Wafer Defect Inspection/Review Systems aid IC device manufacture.
Employing diverse technologies, 3900Â- and 2930 Series broadband plasma optical inspectors, Puma™ 9980 laser scanning inspector, CIRCL™5 all-surface inspection cluster, Surfscan® SP5XP unpatterned wafer inspector, and eDR7280™ e-beam review and classification tool form wafer inspection solution that enables discovery and control of yield-critical defects at all stages of IC...
Read More »
Wetting Tester simulates SMT mounting and reflow processes.
Malcom SP-2 helps test wettability of solder paste and components while simulating SMT mounting and reflow process. By simulating actual temperature that solder paste undergoes during preheat and reflow, instrument lets user identify deficiencies in flux activity or component wettability. Simulation of SMT mounting and reflow process with standard variable enables development of accurate,...
Read More »Rudolph Receives Multi-System Order for over $11 Million from a Leading OSAT for Fan-out Wafer Level Packing Inspection
Rudolph Inspection, Metrology and Analysis selected for large-scale ramp of Fan-out Wafer Level Package Production (FOWLP). Wilmington, Mass. — Rudolph Technologies, Inc. (NYSE: RTEC), a leader in the design, development, manufacture and support of defect inspection, lithography, metrology, and process control software used by semiconductor and advanced packaging device manufacturers worldwide,...
Read More »OSI Systems Receives Orders for $9 Million for Security Inspection Systems
HAWTHORNE, Calif. - OSI Systems, Inc. (NASDAQ: OSIS) today announced that its Security division, Rapiscan Systems, received two orders from an international customer totaling approximately $9 million for multiple units of Eagle® Cargo and Vehicle Inspection (CVI) systems; 600 series Baggage and Parcel Inspection (BPI) systems; Metor people screening systems; and related services and...
Read More »
Labor Crisis In Manufacturing
To learn more about collaborative technology solutions for your business and how Universal Robots can help, download this white paper now.
Read More »
ASC International to Exhibit at SMTA Upper Midwest Expo
MEDINA, MINNESOTA - June 2016 - ASC International, a leading manufacturer of 3-D solder paste inspection (SPI) and automated optical inspection (AOI) systems, today announced that it will exhibit at the SMTA Upper Midwest Expo, scheduled to take place Thursday, June 30, 2016 at the Minneapolis Marriot Southwest Hotel in Minnetonka, MN. ASC International will offer live demonstrations of its...
Read More »
ASM Alternative Energy Wafer Inspection Technology Wins Prestigious Terawatt Diamond Award
At the recent SNEC PV Power Expo, ASM Alternative Energy (ASM AE) again confirmed its technology leadership as the company took home another Terawatt Diamond Award.Â- Winning this year for its SolarWIS LITE solar inspection system, the Terawatt Diamond Award is a distinction that recognizes the top 10 highlights of the SNEC event and is selected by the show...
Read More »Gleason to Demonstrate New Solutions for Advanced Gear Production at IMTS 2016
Rochester, New York, USA Gleason will demonstrate brand new solutions in advanced gear manufacturing technology on Booth #N-7000 at IMTS 2016, covering a wide array of processes for the complete production and inspection of all types of bevel and cylindrical gears. Among the technologies to be exhibited are: Genesis® 260GX – New Threaded Wheel Grinding Powerhouse The 200/260GX machines...
Read More »FEI Launches Three New Tools for Next-Generation Semiconductor Manufacturing
New solutions are designed to address the challenges of 7nm technology node metrology and defect/failure analysis.Â- Hillsboro, Ore. - FEI (NASDAQ: FEIC) announced today the release of three new tools for process control and defect/failure analysis in advanced semiconductor manufacturing. Two of the tools are specifically targeted at the 7nm node, and all are designed to allow manufacturers...
Read More »
Nordson DAGE Will Show the New Quadra(TM) 7 X-ray Inspection System for the First Time at SEMICON West
The future ofÂ- X-ray image resolution, reliability and performance Aylesbury, Buckinghamshire, UK — Nordson DAGE, a division of Nordson Corporation (NASDAQ: NDSN), will exhibit in Booth #5844 at SEMICON West, scheduled to take place July 12-14, 2016 at the Moscone Center in San Francisco, CA. The leader in X-ray inspection for electronics, Nordson DAGE will show its 4th generation,...
Read More »
Maintaining High Quality with Surface Protection for Precision Parts
The goal at A-Laser is to offer the highest quality precision parts manufacturing and reduce complex design requirements by utilizing advanced technologies including Infrared, Ultra Violet and CO2 laser systems.Â- To ensure this high quality, A-Laser has a dedicated Quality Control team that inspects every part or project before it leaves the facility. Many of the parts then become pieces...
Read More »
Sentry Equipment Introduces New Compact Hygienic Automatic Sampler
As a leader in industrial sampling equipment at Sentry Equipment, our success is built on a history of innovation and designs that epitomize value and efficiency. The new Hygienic Automatic Sampler is another example of our dedication to developing quality engineered products. To learn how this product can streamline the sampling process for dry, free-flowing materials, see our new video.
Read More »
