Microscopes

Microscope Systems suit micro-analysis applications.

LabRAM IRÂ-² and LabRAM ARAMIS IRÂ-² combined Raman and FTIR Microscope systems are available as single bench top instrument. ARAMIS IRÂ-² comes with LabSPEC 5 software which enables complete 2D chemical image derived from Raman and FTIR spectral information, and SameSPOT(TM) technology to ensure images are generated from same sample position. It has complete system automation and...

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Imaging Microscopes meet ELV regulations.

Models XGT-1700WR and XGT-5700WR Energy Dispersive X-Ray Fluorescence Spectrometers are designed for WEEE/RoHS regulations for high sensitivity measurement of 5 elements (Pb/Cd/Cr/Hg/Br) in electronic and electrical devices. They feature 3 mm X-ray beam, combined dual optical filter, large sample chamber, and 2 selectable X-ray Guide Tubes (XGT) with smallest being 0.01 mm spot size. Model...

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XRF Imaging Microscope offers 10 -µm resolution.

Featuring motorized XYZ control, XGT Series can detect and quantify concentrations in order of 50-100 ppm. SmartMap software allows full hyperspectral imaging to be configured and run. At each pixel of XRF image, full spectrum is acquired and stored, providing instant access to complete elemental information across sampling region. Modules such as auto peak labeling, spectral searching, FPM and...

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Stereo Zoom Microscopes feature ergonomic design.

E-Zoom Series Stereo Zoom Microscopes utilize sealed housing to prevent contaminants from interfering with performance. E-Zoom4 features zoom ration of 4:3:1 and magnification range of 0.7-3.0x, while E-Zoom6 has 6:3:1 ratio and 0.8-5.0x magnification. Model E-Zoom6V comes equipped with trinocular port for electronic imaging with Z/x sensor C-Mount cameras. Series offers working distances ranging...

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FEI Expands Helios Nanolab(TM) Family for Semi Market

NanoLab 400/400S to be Introduced at SEMICON Japan Giving Users a Complete Range of Advanced Solutions for Semiconductor Labs NOVEMBER 30, 2006/Hillsboro, Ore.-FEI Company (Nasdaq: FEIC) will expand its top-of-the-line Helios NanoLab(TM) family of DualBeams(TM) when it introduces the Helios NanoLab 400 and 400S systems next week at SEMICON Japan. Combining advanced focused ion beam (FIB) and...

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FEI Receives $11.5 Million Order from Technical University of Denmark

Seven Systems to Form the Core of DTU's New Center for Electron Nanoscopy and Pave the Way for Advanced Catalyst Research NOVEMBER 27, 2006/Hillsboro, Ore.-The Technical University of Denmark (DTU) has placed a $11.5 million dollar order for seven FEI microscopes that will form the core of the University's new Center for Electron Nanoscopy (CEN). The order represents the largest product sale ever...

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MTS Wins 2006 R&D Magazine 100 Award for In-Situ Nano Testing System

EDEN PRAIRIE, Minn., Nov. 21 / - MTS Systems Corporation (NASDAQ:MTSC) today announced it has received an R&D 100 Award from R&D Magazine for a new generation of Nano testing systems. The InSEM(TM) T250 nano tensile testing system enables characterization of materials and components at the micro/nano length scale within a scanning electron microscope. Researchers depend on MTS to help them...

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FIB/SEM Systems are designed for semiconductor labs.

NanoLab(TM) 400/400S feature high resolution field emission scanning electron microscope column combined with Sidewinder(TM) focused ion beam column and gas chemistries. Suited for sub-65 nm node devices, DualBeams(TM) systems offer low-kV SEM resolution to support 3D cross-sectional imaging and analysis. NanoLab 400 comes with high resolution stage/load lock, while Model 400S is equipped with...

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Confocal Microscope has controlled light exposure option.

Confocal microscope model C1 is offered with optional Controlled Light Exposure Microscopy (CLEM) control unit that uses 2 laser confocal imaging methods to minimize specimen photo bleaching and optimize laser excitation and detector sensitivity range. When CLEM unit senses lack of fluorescence return signal, it attenuates illumination, reducing unnecessary excitation of fluorophores in...

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