Microscopes

Scanning Electron Microscope supports diverse applications.

Scanning Electron Microscope supports diverse applications.

With compound final lens, Apreo™Ã‚- offers resolution down to 1.0 nm at 1 kV, without need for beam deceleration, for optimal performance on sampleÂ- even if it is tilted or topographic. Backscatter detection is offered at lowest beam currents, at any tilt angle, on sensitive samples, and at TV-rate imaging to maximize materials contrast, and detector segments can be individually...

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Mahr Federal to Feature MarVision MM 320 and MarVision QM 300 Video Measuring Microscopes with Image Processing at MD&M EAST 2016

Mahr Federal to Feature MarVision MM 320 and MarVision QM 300 Video Measuring Microscopes with Image Processing at MD&M EAST 2016

Also on display will be the MarShaft™ SCOPE 250 plus flexible optical system for shop floor measurement PROVIDENCE, RI – Mahr Federal will feature the MarVision MM 320 and the MarVision QM 300 video measuring microscopes with image processing capability at MDM EAST, June 14-16, 2016, Jacob K. Javits Convention Center, New York, NY, Booth #2121. Designed for the measurement and/or dimensioning...

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FEI and CEOS Deliver First Sub-Angstrom, Low-Voltage Electron (SALVE) Microscope to the University of Ulm

FEI and CEOS Deliver First Sub-Angstrom, Low-Voltage Electron (SALVE) Microscope to the University of Ulm

Developed in the frame of University Ulm's SALVE project, the microscope provides high-contrast, atomic-scale imaging of radiation-sensitive samples, such as graphene and organic materials. Hillsboro, Ore. and Heidelberg, Germany — FEI (NASDAQ: FEIC) and CEOS announced today that they have delivered the first sub-Ã…ngstrom, low-voltage electron (SALVE) microscope to the University of...

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FEI and Oregon Health and Science University Install a Complete Correlative Microscopy Workflow in Newly Built Collaborative Science Facility

Installation is part of an expansion of the OHSU/FEI Living Lab for Cell Biology collaboration; a complete correlative microscopy solution will enable new approaches for cancer and related disease research Portland, Ore. –Â- FEI (NASDAQ: FEIC) and Oregon Health and Science University (OHSU) today announced an expansion of their Living Lab for Cell Biology agreement that includes the...

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Agilent Technologies Installs Atomic Force Microscope with Scanning Microwave Microscopy Capabilities at Cambridge Graphene Centre

SANTA CLARA, Calif.Â- — Agilent Technologies Inc. (NYSE: A) today announced the recent installation of an Agilent 5600LS atomic force microscope at the Cambridge Graphene Centre (CGC) in the United Kingdom. The CGC, one of the key consortium partners in the ambitious Future and Emerging Technologies (FET) Graphene Flagship project, is directed by Andrea Ferrari, professor of nanotechnology...

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Atomic Force Microscopes sense both resistance and capacitance.

Atomic Force Microscopes sense both resistance and capacitance.

Based on shielded AFM probes and electronics from PrimeNano, Inc., sMIM Scanning Microwave Impedance Microscopy is integrated exclusively with MFP-3D™ and Cypher™ AFMs.Â- Technique enables nanoscale mapping of permittivity and conductivity on linear and non-linear materials, including conductors, semiconductors, and insulators. sMIM is applicable to broad range of samples, including...

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The new MGB with EtherNet/IP is a leap forward in access door safety. Designed for easy installation, flawless performance, and long service life, it is engineered with robust features and cutting-edge technology that places it firmly at the leading edge of the door safety device industry. To learn all about the benefits of the Euchner MGB, see our video.

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