Inspection Equipment

Inspection Scopes facilitate exploration and diagnosis.

Inspection Scopes facilitate exploration and diagnosis.

Allowing users to see into inaccessible places, ProVision(TM) fiber optic scopes are available in 5 cable lengths up to 96 in. Featuring ergonomically designed handle, scope's omni-directional cable will reach deep into walls, drains, vents, and engine blocks. Halogen lamp illuminates dark locations, while integrated focus ring enables smooth, continuous focusing. ProVision scopes are suited for...

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Optical System enables deep UV imaging.

Designed for 248 nm deep ultraviolet (DUV) infinity-corrected microscope objectives, NanoVue 4X 248 nm Zoom lens enables optical inspection to 0.1 micron and has zoom range of 0.75-3x. Using 100x objective corrected at 200 mm tube length, zoom range of 75-300x is possible. Field of view of 0.14-0.37 mm can be achieved when using 100x infinity-corrected DUV objective with a 2/3 in. format sensor....

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Full Wafer Parallel Tester suits IC manufacturers.

Designed to help manufacturers increase throughput, FOX-1 full wafer contact test and burn-in system can test entire wafer of devices with single touchdown or be utilized for short-duration burn-in and test. Solution combines full wafer contact, massively parallel test, and Design For Test (DFT) technologies.

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Video Surveillance Platform offers enterprise-wide view.

Providing intelligent video management across enterprise, 3VR v5.0 system management platform federates facial surveillance data to enable face watchlists, alerts, and searches across distributed systems. Included API allows for integration and search of data across 3rd party systems. Along with single-click publishing of watchlists and instant searches across distributed systems, product offers...

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X-Ray Inspection System offers automatic loading/unloading.

X-Ray Inspection System offers automatic loading/unloading.

Equipped with Automated Defect Recognition, FEINFOCUS COUGAR PRO fits seamlessly into SMT manufacturing lines and provides quantitative analysis of PCB components using modular design. GUI and CNC allow operator to configure automation process. HDX-Ray(TM) 16-bit imaging chain captures real-time digital images with film-like quality, while True X-Ray Intensity control provides immediate and...

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Wafer Inspection System handles 65 nm and 45 nm nodes.

Puma 91xx Series darkfield inspection system incorporates Streak(TM) multi-pixel sensor and line scanning technologies to achieve high-resolution darkfield imaging inspection. Suited for DRAM, SRAM, Flash, and logic devices, system utilizes Fast Adaptive Single Threshold (FAST) algorithm for reducing number of parameters needed to create and tune tool recipes. Inline Defect Organizer(TM) enables...

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DEK to Demonstrate High-Speed, 100% Post-Print Verification at ATExpo 2006

With an official introduction to the marketplace only a short time ago, DEK's HawkEye(TM) post-print verification system is fast becoming one of the industry's premiere tools for throughput enhancement and 100% line-beat rate print inspection. This latest advancement from the leader in mass imaging will be on display in booth #5400 at the upcoming ATExpo, scheduled to take place in Rosemont,...

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Surface Analyzer measures roughness and micro-waviness.

With spatial bandwidth coverage from 0.22-2,000 microns and noise floor below 0.5 angstroms, Candela Optical Surface Analyzer 6300 Series delivers metrology and inspection capabilities for data storage substrates and finished media in both radial and circumferential directions. Multi-channel optics, combined with laser stability management technology, delivers measurement capabilities for edge...

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Metris Releases the XC50-LS Cross Scanner Featuring Long Stand-Off for Ore Flexible Feature Inspection

Metris Releases the XC50-LS Cross Scanner Featuring Long Stand-Off for Ore Flexible Feature Inspection

Leuven, May 9th, 2006 - Metris launches its new XC50-LS cross scanner with long stand-off distance for CMM-based feature inspection and reverse engineering applications. The patented cross scanner technology combines three laser stripes into a single sensor, enabling efficient scanning of features such as holes and slots without having to re-orientate the sensor. With its 180 mm stand-off...

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Optical Profiler features color-coded display.

Optical Profiler features color-coded display.

Pobin Oasis (Optical Automatic Smart Inspection System) allows users to measure multiple dimensions on part instantly and simultaneously. Accurate to 0.0002 in., non-contact video profile measurement and inspection system displays measurements in drawing dimensioning format and saves them for inspection archival or built-in quality control reporting. Product gives actual measurement as well as...

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Sentry Equipment Introduces New Compact Hygienic Automatic Sampler
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Sentry Equipment Introduces New Compact Hygienic Automatic Sampler

As a leader in industrial sampling equipment at Sentry Equipment, our success is built on a history of innovation and designs that epitomize value and efficiency. The new Hygienic Automatic Sampler is another example of our dedication to developing quality engineered products. To learn how this product can streamline the sampling process for dry, free-flowing materials, see our new video.

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