Electrical / Electronic Probes

Mixed Domain Oscilloscope combines up to 6 Instruments in 1.
Electrical / Electronic Probes

Mixed Domain Oscilloscope combines up to 6 Instruments in 1.

ProvidingÂ- synchronized view of analog and digital waveforms along with RF spectrum traces, MDO4000C Series expands core oscilloscope functionality with spectrum analyzer, arbitrary/function generator, logic analyzer, and protocol analyzer options. Complementary digital voltmeter is offered with product registration. Suited as debug tool for IoT and other embedded engineering...

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Electrical / Electronic Probes

Oscilloscope Probing Solutions operate from -40 to +85°C.

With input impedance of 10 MΩ and 400 MHz bandwidth,Â- N7007A is 2 m long, single-end, 10:1 passive probe used for probing electrical signals inside temperature chamber. As extension kit, 70 cm-long N7013A includes 4 medium- and high-voltage differential active probes: N2790A (±1,500 V), N2791A (±700 V), N2792A (±20 V), and N2818A (±20 V). Engineers...

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Oscilloscopes and Probes offer low-noise M-PHY test solution.
Electrical / Electronic Probes

Oscilloscopes and Probes offer low-noise M-PHY test solution.

When used with DPO70000SX or MSO/DPO70000DX oscilloscopes and P7600 Series TriMode™ probes, Option M-PHY TX Automated offers low-noise test solution for MIPI® M-PHY® 3.1 specification and Conformance Test Suite 3.1. Solution supports M-PHY High Speed Gears 1, 2, and 3 as well as PWM Mode and SYS Mode. Option is capable of testing transmitters running in high-speed mode with...

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Choosing the Right Material for Your Project
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Electrical / Electronic Probes

Semiconductor Test Probe meets HED device testing challenges.

With 5.0 mm test height that providesÂ- total compression window of 0.8 mm and insertion loss of 18 GHz @ -1 dB (GSG), ZIP™ semiconductor test probe model Z-080YHJ targets high-lead count BGAs and LGAs and meets challenges associated with testing High End Digital (HED) devices. DUT side plunger, which is made from HyperCore™ homogenous alloy, features sharp, dual tip...

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Differential Probes offer 2 kV and 8.4 kV safety ratings.
Electrical / Electronic Probes

Differential Probes offer 2 kV and 8.4 kV safety ratings.

Safety-rated for 8,485 V and 6,000 Vrms, Model HVD3605 provides test coverage of 5 kV class electrical apparatus and power electronics. Probe has 1% gain accuracy, wide differential voltage range of 7,000 V, and 100 MHz of bandwidth. Model HVD3206, safety-rated for 2,000 V and 1,500 Vdc per IEC/EN 61010-031:2015 standard, addresses solar PV string inverter requirements for 1,500 Vdc inputs. Probe...

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Probe Adapters enable 3rd-party probe and current sensor use.
Electrical / Electronic Probes

Probe Adapters enable 3rd-party probe and current sensor use.

Permitting connection of select Tektronix TekProbe interface level II probes to any ProBus-equipped Teledyne LeCroy oscilloscope, TPA10 TekProbe® Probe Adapter automatically detects which probe is attached, supplies all necessary power and offset control to probe, and communicates probe signal to oscilloscope. CA10 Current Sensor Adapter is programmable and customizable to work with...

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Electrical / Electronic Probes

In House MMIC Development Suit

Elbit Systems EW and SIGINT – Elisra receives much attention at TheÂ- IMS2015 in Phoenix. MMIC  Devices: • Passive and Active 0.15um PHEMT GaAs MMIC's DC – 50 GHz • Passive components printed on hard substrates • Multi Function Integrated Circuits • Multi Layer Technology • In House On-Wafer (Probe Station) Testing • Multi Layer Buried Components

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Current Probes offer sensitivity down to 1 mA/div.
Electrical / Electronic Probes

Current Probes offer sensitivity down to 1 mA/div.

With 50 MHz Model CP030A and 100 MHz Model CP031A, users can measure currents from milliamps to peak current of 50 A. Small jaws, clamping onto conductors up to 5 mm in diameter, enable measurements in tight spaces. When used with 12-bit resolution HDO high definition oscilloscopes, users can obtain accurate, low-current waveforms for optimized debug and analysis capabilities. Probes connect...

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