Inspection Equipment

New 392x and 295x Optical Inspection Systems Achieve Unparalleled Levels of Sensitivity
Flaw Sensors / Detectors

New 392x and 295x Optical Inspection Systems Achieve Unparalleled Levels of Sensitivity

Use different wavelength ranges to cover inspection applications for all layers. eDR7380 e-beam wafer defect review system provides fast defect sourcing in development, fast excursion detection and more accurate, actionable data during production. Designed to accelerate time-to-market for leading-edge 3D NAND, DRAM and logic integrated circuits (ICs) throughout their product lifecycle.

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The Next Wave of Intelligent Design Automation
Sponsored

The Next Wave of Intelligent Design Automation

In the amount of time it takes to set up a meeting to discuss just one design, engineers can now explore designs exponentially. Generative design has catalyzed a paradigm shift in product development. This shift not only drastically decreases the time it takes to design a product. It also opens the door to design options that might never have been imagined by engineers on their own.

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Name Change for EyeC In-Line Inspection Systems: New Series Name, Same Trusted Expertise
Inspection Equipment

Name Change for EyeC In-Line Inspection Systems: New Series Name, Same Trusted Expertise

EyeC in-line inspection systems on the market since 2006 A growing portfolio calls for a name change to the in-line inspection systems Print inspection solutions for every step of the production process Hamburg, April 23, 2019. In the first quarter of 2019, EyeC decided to change the product names in the ProofRunner Product line. This change will bring greater clarity to its ever-growing...

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