Microscopes

Wafer Analysis System quickly diagnoses root cause of defects.
Inspection Equipment

Wafer Analysis System quickly diagnoses root cause of defects.

With automated front opening universal pod, Helios NanoLab™ 1200AT DualBeam™ System can be located inside semiconductor wafer lab, where SEM imaging and focused ion beam milling are used to extract ultrathin samples of targeted structures for examination in TEM. System can create site-specific TEM samples thin enough to capture single transistor at 10 nm node, from wafers up to 300 mm in...

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Microscopes

Digital Microscopes provide inspection and measurement.

With coded optics and FlexAperture™ technology for consistent illumination throughout zoom range, Leica DMS1000 is suited for R&D and quality control. DMS300,Â- featuring swing-arm stand and LED ring-light, performs digital inspection and documentation tasks in industrial applications. Up to 30 images/sec minimize image delay, while zoom optics provide natural reproduction without...

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All-in-One Microscope offers 0.1-5,000x magnification range.
Microscopes

All-in-One Microscope offers 0.1-5,000x magnification range.

Incorporating observation, measurement, and image recording, Model VHX-700F provides bright field, dark field, and transmitted illumination. Not only can images be captured entirely in focus with large depth-of-field, but variety of measurements can be completed directly on image with click of mouse. Multi-angle stand is paired with rotating stage to allow 360° views without need to fixture or...

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Research Stereo Microscopes come in motorized, manual versions.
Microscopes

Research Stereo Microscopes come in motorized, manual versions.

Motorized SMZ25 and manual SMZ18 are intended for industrial tasks as well as bioscience and medical applications. Perfect Zoom System enables zoom range of 25:1 (0.63-15.17x) and numerical aperture of 0.156 for SMZ25 withÂ- 1x objective at highest zoom, allowing researchers to image both entire sample as well as its microscopic details using one instrument. Epi-fluorescence...

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Microscopes

Spectroscopy System provides nanoscale identification, analysis.

Intended for life science and materials science applications, AFM/Raman system integrates Agilent 6000ILM AFM (atomic force microscope) andÂ- HORIBA XploRA INV (inverted Raman microscope). Functionality lets researchers exceed optical diffraction limit to achieve nanoscale resolution as they perform Raman spectroscopy. Capabilities include AFM/Raman co-localization, tip-enhanced...

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Gas / Chemical Analyzers

ZEISS Lightsheet Z.1 Awarded with Best New Life Science Product of 2012

Majority of SelectScience members voted for ZEISS light sheet microscope system At the American Association for Cancer Research (AACR) Annual Meeting 2013 in Washington, D.C., USA, SelectScience announced that ZEISS Lightsheet Z.1 has been awarded with the Best New Life Science Product of 2012 by members of SelectScience – an independent online publisher providing access to product news,...

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Dimensional Measurement & Inspection Probes

New York University Acquires 100th Leica Confocal Laser Scanning Microscope with White Light Laser for Morphogenetic Studies

The Leica TCS SP8 X provides total freedom of excitation and emission coupled with low laser power and high sensitivity Mannheim, Germany – The Department of Biology at New York University has been equipped with the 100th Leica TCS SP8 X, a state-of-the-art confocal laser scanning microscope with aÂ- white light laser. The system offers complete spectral freedom for fluorescence...

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Atomic Force Microscope offers several operational modes.
Microscopes

Atomic Force Microscope offers several operational modes.

Delivering closed-loop precision, Hi-Res imaging, and low-noise force measurements, MFP-3D Origin™ offers basic scan modes as well as nanolithography, Dual AC™, and piezoresponse force microscopy modes. Additional functionality may be added for optional modes such as conductive AFM, AM-FM viscoelastic mapping for nanomechanical analysis, scanning tunneling microscopy, and scanning thermal...

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Spectrometers

FEI Achieves Milestone for Automated Mineralogy Products

Techniques have experienced wide-spread acceptance for their ability to deliver critical information to optimize exploration and production in mining and oil & gas industries Hillsboro, Ore.Â- – FEI (NASDAQ: FEIC) today announced that it has reached a milestone of more than 200 automated mineralogy systems installed worldwide. FEI's Mineral Liberation Analysis (MLA) and QEMSCAN®...

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Materials Microscope utilizes universal LED illumination.
Microscopes

Materials Microscope utilizes universal LED illumination.

Used for inspection tasks in metallography, earth science, forensic investigation, and materials QC/research, Leica DM2700 M uses Leica optics and offers built-in oblique illumination technology that aids inÂ- surface inspection details visualization. White-light LED illumination provides constant color temperature of 4,500K for brightfield, darkfield, interference contrast, and polarized...

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Precision Machining Solutions with Over 25 Years of Experience
Sponsored

Precision Machining Solutions with Over 25 Years of Experience

Quality, customer service, and unbeatable value are the hallmarks of Hogge Precision. Since 1989 we have built a reputation as the go-to precision machining source, servicing many demanding industries. For CNC machining and screw machining, there are few manufacturers that can match our capabilities and expertise. See our video to learn more.

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