Microscopes

Olympus to Exhibit at International Conference on Metrology

Olympus to Exhibit at International Conference on Metrology

Advancing optical metrology Hamburg - Olympus has today announced that it will be exhibiting at the 13th International Conference on Metrology and Properties of Engineering Surfaces. Hosted by the National Physics Laboratory (NPL), the conference will take place from 12 - 15 April 2011 at the Twickenham Stadium in London. Olympus will be promoting its expertise within the field of metrology,...

Read More »
Cell Receptor Recycling Mechanism Discovery Opens up New Class of Therapeutic Targets

Cell Receptor Recycling Mechanism Discovery Opens up New Class of Therapeutic Targets

International research team rely on Andor Revolution XD Confocal Microscope for ground-breaking live cell studies Belfast, UK: Prof. Manojkumar Puthenveedu of Carnegie Mellon University studies the mechanisms by which membrane trafficking controls and co-ordinates the complex signalling pathways in the brain. Despite the fact that almost all diseases can be traced to a defect in how cells respond...

Read More »

Stereoscopic Microscope targets biomedical applications.

Featuring airtight, anti-mold, and anti-electrostatic design, Model SMZ-745 prevents samples from being damaged by ESD, dust, and water. Unit is optimized with Greenough optical system, allowing it to reach zoom ratio up to 7.5:1. Magnification range is 3.35-330x when combined with auxiliary objective lens and eyepiece. Equipped with trinocular optical head, waterproof microscope features working...

Read More »

Camtek Selected as Advanced TEM Sample Preparation Solution Provider

Camtek's Xact System Selected by a Leading Semiconductor Manufacturer for Advanced Transmission Electron Microscope Analysis Applications MIGDAL HAEMEK, Israel, March 14, 2011 -- Camtek Ltd. (NASDAQ and TASE: CAMT) ( Camtek or the Company ), announced today that a leading Asian Semiconductor Manufacturer has selected the Xact, Camtek's Advanced TEM (Transmission Electron Microscope) sample...

Read More »
Carl Zeiss to Exhibit High Performance Optical and Electron Microscopy Solutions at Pittcon 2011

Carl Zeiss to Exhibit High Performance Optical and Electron Microscopy Solutions at Pittcon 2011

Carl Zeiss, a leading provider of microscopy solutions, announces that it will be exhibiting a range of high performance optical and electron microscopy products at the Pittcon Conference and Expo 2011, Booths 1353 and 1453, March 13-18, 2011 at the Georgia World Congress Center, in Atlanta, Georgia. The company will be showcasing its Shuttle & Find interface for correlative light and electron...

Read More »
Motorized Microscope features modular, customizable design.

Motorized Microscope features modular, customizable design.

Adjusting to experimental requirements, Model BX63 can be controlled via programmable touch screen, detachable remote, or cellSens software. Focusing mechanism is driven by changes in height of nosepiece, allowing stage to be fixed into position. Stage is also motorized, facilitating precise X,Y movements using ultrasonic Piezo technology. With cellSens Dimension software, users can perform...

Read More »
Stereo Microscope offers 2 software options for 2D measurement.

Stereo Microscope offers 2 software options for 2D measurement.

Equipped with sealed USB 2.0 digital camera for simultaneous optical and digital viewing, Mantis Elite-Cam uses ViFox and ViAxos software to store images as JPG, BMP, or PNG. ViFox offers image capture, file sharing, and onscreen measurement, as well as ability to set key parameters while viewing live image. ViAxos, providing advanced 2D measurement options such as feature-to-feature measurement,...

Read More »
Materials Characterization System offers 3D imaging, milling.

Materials Characterization System offers 3D imaging, milling.

Helios NanoLab(TM) x50 DualBeam(TM) Series includes Helios 650, for academic and industrial research centers, and Helios 450(S) series for advanced semiconductor labs. Devices integrate high-resolution scanning electron microscope and focused ion beam (FIB) that optimizes imaging/milling and speeds material removal on large structures. High-quality 3D data helps understand material...

Read More »
Cut and Bevel Pipe up to 63" Diameter with a Single Lightweight, Portable Machine
Sponsored

Cut and Bevel Pipe up to 63" Diameter with a Single Lightweight, Portable Machine

CS Unitec is a leader in power tools designed for industrial applications, with products that set the standard for robust performance and industry-leading reliability. Adding to our long list of innovation is a new line of pipe cutting machines. For cutting and beveling pipe up to 2" in thickness and diameters from 12" to 63", no other cutting system comes close. See our video to learn more.

Read More »

All Topics