Microscopes

Hyphenated Systems and Stanford Microfluidics Laboratory Announce Joint Development Project

Hyphenated Systems' 3Dmap to Provide Sub-Surface 3D Structure Characterization and Flow Analysis of Advanced Microfluidic Devices Burlingame, CA, August 14, 2006-Hyphenated Systems, a world-wide provider of hybrid microscopy solutions for three-dimensional (3D) imaging and metrology in micro- and nanotechnology, announced today a joint development project (JDP) with the Stanford Microfluidics...

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Carl Zeiss Microscopy Receives Fifth Consecutive R&D 100 Award

Carl Zeiss Microscopy Receives Fifth Consecutive R&D 100 Award

Morris Plains/NJ/USA, Jena/Germany, 07/20/2006. With its LSM 5 DUO Laser Scanning Microscope, Carl Zeiss Microscopy is once again one of the winners of the much-coveted R&D 100 Award. This is the fifth time in a row that Carl Zeiss Microscopy has received this award, three for the LSM 5 family alone. The LSM 5 DUO system - a new combination of the LSM 510 META and LSM 5 LIVE confocal laser...

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Atomic Force Microscope uses nanoindenter module.

Atomic Force Microscope uses nanoindenter module.

Available in Standard and Low Force models, NanoIndenter fits on MFP-3D AFM System head for viewing of sample, and drives nanoindenting tip perpendicular to sample. Tip displacement and force are measured with microscope's optical detector and NPS(TM) Nanopositioning sensors, allowing repeatable imaging, quantitative feature measurement, accurate imaging offsets, quantitative force curves, and...

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FEI's Titan(TM) S/Tem Achieves Low KV Milestone

1.4 Angstrom Resolution Marks Important Breakthrough for Atomic-Scale Imaging of Light Element Nanomaterials HILLSBORO, Ore, July 31, 2006 --- FEI Company (Nasdaq: FEIC) today announced that scientists at its NanoPort(TM) in Europe have broken another image resolution barrier with the world's most advanced commercially-available microscope, the Titan(TM) 80-300 corrected S/TEM. For the first time...

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McMaster University Orders Two FEI Titan(TM) S/TEMs

Systems Will Serve Canada's National Facility for Ultrahigh-Resolution Electron Microscopy HILLSBORO, Ore. /April 19, 2006--FEI Company (Nasdaq: FEIC) today announced that McMaster University, based in Ontario, Canada, has ordered two FEI Titan(TM) S/TEM systems-the world's first commercial systems capable of delivering sub-Ã…ngstrom resolution-and a multi-year service contract to support...

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Video Inspection Microscope features ESD-protected design.

Set up with look-down macro zoom lens or look-under side viewing BGA lens, Optilia Flexia BGA/SMT Video Inspection Microscope provides inspection of solder joints on PCB components, solder/flux mixtures, bare circuit cards/pads, cables/connectors, wire bonds, and stencils. It can be connected to hand held monitor, PC, or laptop via high-speed USB 2.0 frame grabber. System is optimized for...

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FEI's Automated 3D Crystallography Featured at PITTCON

FEI's EBS3 fully-automated electron backscattered diffraction solution delivers rapid serial sectioning and 3D crystal orientation reconstructions of materials HILLSBORO, Ore. /March 13, 2006--FEI Company (Nasdaq: FEIC) will feature its EBS3 DualBeam(TM) solution for rapid serial sectioning and 3D crystallographic reconstructions of materials at this week's Pittcon conference in Orlando. The...

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Nikon Eliminates Focus Drift in Live Cell Microscopy with the New TE2000-PFS

A Powerful New Microscope Debuts With Real-Time Focus Correction MELVILLE, N.Y., Nov. 8 / -- Nikon Instruments, Inc., (www.nikonusa.com) a world leader in the development of advanced optical technology, today introduced a new solution designed to eliminate focus drift in live cell time lapse observation. The Nikon TE2000 Perfect Focus Inverted Research Microscope (PFS) delivers automatic focus...

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Nikon Delivers True Spectral Imaging with Digital Eclipse C1si

Opening a New World of Spectral Imaging for Cell Biologists MELVILLE, N.Y., Nov. 9 -- Nikon Instruments (www.nikonusa.com) today announced software and applications enhancements for Nikon's new spectral imaging technology combining the strength of conventional imaging with that of spectroscopy to accomplish tasks that separately each can not perform. The new DIGITAL ECLIPSE C1si, a confocal laser...

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Nikon Introduces COOLSCOPE LOW-MAG Low Magnification for a Wider Field of View

A multi-application networked digital microscope for teaching, consultation & collaboration MELVILLE, N.Y., Nov. 10 -- Nikon Instruments, Inc., (http://www.nikonusa.com/) a world leader in the development of advanced optical technology, introduced COOLSCOPE LOW-MAG today, a new COOLSCOPE digital microscope featuring low magnification for a wide field of view. The COOLSCOPE LOW-MAG continues to...

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Vector® Sports Training Ball Offers Visible Point of Contact
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