Microscope enables optical inspection of industrial parts.
Eclipse Ma100 Inverted Metallurgical Microscope is designed for routine observation and analysis of prepped material and metallurgical samples in various industries. Delivering clear images at every magnification, device connects to digital cameras and image analysis software for digital image processing. Microscope features CFI60 objective lens, polarizer/analyzer single-action mechanism, and...
Read More »FEI Company and Malvern Instruments Team
FEI's Quanta(TM) SEMs and Malvern's Advanced Particle Analysis Software Combine to Deliver Ground-breaking Solution for Nanoscale Applications Hillsboro, Ore./September 12, 2006 --- FEI Company (NASDAQ: FEIC) and Malvern Instruments Ltd (Malvern, UK) have entered into a joint development and marketing program for advanced nanoparticle analysis utilizing Malvern's particle image analysis software...
Read More »Leap Laser Pulse Module Installed at University of North Texas
MADISON, WI, AUGUST 31, 2006: Imago Scientific Instrument Corporation, the world leading provider of atom probe tomographic (APT) microscopes, announces the sale and installation of its Laser Pulse Module(TM) upgrade at the University of North Texas' Materials Science and Engineering Group. UNT purchased the original LEAP 3000(TM) atom probe microscope from Imago in 2005. The LEAP 3000X...
Read More »FEI Receives Titan(TM) Order from Japanese Steelmaker
Steel Researchers to Utilize World's Most Powerful Microscope for Advanced Materials Characterization and Analysis HILLSBORO, Oregon/September 4, 2006-FEI (Nasdaq: FEIC) today announced that Japan's JFE Steel Corporation has ordered a Titan(TM) 80-300 for its research center in Kawasaki. JFE Steel, a leading global supplier of steel products, is the first Japanese customer to order the Titan...
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A Guide to Robotic Cells in Automation: Electronics & Auto Parts
This white paper provides an overview into robotic cells in automation electronics and auto parts.
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Carl Zeiss Microscopy Receives Fifth Consecutive R&D 100 Award
LSM 5 DUO - the Laser Scanning Microscope Awarded the Oscar of Inventions Morris Plains/NJ/USA, Jena/Germany, 07/20/2006. With its LSM 5 DUO Laser Scanning Microscope, Carl Zeiss Microscopy is once again one of the winners of the much-coveted R&D 100 Award. This is the fifth time in a row that Carl Zeiss Microscopy has received this award, three for the LSM 5 family alone. The LSM 5 DUO system -...
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Olympus Micro-Imaging Announces Comprehensive Lines of Measuring and Inspection Imaging Systems
Orangeburg, NY MEMs, nanotechnology, device miniaturization, and advanced materials research have all contributed to the urgent, growing need for precise microscopic measurement. To meet the challenge, Olympus Micro-Imaging is announcing a series of new measurement and inspection microscopes and imaging systems featuring the broadest spectrum of illumination, from conventional white light and...
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Microscope is available with 20x objective lens.
Mantis EliteÃ-® is designed to promote user comfort with eyepieceless technology, which provides freedom of head movement and ability to wear glasses or contact lenses. Optimal color rendition and working distance are optimized for deburring and micro welding. Able to be used with optics up to 20x, product is suited for detailed inspection and can view defects as fine as hairline cracks.
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Micro-Imaging System uses laser confocal technology.
Suited for applications requiring precise measurements and observation, OLS3000 LEXT System fills gap between optical microscopes and scanning electron microscopes. It offers sub-micron imaging with 0.12 Ã-µm and 0.01 Ã-µm Z resolution and 3D measurement capability. Requiring no sample preparation or vacuum pumpdown, system provides magnification from 120-14,400x. Confocal laser DIC mode...
Read More »Imago LEAP 3000X Wins 2006 R&D 100 Award
Madison, WI - (August 6, 2006) -ImagoÃ-® Scientific Instruments Corp. announced today that its LEAP 3000X(TM) atom probe microscope is a recipient of the prestigious R&D100 award for 2006. A panel of industry experts appointed by Research and Development magazine announced the LEAPÃ-® system's award ...as one of the 100 most technologically significant products introduced into the...
Read More »FIB/SEM System offers nanoscale imaging and analysis.
Helios NanoLab(TM) DualBeam(TM) features ultra-high resolution field emission scanning electron microscope (SEM) column combined with Sidewinder(TM) focused ion beam (FIB) column and gas chemistries to provide imaging resolution and contrast in DualBeam system. Small DualBeam platform enables 3D characterization, analysis, and image reconstruction applications, nano-prototyping (fabrication and...
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Innovative Dampney Coating Systems Suit Even the Most Specialized Applications
Dampney's high performance coating systems provide protection against extreme weather, chemicals, and corrosive environments for atmospheric, immersion, and underground applications. Check out the video to learn more.
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