New Metrology Equipment Products

Bede X-ray Metrology and IMEC Collaboration on Process Control of New Materials Used at 45nm Nodes and Below

DURHAM, UK - Bede X-ray Metrology, a leading global provider of X-ray metrology systems to the semiconductor industry, is pleased to announce that it has entered into a collaboration with IMEC, Belgium, a world-leading research centre in nanoelectronics and nanotechnology, to investigate the use of X-ray metrology in the process control of new semiconductor materials used at the 45 nm technology...

Optical Measuring System operates without part contact.

Operating in lab and on shop floor, Helio-Scope universal optical measuring system can measure parts up to 29.5 in. long and 4.7 in. in dia, and up to 66 lb. Telecentric precision optical system with CCD camera can resolve lengths up to 0.0001 mm and angles up to 0.0001Ã-

Measuring System utilizes video imaging technology.

SmartScope ZIP 250 benchtop video system automatically measures manufactured parts without contact. Featuring auto-calibrating AccuCentricÃ-® 7:1 zoom lens, digital camera, and all-LED illumination, system offers 250 x 150 x 200 mm XYZ measurement volume, with 300 mm optional for X axis. Heavy-duty cast base with Y-axis center drive assures metrological stability. Optional DRS or TTL laser...

Metrology System speeds electronic assembly.

Equipped with digital megapixel cameras, 450 x 450 mm stage, and CAD-driven Elements software, non-contact Benchmark 450 provides electronic assembly process verification. BLAZE(TM) continuous image capture feature captures multiple images as part continually moves beneath system optics. Using library of pre-configured component routines to automatically create measurement programs from CAD...

A Complete Guide to Fabricating Custom Components

This white paper provides an in-depth guide to fabricating custom components.

Optical Measurement System uses image analysis algorithms.

Based on sound metrology principles, Innova provides point-to-point and field-of-view non-contact measurements of semiconductor, optoelectronic, and MEMS devices. It delivers FOV measurement down to 0.5 Ã-µm with measurement accuracy of 0.010 Ã-µm. Providing 200 x 200 mm XY stage travel, system has granite structural components and vibration isolation support stand for stability....

Metrology System measures ultra thin films.

Combining PULSE Technology(TM) with MMXRF technology on single platform, Synergy MPX(TM) System measures ultra thin opaque films, such as ALD layers. PULSE Technology consists of picosecond ultrasonic laser sonar technique that provides non-contact, non-destructive opaque film measurements from 40 angstroms to 6 Ã-µm. Monochromatic source eliminates virtually all background radiation, while...

Metrology System measures difficult-to-image features.

Multisensor SmartScopeÃ-® Flash(TM) 200 benchtop dimensional measurement system integrates through-the-lens laser for non-contact surface contouring. Touch probe, laser, and/or micro-probes are available for complete part characterization. It features 200 x 200 x 150 mm XYZ measurement volume and measures parts of different material, malleability, opacity, and color. Motorized 12x...

Automated Optical 3D Profiler features 10 pm resolution.

As 3D surface-texture, step-height, and micro-dimensional measurement system, Talysurf CCI 6000 combines microscope-quality surface imaging with surface profiler measuring capability. It performs non-contact 3D measurement of components with all types of surfaces and materials up to 300 mmÃ-² in size. Measurement interferometer uses correlation algorithm to find coherence peak and phase...

CD Metrology System aids 90 and 65 nm IC manufacturing.

SpectraCD-XT provides inline CD and profile measurements of critical device structures that help enable early prediction of IC performance and yield at 90 and 65 nm nodes. Suited for high-volume IC manufacturers, this spectroscopic ellipsometry-based CD metrology tool features sub-2 sec move-acquire-measure time and throughput rated up to 100+ wph. Optics use oblique illumination, enabling...

Fly-Height Tester is suited for HDD manufacturers.

Designed for data storage industry, D6 fly-height metrology system uses laser-based phase interferometer to test down to contact with precision within 0.15 nm and matching within 0.64 nm. Multiple signals are used to directly discern differential phase of light reflected off recording head surface without need for calibrating intensity envelope of interference fringes. Measurement principle...

Dies & Stamping Services with Over 25 Years of Experience

PDS is an established leader in progressive die stamping, with a reputation for providing precision and value that dates back more than half a century. Through extensive capabilities and a staff of seasoned professionals, we set the standard for quality, delivering flexible services that can meet the needs of the most challenging requirements. See our video to learn more.