system detects macro defects (0.5 micron and larger) to provide QA and feedback on process performance. Balance of throughput and resolution is suited to processes such...
Read More »VJ Inspection Systems Launches into EU Market; Introduces W4000 X-Ray Automotive Wheel Inspection System
W4000 Improves QC Management, Achieves Complete Coverage in a Single Image DSSELDORF, GERMANY, 12 June 2007 - VJ Inspection Systems, an industry leader in X- ray inspection products and technology headquartered in Bohemia, New York, USA, today officially marked its entry into the European Union market with the introduction of the VJT W4000 X-Ray Wheel Inspection System at the GIFA 2007 11th...
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Wafer Handling System offers sub-45 nm process control.
Expida(TM) 1255S wafer DualBeam(TM) system integrates wafer-level STEM (scanning/transmission electron microscopy) sample preparation with imaging and analysis capabilities. Equipped with ion beam column for preparing TEM samples and electron column with 14-segment STEM detector for high-resolution 30 kV imaging, system ensures correct end-pointing and precise lamella thickness by enabling STEM...
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Material Handling Solutions from Global Leader in Rubber & Urethane Power Transmission
Megadyne's QST polyurethane timing belts take up less space and guarantee a lower noise level than chain and other traditional material handling belts. Check out our video to learn more.
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