Microscopes

Edge Heating System optimizes TEM performance.
Microscope Components

Edge Heating System optimizes TEM performance.

Combining Aduro semiconductor-based thermal sample supports with redesigned TEM holder, Aduro with Edge technology optimizes thermal accuracy and uniformity for in situ heating experiments while minimizing thermal drift. Edge technology maximizes performance of Transmission Electron Microscope by allowing scientists to visualize materials at nano and atomic scale while at accurate and uniform...

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Polarization Microscope aids crystalline structure investigation.
Microscopes

Polarization Microscope aids crystalline structure investigation.

Fully coded and semi-automated, Leica DM4 P is used to investigate crystalline structures. Ability to be configured with either transmitted light axis or incident light axis as well as with both transmitted and incident light axis accommodates all polarization tasks. Along with LED illumination, features include strain-free optics and objectives as well as automatic store and recall functions....

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Microscope System utilizes angle measuring eyepiece.
Measuring Equipment

Microscope System utilizes angle measuring eyepiece.

Available for modular tool microscope system, AME-5M Goniometer Eyepiece measures over 360° to accuracy of 5' (minutes) by use of rotary Vernier and crosshair eyepiece. Unit features white scale on black background and can be enlarged by 10X magnifier. Modular design enables user to attain magnifications from 3X–800X using choice of 3 microscope body styles, 3 rack-and-pinion mounting...

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Upright Microscopes are used for materials science and analysis.
Microscopes

Upright Microscopes are used for materials science and analysis.

Respectively designed for manual and automated operation, Leica DM4 M and DM6 M can be used for imaging, measurement, and analysis of similar features across many samples and materials. Modules of Leica Application Suite benefit such applications as steel inclusion rating, particle analysis, and phase/grain analysis. Along with pushbutton-actuated Illumination and Contrast Manager, features...

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Microscopes

Atomic Force Microscope delivers ultrafast scanning rates.

With integrated imaging and analysis software, FPGA-based digital controller, and mechanical design, 9500 provides scan rates up to 2 sec/frame (256x256 pixels). More than 6 AFM imaging modes are supported by standard nose cone, which can be interchanged with specialized nose cones as needed, and system offers 90 Â-µm closed-loop AFM scanner with atomic resolution, environmental control, and...

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ZEISS and University of California Berkeley Launch Public-Private Partnership to Support Brain Microscopy Innovation Center
Microscopes

ZEISS and University of California Berkeley Launch Public-Private Partnership to Support Brain Microscopy Innovation Center

Microscopy tools optimized for use with emerging neurotechnologies provided for researchers Jena/Germany, Berkeley/USA –Â- ZEISS announces that it is participating in a new public-private partnership with UC Berkeley as part of the Brain Microscopy Innovation Center (BrainMIC), a component of the Berkeley BRAIN Initiative. The Brain Research through Advancing Innovative Neurotechnologies...

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ZEISS Highlights Scanning Electron Microscopes at EIPBN 2015
Microscopes

ZEISS Highlights Scanning Electron Microscopes at EIPBN 2015

Visit Booth 113 to learn about ZEISS GeminiSEM and ZEISS MultiSEM 505 technology ZEISS announces they will be highlighting a range of scanning electron microscope (SEM) technology at EIPBN, the 59th International Conference on Electron, Ion, and Photon Beam Technology and Nanofabrication, May 26-29, 2015, at the Manchester Grand Hyatt in San Diego, CA, Booth # 113. Stop by and learn more about...

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High-Magnification Microscopes serve industrial QC applications.
Microscopes

High-Magnification Microscopes serve industrial QC applications.

Equipped with Vernier micrometer heads, TM-8 and TM-10 feature magnifications of 50X, 100X, and 200X withÂ- 10X eyepiece as well as 5X, 10X, and 20X objective lenses that have revolving nosepiece and positive stop. Separate 20X eyepiece is available to double magnifications (up to 400X) and lengthen working distances, while optional objectives from 1X–4X and...

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Scienscope Will Discuss Its X-ray and Microscope Capabilities at MD&M East
Microscopes

Scienscope Will Discuss Its X-ray and Microscope Capabilities at MD&M East

Chino, CAÂ- – Scienscope International, a complete inspection solutions provider, will exhibit in Booth #2421 at MDM East, scheduled to take place June 9-11, 2015 at the Jacob K. Javits Convention Center in New York, NY. Company representatives will discuss Scienscope’s line of state-of-the-art X-ray inspection systems and microscopes. Scienscope’s X-ray inspection systems division...

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Mahr Federal to Feature MarVision MM 320 Video Measuring Microscope with Image Processing at MD&M EAST 2015
Bore Gages

Mahr Federal to Feature MarVision MM 320 Video Measuring Microscope with Image Processing at MD&M EAST 2015

PROVIDENCE, RI — Mahr Federal will feature the MarVision MM 320, a new video measuring microscope with image processing capability, the flagship product for a new line of Mahr optical measuring instruments, at MDM EAST, June 9-11, 2015, Jacob K. Javits Convention Center, New York, NY, Booth #2315. Designed for the measurement and/or dimensioning of geometric elements, the MarVision MM 320...

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