Metrology Equipment

Gleason to Demonstrate New Solutions for Advanced Gear Production at IMTS 2016

Rochester, New York, USA Gleason will demonstrate brand new solutions in advanced gear manufacturing technology on Booth #N-7000 at IMTS 2016, covering a wide array of processes for the complete production and inspection of all types of bevel and cylindrical gears. Among the technologies to be exhibited are: Genesis® 260GX – New Threaded Wheel Grinding Powerhouse The 200/260GX machines are the...

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Mahr Federal to Highlight MarShaft(TM) Scope 250 Plus, New MarShaft Scope 600 Plus 3D, and MarGear GMX 400 at IMTS 2016

Mahr Federal to Highlight MarShaft(TM) Scope 250 Plus, New MarShaft Scope 600 Plus 3D, and MarGear GMX 400 at IMTS 2016

-- Also Custom Gage Capabilities of Mahr Federal's MarSolutions Engineered Metrology Team PROVIDENCE, RI – Mahr Federal will feature the MarShaft™ SCOPE 250 plus, the new MarShaft Scope 600 plus 3D, and the MarGear GMX 400 at IMTS 2016, September 12-17, 2016, McCormick Place, Chicago, IL, Booth #E-5614. Also on display will be several custom gaging solutions developed by the MarSolutions...

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Spectroradiometer enables inspection to Rec. 2020 standards.

Spectroradiometer enables inspection to Rec. 2020 standards.

With contrast ratio of 1,000,000:1 and wavelength resolution of 0.4 nm, GS-1290 Display Measurement System is useful for metrology tasks in display fabrication, including inspection of reference monitors. High blue light sensitivity makes system effective for use with virtually all display types, including LED backlit displays. Equipped with AVS telescope for image acquisition, GS-1290 DMS has...

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Convection Reflow Emulation is offered for warpage metrology.

Available as optional module to Akrometrix AXP shadow moiré system, Convection Reflow Emulation Module (CRE6) lets user mirror thermal environment of- reflow oven while conducting warpage metrology.- Users of CRE6 are able to measure warpage on substrates up to 70 mm dia with sub-micron z-resolution in- convection reflow environment. Heating rates up to 5°C/sec allow measurements from 25 to...

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3D Laser Scanner targets shop floor applications.

Efficient on black, multicolored, and shiny surfaces, MetraSCAN 3D helps manufacturers address potential quality control issues at any stage of production cycle, regardless of part complexity and material. System provides 480,000 measurements/second and volumetric accuracy of 0.0025 in. Thanks to TRUaccuracy, MetraSCAN 3D’s optical-based data acquisition process delivers measurement accuracy...

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Evaluation Electronics export data into Excel.

Evaluation Electronics export data into Excel.

Using QUADRA-CHEK Wedge v2.9, users can export data into Excel format from QUADRA-CHEK Evaluation Electronics. Program provides full Windows compatibility, macro-enabled worksheets, and support for Excel 2010 and 2013. Ability to save Excel files to network folders or any other specified folder with QCWedge streamlines process of data acquisition by allowing customers to connect QUADRA-CHEK...

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Inspection System includes high-speed 3D metrology.

With high-speed 3D metrology, NSX® Series is capable of high-volume production monitoring as well as process development and control of die-level interconnects. Data is collected in seconds from millions of bumps and then analyzed by Discover Software analysis database. Engineers gain insight into critical metrology applications, from both individual bump point of view or holistically as wafer,...

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Akrometrix Announces Automated Die Attach Tilt Metrology

ATLANTA, GA- – Akrometrix LLC, the leading provider of thermal warpage and strain metrology equipment to both the front- and back-end semiconductor and electronics industries, today announced that it has developed an automated die-board (or daughter-mother board) attach tilt metrology. All Akrometrix shadow moire or DFP systems (AXPs) can be upgraded with the new feature. As die, components or...

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Thermal Warpage and Strain Metrology Platforms will be Displayed at GOMACTech

Thermal Warpage and Strain Metrology Platforms will be Displayed at GOMACTech ATLANTA, GA- - Akrometrix LLC, the leader in elevated temperature surface characterization, will exhibit in Booth #108 at the GOMACTech 2016 Conference, scheduled to take place March 14-17, 2016 in Orlando, Fl. Established in 1968, the conference has focused on advances in systems being developed by the Department of...

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Micro Metrology Sensor measures small, fragile features.

Micro Metrology Sensor measures small, fragile features.

Employing resonance as trigger mode, Feather Probe™ supports tips as- small as 100 microns in diameter and trigger forces below 1 mg for measurement of- extremely small features as well as fragile or easily deformed features. Dynamic Resonance Mode eliminates effects of such external influences as temperature, air motion, and vibration. Typically protected behind cover when not in use, styli...

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