Microscopes

Digital 2D Microscope operates without PC.
Measuring Equipment

Digital 2D Microscope operates without PC.

Delivering video-image quality at 60 fps, Omni HD 2D Digital Microscope and Measurement System can remain in calibration over entire zoom range, making it suitable for quality control, testing, rework, assembly, and inspection tasks. Custom-designed mouse or GUI provides intuitive operation of entire system. To ensure sharp, high-contrast imaging, separate camera control station allows manual...

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ZEISS Highlights Latest Microscopy Innovations and Advancements at International Manufacturing Technology Show
Miscellaneous Analyzers

ZEISS Highlights Latest Microscopy Innovations and Advancements at International Manufacturing Technology Show

Visit Booth # E-5502 for demonstrations of the newest microscope instruments for manufacturing applications ZEISS announces they will be showcasing the latest microscopy innovations and advancements at the International Manufacturing Technology Show (IMTS), September 12-17, 2016, at McCormick Place, in Chicago, IL. ZEISS experts will be on hand at Booth # E-5502 to highlight and demonstrate ZEISS...

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Ergonomic 120 kV S/TEM targets life and materials sciences.
Microscopes

Ergonomic 120 kV S/TEM targets life and materials sciences.

Offering users access to scientific results regardless of experience, Talos™ L120C transmission/scanning transmission electron microscope (S/TEM) provides Hi-Res, 3D imaging and analysis capabilities. Automation and directed workflows foster facilitated adoption path and accelerate results without compromising performance. Along with ultra-stable optics, this 120 kV LaB6 S/TEM features MAPS™...

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Microscopes

FEI and Cornell University Collaborate to Commercialize New EMPAD Detector

Speed, sensitivity and dynamic range will enable multichannel atomic-scale imaging and analysis of material properties such as electric and magnetic fields Hillsboro, Ore. and Ithaca, NY — FEI (NASDAQ: FEIC) and Cornell University have entered an agreement to commercialize a new high dynamic range detector for FEI’s electron microscopes. It promises to enable new kinds of multichannel imaging...

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Automated S/TEM delivers high-performance imaging, analysis.
Microscopes

Automated S/TEM delivers high-performance imaging, analysis.

Themis™ Z scanning/transmission electron microscope (S/TEM) offers system stability and automated tuning routines that promote reproducible image resolution at high and low beam energies in both STEM and TEM modes. Energy dispersive x-ray systems let users configure system based on primary characterization needs, and iDPC detector, by using up to 90% of transmitted electrons, offers high...

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Microscopy Systems support materials science applications.

Microscopy Systems support materials science applications.

Featuring advanced scanning electron microscope and focused ion beam technology, Helios™ G4 DualBeam Series offers automated sample preparation for transmission electron microscopy and 3D sample characterization. Phoenix FIB column offers low-voltage performance for ultra-low sample damage, while Elstar electron column with UC+ technology offers 4x more monochromated current than previous...

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Semiconductor Processing Equipment

FEI Launches Three New Tools for Next-Generation Semiconductor Manufacturing

New solutions are designed to address the challenges of 7nm technology node metrology and defect/failure analysis.Â-  Hillsboro, Ore. - FEI (NASDAQ: FEIC) announced today the release of three new tools for process control and defect/failure analysis in advanced semiconductor manufacturing. Two of the tools are specifically targeted at the 7nm node, and all are designed to allow manufacturers...

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Miscellaneous Software

FIB/SEM Systems utilize 3D reconstruction software.

Designed to work with all DualBeam focused ion beam/scanning electron microscope platforms, Auto Slice & View v4.0 software enables 3D structure and composition of samples at nanometer scale. Imaging can be combined with analytical capabilities, such as energy dispersive x-ray spectrometry and electron backscatter diffraction, to ensure that no information is lost in sectioning of sample....

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Scanning Electron Microscope supports diverse applications.
Microscopes

Scanning Electron Microscope supports diverse applications.

With compound final lens, Apreo™Ã‚- offers resolution down to 1.0 nm at 1 kV, without need for beam deceleration, for optimal performance on sample even if it is tilted or topographic. Backscatter detection is offered at lowest beam currents, at any tilt angle, on sensitive samples, and at TV-rate imaging to maximize materials contrast, and detector segments can be individually...

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Delivery Equipment That Really Delivers
Sponsored

Delivery Equipment That Really Delivers

Are you in need of safer, more efficient transportation equipment? Do you feel like your delivery equipment could really use an upgrade? Check out this video, and learn about Halo Ramp Company's patented safety platforms, and how they help you bypass your trickiest delivery challenges.

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COVID-19 Response Suppliers COVID-19 Response:
Can Your Company Help Provide Critical Supplies?

We are using the power of our platform to aid in the mass shortage of critical supplies. If your company can help provide supplies, capabilities, or materials for products such as N-95 Masks and Tyvek SuitsPlease let us know.

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