Electrical / Electronic Probes

Electrical / Electronic Probes

Differential Active Probes facilitate digital system design.

Available in 1.5, 3.5, and 6 GHz models, N2750A Series features InfiniMode technology, which allows measurements of differential, single-ended, and common-mode signals with single probe tip without reconnecting probe to change connection. Units offer low input loading of 200 kW differential, 10 Vpp dynamic range, ±15 V offset range, and CMRR of greater than 60 dB at 1 MHz. Using built-in,...

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RF Probes deliver repeatable broadband measurements.
Electrical / Electronic Probes

RF Probes deliver repeatable broadband measurements.

Utilizing independent probes arranged to create ground shield, K-50 Series can articulate to absorb DUT tolerances, fixture tolerances, and flexure when used in plunge-to-board test applications. Each ground and signal probe is replaceable and features instrument-grade Pogo Pin architecture, which is designed for up to 90% compression. Offering measurement capabilities from 4-12 GHz,...

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Canadian Circuits Purchases MICROCRAFT Flying Probe Tester
Electrical / Electronic Probes

Canadian Circuits Purchases MICROCRAFT Flying Probe Tester

Surrey B.C.: Praveen Arya, President and owner of Canadian Circuits, Inc. of Surrey British Columbia, announced today that his company has recently acquired The MICROCRAFT EMMA ELX Flying 6146 Flying Probe tester. This tester is one of MICROCRAFT's popular series of Testers that offers fast highly accurate flying probe testing. Mr. Arya commented, More of our customers are requiring quick turn...

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Preview for the Print Media for Seica Inc for the Nepcon Shanghai Show, April 25th to 27th, Booth 1H70
Electrical / Electronic Probes

Preview for the Print Media for Seica Inc for the Nepcon Shanghai Show, April 25th to 27th, Booth 1H70

Strambino, Italy - Seica China will be an exhibitor at the Nepcon Shanghai being held on April 25th to 27th. The featured systems in booth # 1 H70 will include the Pilot V8 Flying Prober and the RTE-200 System. Pilot Flying Probe Test Systems PILOT is the most versatile and complete line of automated flying probe test systems on the market today, offering the widest range of solutions and...

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Preview for Seica SpA for SMT Nuremberg 2012 for the Print Media - May 8th to 10th, 2012
Electrical / Electronic Probes

Preview for Seica SpA for SMT Nuremberg 2012 for the Print Media - May 8th to 10th, 2012

Seica SpA will showcase at SMT Nuremberg the following new products with the latest features: Pilot V8 Flying Probe System: The Pilot V8 is an innovative technology that offers maximum performance in regards to high test speed, test coverage and flexibility. The system's vertical architecture is the optimum solution for probing both sides of the UUT simultaneously. This feature guarantees fast,...

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Electrical / Electronic Probes

Flying Lead Solder-Down Probe suits PCIe 3.0 protocol analysis.

Used with U4301A protocol analyzer module, U4324A can be used for bidirectional lane widths as narrow as x2 and cleanly captures 8.0 GT/s traces from DUT. Probe provides additional line for connection to external reference clock, and it supports 2.5, 5, and 8 GT/s PCIe IO speeds. Designed to meet needs of silicon, system, and embedded PC connector testing, product works with replaceable N5426A...

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Electrical / Electronic Probes

CompactPCI Serial Interposer aids PCI Express 2.0 analysis.

Intended for Summit(TM) PCIe protocol analyzer product line, PCIe 2.0 cPCI serial interposer provides dedicated probe that helps analyze in-band PCIe data traffic between cPCI serial card and its system chassis. Star architecture is made up of serial point-to-point connections; one system slot can control up to 8 peripheral slots. Instrument supports PCIe data channels with lane widths up to x8...

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PCB Track Current Probe presents minimal disturbance.
Electrical / Electronic Probes

PCB Track Current Probe presents minimal disturbance.

Suited for use with any oscilloscope, Aim-TTi I-Prober 520 allows observation and measurement of current flow by placing insulated tip onto PCB track. Handheld unit can also be used on other conductors, such as captive wires, components, IC pins, and PCB ground planes. General-purpose H-field probe, based on fluxgate magnetometer principle, measures track currents from 10 mA to 20 A (pk-pk), with...

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Electrical / Electronic Probes

PCI 3.0 Multi-Lead Probe utilizes Gen3 tapping technology.

Available for Summit(TM) T3-16 and Summit T3-8 Protocol Analyzers, PCI Express® 3.0 multi-lead probe can be used by system developers to probe point-to-point bus signals or serial buses when there is no supported interposer card. Tool supports PCIe 3.0 specification, which includes data rates up to 8 GT/s, and is expandable to support x1-x16 PCIe lanes when using Summit protocol analyzer....

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