Microscope Systems suit micro-analysis applications.
LabRAM IRÃ-² and LabRAM ARAMIS IRÃ-² combined Raman and FTIR Microscope systems are available as single bench top instrument. ARAMIS IRÃ-² comes with LabSPEC 5 software which enables complete 2D chemical image derived from Raman and FTIR spectral information, and SameSPOT(TM) technology to ensure images are generated from same sample position. It has complete system automation and...
Read More »Imaging Microscopes meet ELV regulations.
Models XGT-1700WR and XGT-5700WR Energy Dispersive X-Ray Fluorescence Spectrometers are designed for WEEE/RoHS regulations for high sensitivity measurement of 5 elements (Pb/Cd/Cr/Hg/Br) in electronic and electrical devices. They feature 3 mm X-ray beam, combined dual optical filter, large sample chamber, and 2 selectable X-ray Guide Tubes (XGT) with smallest being 0.01 mm spot size. Model...
Read More »XRF Imaging Microscope offers 10 -µm resolution.
Featuring motorized XYZ control, XGT Series can detect and quantify concentrations in order of 50-100 ppm. SmartMap software allows full hyperspectral imaging to be configured and run. At each pixel of XRF image, full spectrum is acquired and stored, providing instant access to complete elemental information across sampling region. Modules such as auto peak labeling, spectral searching, FPM and...
Read More »Stereo Zoom Microscopes feature ergonomic design.
E-Zoom Series Stereo Zoom Microscopes utilize sealed housing to prevent contaminants from interfering with performance. E-Zoom4 features zoom ration of 4:3:1 and magnification range of 0.7-3.0x, while E-Zoom6 has 6:3:1 ratio and 0.8-5.0x magnification. Model E-Zoom6V comes equipped with trinocular port for electronic imaging with Z/x sensor C-Mount cameras. Series offers working distances ranging...
Read More »Importance of Motor & Generator Maintenance & Repair in the Mining Industry
Electric motors and generators are essential components for mining industry equipment and the Battery Electric Vehicle (BEV) market. These sectors rely upon this equipment heavily to meet high production demands in rugged environments, and so they require careful design, construction, and maintenance to provide longevity and durability. Pumps, hoists, crushers, muckers, haulers, and mills are only some examples of mining and milling equipment utilizing electric motors.
Read More »FEI Expands Helios Nanolab(TM) Family for Semi Market
NanoLab 400/400S to be Introduced at SEMICON Japan Giving Users a Complete Range of Advanced Solutions for Semiconductor Labs NOVEMBER 30, 2006/Hillsboro, Ore.-FEI Company (Nasdaq: FEIC) will expand its top-of-the-line Helios NanoLab(TM) family of DualBeams(TM) when it introduces the Helios NanoLab 400 and 400S systems next week at SEMICON Japan. Combining advanced focused ion beam (FIB) and...
Read More »FEI Receives $11.5 Million Order from Technical University of Denmark
Seven Systems to Form the Core of DTU's New Center for Electron Nanoscopy and Pave the Way for Advanced Catalyst Research NOVEMBER 27, 2006/Hillsboro, Ore.-The Technical University of Denmark (DTU) has placed a $11.5 million dollar order for seven FEI microscopes that will form the core of the University's new Center for Electron Nanoscopy (CEN). The order represents the largest product sale ever...
Read More »MTS Wins 2006 R&D Magazine 100 Award for In-Situ Nano Testing System
EDEN PRAIRIE, Minn., Nov. 21 / - MTS Systems Corporation (NASDAQ:MTSC) today announced it has received an R&D 100 Award from R&D Magazine for a new generation of Nano testing systems. The InSEM(TM) T250 nano tensile testing system enables characterization of materials and components at the micro/nano length scale within a scanning electron microscope. Researchers depend on MTS to help them...
Read More »FIB/SEM Systems are designed for semiconductor labs.
NanoLab(TM) 400/400S feature high resolution field emission scanning electron microscope column combined with Sidewinder(TM) focused ion beam column and gas chemistries. Suited for sub-65 nm node devices, DualBeams(TM) systems offer low-kV SEM resolution to support 3D cross-sectional imaging and analysis. NanoLab 400 comes with high resolution stage/load lock, while Model 400S is equipped with...
Read More »Confocal Microscope has controlled light exposure option.
Confocal microscope model C1 is offered with optional Controlled Light Exposure Microscopy (CLEM) control unit that uses 2 laser confocal imaging methods to minimize specimen photo bleaching and optimize laser excitation and detector sensitivity range. When CLEM unit senses lack of fluorescence return signal, it attenuates illumination, reducing unnecessary excitation of fluorophores in...
Read More »Microscope is designed for neuroscience/electrophysiology.
Able to support multiple manipulator experiments, FN1 Multipatch upright focusing nosepiece microscope utilizes One Lens Solution CFI75 16X water dipping objective, which offers 2.0 mm field of view, 0.80 numerical aperture, 3.0 mm working distance, and 45Ã-
Read More »Ensure Your Medical Device Meets Regulatory Standards with Triad's Custom Magnetics
Triad Magnetics' custom components for medical devices are designed and manufactured with the strictest regulatory standards in mind. Our capabilities include rapid design, prototyping, and testing of inductors, transformers, and power supplies for medical equipment. Check out our video to learn more.
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