New Metrology Equipment Products

Metrology System measures multi-layer film thickness.

Suited for production monitoring of critical gate applications on product wafers and 45/32 nm development, Aleris 8500 combines composition and multi-layer film thickness metrology. It is built on SpectraFx 200 technology featuring 150 nm Broadband Spectroscopic Ellipsometry (BBSE(TM)) optics. Single-tool solution comes with StressMapper(TM) module that provides high spatial resolution for...

Vision System offers multi-sensor metrology solution.

Providing vision, touch probe, and laser scanning, Galileo AV1824 Video Measurement System delivers zoom magnification of 12:1 with programmable magnification range from 15-550x using auxiliary lenses. Dual output LED illuminator, ring light, and co-axial illumination provide optimal lighting. Offering measurement volume of 24 x 18 x 6 in., AV1824 includes Metronics Quadra-ChekÃ-® QC-5000 3-D...

Laser Trackers have maintenance-free internal design.

Utilized for portable applications, Absolute TrackerÃ-® measures 2 ft tall and weighs 48 lb. Model AT901-LR, for aerospace applications, has measurement volume of up to 262 ft when used with corner cube or 98 ft with Leica T-Probe, T-Scan, or T-Mac. Suited for automotive applications, AT901-MR measurement volume is up to 163 feet with corner cube and 59 feet with Leica T-Products, while...

Rohm and Haas Electronic Materials Invests $60 Million in 193nm Immersion Lithography System

MARLBOROUGH, Mass., June 26 / - Rohm and Haas Electronic Materials (NYSE:ROH) will invest $60 million in leading edge lithography equipment to support its extensive research and development of advanced 193 nanometer (nm) photoresist and anti-reflective coatings used in the manufacture of semiconductor devices. As a leading material supplier to the semiconductor industry, our ability to deliver...

Smart Pricing Labels for Smart Retailers

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FT-IR Metrology System meets cleanliness standards.

Offered as complete lab-to-FAB solution, ECO 3500 incorporates SpartanÃ-® equipment front-end solution as well as spectrometer and analytical software. It is designed for seamless integration into automated wafer handling facilities and includes dual end-effector configuration with two 300 mm in-line load ports as well as precision edge grip stage. Software interface provides full SEMI...

Metrology Wells combine speed and portability.

Series 9140 Field Metrology Wells, specified over Ã--25 to +661Ã-

Mobile Metrology System is offered in 3 configurations.

Available as inspection solution with PolyWorks/Inspect, reverse-engineering solution with PolyWorks/Modeler, and inspection/reverse engineering package with PolyWorks Inspect and Modeler, ScanShark(TM) delivers articulated arm measurement and laser scanning for on-demand part inspection and/or reverse engineering on shop floor. It includes 7-axis INFINITE CMM, ScanShark(TM) 4Vi laser scanning...

Synopsys and NanoGeometry Collaborate to Deliver Higher Modeling Accuracy and Predictability for 45-Nanometer DFM

PHOTOMASK JAPAN, Yokohama, Japan, April 17 -- Synopsys, Inc. (NASDAQ:SNPS), a world leader in semiconductor design software, and NanoGeometry Research, Inc. (NGR), a technology leader in electron beam pattern inspection tools for microelectronics manufacturing, today announced that they are collaborating to enable faster, more accurate, more predictive optical proximity correction (OPC)...

Metrology System meets requirements of IC manufacturing.

Identifying changes and irregularities in film microstructure, Crystalx II(TM) wide angle X-ray diffraction metrology system provides quick quantitative full wafer measurements of crystallographic texture, phase, and relative grain size. Suitable for process development and production, monitoring tool uses 2D area detector for collection of multiple diffraction peaks at multiple angles...

Surface Analyzer measures roughness and micro-waviness.

With spatial bandwidth coverage from 0.22-2,000 microns and noise floor below 0.5 angstroms, Candela Optical Surface Analyzer 6300 Series delivers metrology and inspection capabilities for data storage substrates and finished media in both radial and circumferential directions. Multi-channel optics, combined with laser stability management technology, delivers measurement capabilities for edge...

Oilfield Improvements® Wheeled Rod Guide® Couplings Celebrate 35th Anniversary

For over 35 years our Wheeled Rod Guide Couplings, have been at work in oil fields across the globe. Our products are engineered to extend the service life of sucker rods and tubing, delivering cutting-edge innovation that enhances oilfield operation, maximizes output, and enhancing overall operations. To learn about the advantages of using Wheeled Rod Guide Couplings in your wells, see our video.