Microscopes

New EIKOS-UV Delivers Nanoscale Structural Information

New EIKOS-UV Delivers Nanoscale Structural Information

Atom probe microscope enables understanding of materials for research and fast development of products. Addresses a wide variety of applications including metals, semiconductors, functional materials, minerals, thin films and coatings. Includes pre-aligned electrode that eliminates the need for in-situ alignment and 55nm laser pulse system.

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Scanning Electron Microscope supports diverse applications.

Scanning Electron Microscope supports diverse applications.

With compound final lens, Apreo™- offers resolution down to 1.0 nm at 1 kV, without need for beam deceleration, for optimal performance on sample- even if it is tilted or topographic. Backscatter detection is offered at lowest beam currents, at any tilt angle, on sensitive samples, and at TV-rate imaging to maximize materials contrast, and detector segments can be individually addressed to...

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Mahr Federal to Feature MarVision MM 320 and MarVision QM 300 Video Measuring Microscopes with Image Processing at MD&M EAST 2016

Mahr Federal to Feature MarVision MM 320 and MarVision QM 300 Video Measuring Microscopes with Image Processing at MD&M EAST 2016

Also on display will be the MarShaft™ SCOPE 250 plus flexible optical system for shop floor measurement PROVIDENCE, RI – Mahr Federal will feature the MarVision MM 320 and the MarVision QM 300 video measuring microscopes with image processing capability at MDM EAST, June 14-16, 2016, Jacob K. Javits Convention Center, New York, NY, Booth #2121. Designed for the measurement and/or dimensioning...

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Mahr Federal to Feature MarVision MM 320 Video Measuring Microscope with Image Processing at MD&M West 2015

Mahr Federal to Feature MarVision MM 320 Video Measuring Microscope with Image Processing at MD&M West 2015

PROVIDENCE, RI- – Mahr Federal will feature the MarVision MM 320, a new video measuring microscope with image processing capability, the flagship product for a new line of Mahr optical measuring instruments, at MDM West, February 10-12, 2015, Anaheim Convention Center, Anaheim, CA, Booth #2887. Designed for the measurement and/or dimensioning of geometric elements, the MarVision MM 320...

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Toshiba Nanoanalysis Corporation Expands Capabilities with ZEISS Xradia 520 Versa

Toshiba Nanoanalysis Corporation Expands Capabilities with ZEISS Xradia 520 Versa

Thornwood, N.Y. – Carl Zeiss X-ray Microscopy, formerly Xradia, Inc., announced today that Kawasaki, Japan-based Toshiba Nanoanalysis Corporation has selected the recently-introduced ZEISS Xradia 520 Versa 3D X-ray microscope (XRM) to expand the capabilities of its busy analysis lab. Toshiba Nanoanalysis offers imaging services for complex analytical demands in semiconductor, biosciences and...

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Digital Inspection Microscope has HDMI and USB outputs.

Digital Inspection Microscope has HDMI and USB outputs.

Cyclops, supplied with 4x objective lens (10x optional), lets users see magnified views- via direct connection- to HD monitor- via HDMI output or computer via USB output. In HDMI mode, magnification is 15x–270x on- 21.5 in.- HD monitor. Magnification increases up to 534x if USB cable is used for PC viewing. Adaptable instrument, featuring 5 MP CMOS sensor and 30 LEDs, lets operators see 30...

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Metrology System offers non-destructive, 3D surface profiling.

Metrology System offers non-destructive, 3D surface profiling.

Combining lateral resolution up to 140 nm via confocal microscopy and vertical resolution up to 0.1 nm with interferometry, Leica DCM8 provides surface analysis of materials and components. Instrument is also suitable for color documentation of samples. Wide choice of Leica objectives, together with 4 LED light sources and integrated CCD camera, deliver true-to-life color images. With XY...

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