New EIKOS-UV Delivers Nanoscale Structural Information
Atom probe microscope enables understanding of materials for research and fast development of products. Addresses a wide variety of applications including metals, semiconductors, functional materials, minerals, thin films and coatings. Includes pre-aligned electrode that eliminates the need for in-situ alignment and 55nm laser pulse system.
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Scanning Electron Microscope supports diverse applications.
With compound final lens, Apreo™- offers resolution down to 1.0 nm at 1 kV, without need for beam deceleration, for optimal performance on sample- even if it is tilted or topographic. Backscatter detection is offered at lowest beam currents, at any tilt angle, on sensitive samples, and at TV-rate imaging to maximize materials contrast, and detector segments can be individually addressed to...
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Mahr Federal to Feature MarVision MM 320 and MarVision QM 300 Video Measuring Microscopes with Image Processing at MD&M EAST 2016
Also on display will be the MarShaft™ SCOPE 250 plus flexible optical system for shop floor measurement PROVIDENCE, RI – Mahr Federal will feature the MarVision MM 320 and the MarVision QM 300 video measuring microscopes with image processing capability at MDM EAST, June 14-16, 2016, Jacob K. Javits Convention Center, New York, NY, Booth #2121. Designed for the measurement and/or dimensioning...
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FEI and CEOS Deliver First Sub-Angstrom, Low-Voltage Electron (SALVE) Microscope to the University of Ulm
Developed in the frame of University Ulm's SALVE project, the microscope provides high-contrast, atomic-scale imaging of radiation-sensitive samples, such as graphene and organic materials. Hillsboro, Ore. and Heidelberg, Germany — FEI (NASDAQ: FEIC) and CEOS announced today that they have delivered the first sub-Ã
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3 Steps to Maximize Your Company's Cash Flow
This white paper provides an overview into maximizing cash flow for your company.
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Digital Microscope offers full-HD 360-degree rotating views.
Designed for quality control, testing, inspection, and documentation, rotating viewer accessory for EVO Cam Digital Microscope delivers oblique view of subject that can be rotated 360-
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Mahr Federal to Feature MarVision MM 320 Video Measuring Microscope with Image Processing at MD&M West 2015
PROVIDENCE, RI- – Mahr Federal will feature the MarVision MM 320, a new video measuring microscope with image processing capability, the flagship product for a new line of Mahr optical measuring instruments, at MDM West, February 10-12, 2015, Anaheim Convention Center, Anaheim, CA, Booth #2887. Designed for the measurement and/or dimensioning of geometric elements, the MarVision MM 320...
Read More »Agilent Technologies Installs Atomic Force Microscope with Scanning Microwave Microscopy Capabilities at Cambridge Graphene Centre
SANTA CLARA, Calif.- — Agilent Technologies Inc. (NYSE: A) today announced the recent installation of an Agilent 5600LS atomic force microscope at the Cambridge Graphene Centre (CGC) in the United Kingdom. The CGC, one of the key consortium partners in the ambitious Future and Emerging Technologies (FET) Graphene Flagship project, is directed by Andrea Ferrari, professor of nanotechnology at...
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Atomic Force Microscopes sense both resistance and capacitance.
Based on shielded AFM probes and electronics from PrimeNano, Inc., sMIM Scanning Microwave Impedance Microscopy is integrated exclusively with MFP-3D™ and Cypher™ AFMs.- Technique enables nanoscale mapping of permittivity and conductivity on linear and non-linear materials, including conductors, semiconductors, and insulators. sMIM is applicable to broad range of samples, including...
Read More »Probe Microphone can be used in small, hard-to-reach areas.
Accommodating R&D engineers who need to measure sound pressure in confined areas, Model 377B26 comprises microphone, preamplifier, housing, and probe tips of different lengths. Max operating temperature of 800-
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Acoustic Microscope delivers fast and flexible scanning.
Completely automated and convertible to perform full laboratory analysis, Model DF2400™ offers SECS-II/GEM E30 and SMEMA compatibility and is suited for inspecting ICs and flip chips in JEDEC-style trays or metal carriers as well as lead frame strips, IGBT power modules, and other components. Throughput is optimized due to- two transducers and two simultaneous scanning stages. Dedicated drying...
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Micro Air's Dust, Fume, Mist Collection Equipment Facilitate a Safe Work Environment
Dust, fume, and mist collectors from Micro Air promote a safer, more productive work environment. Our wide array of products are available to the industrial manufacturing sector for processes such as welding, cutting, grinding, blasting, and more. Check out our video to learn more.
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