Inspection Equipment

Asymtek and YESTech Enable Medical Device Manufacturers to Meet Regulatory Requirements for Traceability and Validation for Fluid Dot Dispensing

Carlsbad, CA - January 7, 2008 - Asymtek and YESTech, Nordson companies (NASDAQ:NDSN), have developed a process that helps enable medical device manufacturers to meet regulatory requirements for traceability and validation for placement and accuracy when fluid dots are dispensed. Precision, accuracy, and reliability are mandatory in the manufacture of medical devices. During the production...

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Cypak and Stora Enso to Cooperate

STOCKHOLM, Sweden, July 10 - Stora Enso has selected Cypak as their intelligent packaging technology platform provider. The platform combines RFID authentication to combat counterfeiters and enable accurate tracking of products throughout the supply chain, with an embedded computer. The technology can also store data and even record related indicators. The Cypak Close Proximity Interface enables...

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Label Inspection System uses PC-Eyebot technology.

Label Inspection System uses PC-Eyebot technology.

Capable of identifying/storing correct label parameters for each product, camera-based LabelScan(TM) helps assure all packages meet product specifications by comparing and ejecting out-of-tolerance packages automatically. System can be trained to inspect full or specific areas of labeled package by defining appropriate region of interest. It includes lighting, control enclosure, ejector timing,...

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Container Security Network by GE Security Installed at Florida's Port Everglades

Broward County, Fla (USA) GE Security has deployed it's CommerceGuard container security system at the Port Everglades Terminal, located at Florida's Port Everglades. CommerceGuard now monitors container security device (CSD)-equipped containers at Port Everglades Terminal, a privately owned terminal at Port Everglades. The system can detect and report intrusion into a container to help ensure...

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Mitsubishi Electric Co. Selects Camtek's Dragon and Pegasus AOI Systems for IC Substrate Line

MIGDAL HA'EMEK, Israel, June 13 - Camtek Ltd., announced today that Mitsubishi Electric Corporation, a leading Japanese manufacturer of electronic equipment, has purchased Camtek's Dragon FL and Pegasus 200S automated optical inspection systems for its plant in Sagamihara. This Mitsubishi Electric's plant specializes in ultra-thin, high-density substrates. The Dragon FL is used for in-process...

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Thermal Imaging System includes microscopic camera.

Equipped with 16 bit digital camera link interface and microscopic lens with 20 Â-µm spatial resolution, Micro thermal imaging system detects shorts/defects on semiconductor devices and small circuit boards. It can also measure junction temperature, identify die bonding defects, and measure packaged die thermal resistance. Thermal stage provides both heating/cooling for precise device...

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Thin Film Metrology Tool suits DRAM metrology applications.

MetaPULSE IIIa(TM) makes film thickness measurements in aluminum-based DRAM manufacturing processes using picosecond ultrasonic laser sonar (PULSE(TM)) technology, which provides on-product thickness and material characterization for opaque films over range of types, dimensions, and multilayered configurations. Suited for fab-worthy measurements in DRAM and flash memory manufacturing process...

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Multi-Surface Inspection System uses cluster architecture.

Offering full color, image-based inspection with real-time capture capability, Explorer(TM) Inspection Cluster uses adaptive wafer scheduling and offers flexible configurability. Individual systems can be configured with any combination of wafer backside and edge inspection capabilities to suit application. Designed for macro inspection, system is built on automated handling platform that...

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Akrion Will Ship 300mm Single-Wafer System for Advanced Process Development to IMEC

Akrion Will Ship 300mm Single-Wafer System for Advanced Process Development to IMEC ALLENTOWN, Pa., June 19 / - Akrion, Inc. ( Akrion ) will ship a 300mm single-wafer Velocity surface preparation system to IMEC, Europe's leading independent nanoelectronics research center facility in Leuven, Belgium. The 4-chamber Velocity(4) will be used to develop and test new back- and front-end-of-line...

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Instron's Non-Contacting Video Extensometers Granted Patents

Instron, a leading provider of testing equipment designed to evaluate mechanical properties of materials and components, announces that the innovative technologies employed in its non-contacting Advanced Video Extensometer (AVE) and Standard Video Extensometers (SVE ) have been awarded US and European patents (US 7,047,819 B2 and EP 1 424 547 B1). These devices allow highly accurate strain...

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