Evaluation Electronics export data into Excel.
Using QUADRA-CHEK Wedge v2.9, users can export data into Excel format from QUADRA-CHEK Evaluation Electronics. Program provides full Windows compatibility, macro-enabled worksheets, and support for Excel 2010 and 2013. Ability to save Excel files to network folders or any other specified folder with QCWedge streamlines process of data acquisition by allowing customers to connect QUADRA-CHEK...
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Evaluation Electronics export data into Excel.
Using QUADRA-CHEK Wedge v2.9, users can export data into Excel format from QUADRA-CHEK Evaluation Electronics. Program provides full Windows compatibility, macro-enabled worksheets, and support for Excel 2010 and 2013. Ability to save Excel files to network folders or any other specified folder with QCWedge streamlines process of data acquisition by allowing customers to connect QUADRA-CHEK...
Read More »Inspection System includes high-speed 3D metrology.
With high-speed 3D metrology, NSX-® Series is capable of high-volume production monitoring as well as process development and control of die-level interconnects. Data is collected in seconds from millions of bumps and then analyzed by Discover Software analysis database. Engineers gain insight into critical metrology applications, from both individual bump point of view or holistically as wafer,...
Read More »Inspection System includes high-speed 3D metrology.
With high-speed 3D metrology, NSXÃ-® Series is capable of high-volume production monitoring as well as process development and control of die-level interconnects. Data is collected in seconds from millions of bumps and then analyzed by Discover Software analysis database. Engineers gain insight into critical metrology applications, from both individual bump point of view or holistically as...
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Advantages of VPSA Technology for Your Application
VPSA technology uses different equipment than PSA and requires significantly less energy, resulting in an average cost savings of one-third to one-half in comparison to PSA systems.
Read More »Akrometrix Announces Automated Die Attach Tilt Metrology
ATLANTA, GA – Akrometrix LLC, the leading provider of thermal warpage and strain metrology equipment to both the front- and back-end semiconductor and electronics industries, today announced that it has developed an automated die-board (or daughter-mother board) attach tilt metrology. All Akrometrix shadow moire or DFP systems (AXPs) can be upgraded with the new feature. As die, components or...
Read More »Akrometrix Announces Automated Die Attach Tilt Metrology
ATLANTA, GA- – Akrometrix LLC, the leading provider of thermal warpage and strain metrology equipment to both the front- and back-end semiconductor and electronics industries, today announced that it has developed an automated die-board (or daughter-mother board) attach tilt metrology. All Akrometrix shadow moire or DFP systems (AXPs) can be upgraded with the new feature. As die, components or...
Read More »Thermal Warpage and Strain Metrology Platforms will be Displayed at GOMACTech
Thermal Warpage and Strain Metrology Platforms will be Displayed at GOMACTech ATLANTA, GA - Akrometrix LLC, the leader in elevated temperature surface characterization, will exhibit in Booth #108 at the GOMACTech 2016 Conference, scheduled to take place March 14-17, 2016 in Orlando, Fl. Established in 1968, the conference has focused on advances in systems being developed by the Department of...
Read More »Thermal Warpage and Strain Metrology Platforms will be Displayed at GOMACTech
Thermal Warpage and Strain Metrology Platforms will be Displayed at GOMACTech ATLANTA, GA- - Akrometrix LLC, the leader in elevated temperature surface characterization, will exhibit in Booth #108 at the GOMACTech 2016 Conference, scheduled to take place March 14-17, 2016 in Orlando, Fl. Established in 1968, the conference has focused on advances in systems being developed by the Department of...
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Micro Metrology Sensor measures small, fragile features.
Employing resonance as trigger mode, Feather Probe™ supports tips as- small as 100 microns in diameter and trigger forces below 1 mg for measurement of extremely small features as well as fragile or easily deformed features. Dynamic Resonance Mode eliminates effects of such external influences as temperature, air motion, and vibration. Typically protected behind cover when not in use, styli...
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Micro Metrology Sensor measures small, fragile features.
Employing resonance as trigger mode, Feather Probe™ supports tips asÃ- small as 100 microns in diameter and trigger forces below 1 mg for measurement ofÃÂ extremely small features as well as fragile or easily deformed features. Dynamic Resonance Mode eliminates effects of such external influences as temperature, air motion, and vibration. Typically protected behind cover when not in...
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Error Proofing by Design
Sturtevant Richmont's torque tools help customers cut rework and warranty costs while increasing throughput.
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