Microscopes

Microscopes

Diamond Light Source Purchases Multiple Electron Microscopes from FEI

The U.K.’s national synchrotron now has a complete cryo-EM workflow for integrative structural biology to explore essential biological questions at the atomic and molecular scale. Hillsboro, Ore. and Oxfordshire, U.K. –Â- FEI (NASDAQ: FEIC) today announced its largest order for Life Sciences - Diamond Light Source, one of the most advanced synchrotron light sources in the world, has...

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Microscopes

Zeiss Launches Promotion on the ELYRA P.1 3D Superresolution Microscope

Thornwood, N.Y. — Carl Zeiss Microscopy, LLC announces the launch of a special promotion on the ZEISS ELYRA P.1, the ultimate in three-dimensional, superresolution light microscopy. Using PALM or dSTORM techniques, the ELYRA P.1 can localize fluorescently-labeled structures in three dimensions yielding achievable resolutions down to 20 nm laterally and 50 nm axially. Detection with an effective...

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Miscellaneous Software

FEI and University of Manchester Announce Collaboration Agreement for Metals Research

The new Metals Lab involves a multiscale, three-dimensional correlative imaging workflow to better understand and develop metallic alloys for the automotive, aerospace, nuclear, and oil & gas industries. Hillsboro, Ore., U.S. and Manchester, U.K.Â- – FEI (NASDAQ: FEIC) and The University of Manchester announce their collaboration on the Metals Lab at The University of Manchester's Electron...

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Microscopes

Automated Digital Microscope suits QA/QC applications.

Incorporating optical engine with zoom, overview camera, and coaxial illumination, Smartzoom 5Â- uses macro recording mode to optimize workflow for repeat sample analyses in step-by-step manner. QA/QC GUI combines with gesture control to support seamless macro-to-detail workflow. System's guided workflow, in combination with calibrated components, supports user-independent...

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3D Surface Measuring Systems use white light/confocal microscopy.
Measuring Equipment

3D Surface Measuring Systems use white light/confocal microscopy.

MarSurf® WM 100, whichÂ- uses white light interferometer, and MarSurf CWM 100, which includes white light and confocal microscopy, are intended for measuring optical, technical, and reflecting surfaces and provide 3D topographical analysis. Both systems provide non-contact measurement of surface structures with sub-nanometer resolution. While confocal microscopy better...

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Microscopes

Axio Scan.Z1 Digital Slide Scanner Acheives Optimal Image Quality

Flexible automated image capture in bright-field and fluorescence The Axio Scan.Z1, an automated microscope from Carl Zeiss Microscopy, allows researchers to digitalize fixed tissue sections and cytologic specimens in bright-field and fluorescence. Supporting scientists with recurring tasks in the capture of large sample contingents, for example tissue analysis in Alzheimer's and cancer research,...

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Microscopes

Atomic Force Microscope offers ILM and STM capabilities.

Equipped with 90 Â-µm AFM closed-loop scanner, Agilent 7500 achieves low-noise performance, enabling atomic-resolution imaging. Design includes built-in environmental chamber with 6 inlet/outlet ports as well as precision temperature and humidity sensors. Inverted Light Microscope system supports MAC Mode for gentle imaging of fluids, while Scanning Tunneling Microscope system provides...

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Carl Zeiss Microscopy to Support BBC Cloud Lab Scientists
Microscopes

Carl Zeiss Microscopy to Support BBC Cloud Lab Scientists

Bugs, bats, and air cultures to be examined as blimp travels across the USA Thornwood, N.Y.Â- – The world's largest airship, the Skyship 600, made its way through the clouds on a month long journey across the United States. A team of British scientists made the air trek in a blimp as part of a BBC expedition team to study the clouds and life activity in the air. Microscopes from Carl Zeiss...

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Sample Holder for In Situ TEM can heat samples to over 1000°C.
Material Conditioners

Sample Holder for In Situ TEM can heat samples to over 1000°C.

Suited for scientists studying structure-function relationship of materials, NanoEx™-i/v sample holder can be integrated with FEI transmission electron microscopes (TEMs) to observe effects of heating and electrical bias on nanostructured materials during in situ experiments. Holder is optimized to acceptÂ- various sample geometries, from nanoparticles to thin FIB-prepared lamellae, and...

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Microscope Components

AFM Accessory enables scanning electrochemical microscopy.

AFM-enabled Scanning Electrochemical Microscopy (SECM) mode, using Agilent atomic force microscope,Â- lets scientists perform scanning electrochemical microscopy with nanoscale resolution on conductive and insulating samples. Enabling immediate data collection, EC SmartCart cartridge combines nanoelectrode with pre-mounted AFM tip. Features include bi-functional...

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