Metrology Equipment

KLA-Tencor Announces Two Additions to Litho/Etch Process Control Portfolio

New metrology and inspection tools facilitate advanced patterning techniques for manufacturing sub-20nm memory and microprocessor chips MILPITAS, Calif.- At the SPIE Advanced Lithography conference, KLA-Tencor Corporation (NASDAQ: KLAC) announced its SpectraShape™ 9000 optical critical dimension (CD) metrology system and BDR300™ backside defect inspection and review module. The SpectraShape...

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MicroSense, LLC Ships Next Generation VSM Magnetic Metrology Systems

MicroSense, LLC Ships Next Generation VSM Magnetic Metrology Systems

LOWELL, Mass. - MicroSense, LLC, a worldwide leader in high sensitivity vibrating sample magnetometers (VSMs), magnetic metrology systems, high resolution capacitive sensors, and wafer metrology systems, today announced that it has booked and shipped multiple customer orders for its next generation EZ series VSM magnetic metrology systems from global customers. These VSM metrology systems are...

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G-S PLASTIC OPTICS Expands Metrology Capabilities with Bruker® Interferometric Optical Microscope

G-S PLASTIC OPTICS Expands Metrology Capabilities with Bruker® Interferometric Optical Microscope

Rochester, NY - G-S PLASTIC OPTICS, a business unit of the Germanow-Simon Companies, is pleased to announce its acquisition of a Bruker® ContourGT®-K1 3D Interferometric Optical Microscope. This unique metrology system is optimized for characterizing the micro-structure of molded plastic optical elements, and the single point diamond-turned mold inserts that determine the surface structure of...

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Automation Metrology Platform addressses 450 mm requirements.

Customizable to allow for integration of specific wafer staging, metrology modules, optics, wafer alignment mechanisms, and other components, Atlas provides OEMs with- 450 mm metrology automation- solution that also handles 300 mm metrology requirements. Industry standard 300/450 mm capable EFEM is used to align and transfer wafers from loadports to inspection station, while airflow and...

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Bruker Wins Over $7 Million in SP9900+ 3D Optical Microscope Orders

Bruker Wins Over $7 Million in SP9900+ 3D Optical Microscope Orders

Instrument Breaks the Throughput Barrier for HDI Substrate Metrology TUCSON, AZ - Bruker announced today that it has already received more than $7 million in orders for its new Bruker SP9900+ high-throughput high density interconnect (HDI) substrate metrology system, and has begun shipping the product in volume. The SP9900+ Large Format 3D Optical Microscope is specially designed for the...

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Wafer Inspection Tool targets LED and adjacent markets.

Designed for defect inspection and 2D metrology for LED applications, ICOS WI-2280 supports MEMS and semiconductor wafers spanning 2–8 in. in size. System features rule-based binning defect classification and recipe qualification engine, enabling manufacturers to optimize process control and process tool monitoring strategies. To accommodate multiple media with minimal changeover time, ICOS...

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OGP Provides 5000th SmartScope Flash to the International Industrial Marketplace

OGP Provides 5000th SmartScope Flash to the International Industrial Marketplace

Optical Gaging Products (OGP®), a division of Quality Vision International Inc. (QVI®), marked a proud milestone this week with delivery of the 5,000th SmartScope® Flash(TM) multisensor measuring system. SmartScope Flash systems are the global leaders in high performance dimensional measurement for a wide range of components used in industries ranging from consumer products to aerospace...

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Nova Receives Multiple Orders for Its V2600 through Silicon Via Metrology System

REHOVOT, Israel - Nova Measuring Instruments Ltd. (NASDAQ: NVMI), a leading provider of optical metrology solutions to the semiconductor process control market, reported today that two major customers ordered its recently launched TSV (Through-Silicon Via) metrology system, the Nova V2600(TM). These orders follow a thorough technical evaluation process by customer experts selecting the Nova V2600...

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Automated Measuring System features 80 in. capacity.

Automated Measuring System features 80 in. capacity.

Featuring laser interferometer, air bearings, and bi-directional probes, Labmaster Long Length Universal Model 1000A offers direct reading range of 40 in. Probe movement and table movements such as swivel, centering, tilt, and elevation adjustments are controlled with press of button or click of mouse. Automated positioning, alignment, and measurement practically eliminate operator influence and...

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Rudolph's MetaPULSE System Selected for Advanced Packaging R&D

Dynamic growth in advanced packaging arena drives need for critical process characterization technologies Flanders, New Jersey - Rudolph Technologies, Inc. (NASDAQ: RTEC), a leading provider of inspection, metrology and process control software for semiconductor manufacturing, announced today that a premier global industry research center in Asia has purchased Rudolph's MetaPULSE® G Metrology...

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Dies & Stamping Services with Over 25 Years of Experience
Sponsored

Dies & Stamping Services with Over 25 Years of Experience

PDS is an established leader in progressive die stamping, with a reputation for providing precision and value that dates back more than half a century. Through extensive capabilities and a staff of seasoned professionals, we set the standard for quality, delivering flexible services that can meet the needs of the most challenging requirements. See our video to learn more.

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