Inspection Equipment

KLA Introduces Two New Systems That Take on Semiconductor Manufacturing's Toughest Problems
Inspection Equipment

KLA Introduces Two New Systems That Take on Semiconductor Manufacturing's Toughest Problems

PWG5™ attacks 3D NAND process issues while Surfscan® SP7XP tackles 3nm logic defectivity Milpitas, Calif., Dec. 10, 2020 /PRNewswire/ -- Today KLA Corporation (NASDAQ: KLAC) announced two new products: the PWG5™ wafer geometry system and the Surfscan® SP7XP wafer defect inspection system. The new systems are designed to address exceedingly difficult issues in the manufacture of...

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Seal Stuff In, Seal Stuff Out
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Seal Stuff In, Seal Stuff Out

One of the best ways to make sure that your machinery stays up and running in the face of adversity is to make sure that it's properly sealed. Of course, it's not always easy to determine whether the integrity of your seals are up to par. How can you tell when you have a problem?

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