Electrical / Electronic Probes

Semi-Rigid Probes facilitate microwave circuit testing.
Electrical / Electronic Probes

Semi-Rigid Probes facilitate microwave circuit testing.

Constructed of semi-rigid coax, probes feature SMA Female connectors and come in- 3 diameters and 3 lengths from 3–12 in. to help when attaching unterminated end of probe to circuit board trace. Straight-cut probe ends for those that want to customize dimensions of center conductor and dielectric dimensions, while pre-stripped probe ends for immediate use. Products are 100% RF tested to...

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Semi-Rigid Probes facilitate microwave circuit testing.
Electrical / Electronic Probes

Semi-Rigid Probes facilitate microwave circuit testing.

Constructed of semi-rigid coax, probes feature SMA Female connectors and come inÂ- 3 diameters and 3 lengths from 3–12 in. to help when attaching unterminated end of probe to circuit board trace. Straight-cut probe ends for those that want to customize dimensions of center conductor and dielectric dimensions, while pre-stripped probe ends for immediate use. Products are 100% RF...

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Teledyne LeCroy's High-speed Digital Analyzer and Probing System Complete Mixed-Signal Solution
Electrical / Electronic Probes

Teledyne LeCroy's High-speed Digital Analyzer and Probing System Complete Mixed-Signal Solution

HDA125 High-speed Digital Analyzer adds 18-channel, 12.5-GS/s digital acquisition capabilities with industry-leading sensitivity and revolutionary QuickLink probing solution to Teledyne LeCroy oscilloscopes CHESTNUT RIDGE, N.Y. and SANTA CLARA, Calif. - Teledyne LeCroy today significantly expands the capabilities of its industry-leading oscilloscopes with the introduction of the HDA125 High-speed...

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Teledyne LeCroy's High-speed Digital Analyzer and Probing System Complete Mixed-Signal Solution
Electrical / Electronic Probes

Teledyne LeCroy's High-speed Digital Analyzer and Probing System Complete Mixed-Signal Solution

HDA125 High-speed Digital Analyzer adds 18-channel, 12.5-GS/s digital acquisition capabilities with industry-leading sensitivity and revolutionary QuickLink probing solution to Teledyne LeCroy oscilloscopes CHESTNUT RIDGE, N.Y. and SANTA CLARA, Calif. - Teledyne LeCroy today significantly expands the capabilities of its industry-leading oscilloscopes with the introduction of the HDA125 High-speed...

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Electrical / Electronic Probes

Fine Pitch Probe is designed for WLP/WLCSP testing.

Qualified for both singulated and multisite WLP and WLCSP contacting/probing, Mercury 030 has- 2 flat surfaces moving in surface-to-surface contact. RLC parasitics are suitable for full testing of wafer level packaged devices in DC, functional, and AC parametric domains. Geometry and components provide high bandpass (8 GHz @ -1 dB insertion loss) and low resistance (160 mΩ). Featuring...

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Electrical / Electronic Probes

Fine Pitch Probe is designed for WLP/WLCSP testing.

Qualified for both singulated and multisite WLP and WLCSP contacting/probing, Mercury 030 hasÂ- 2 flat surfaces moving in surface-to-surface contact. RLC parasitics are suitable for full testing of wafer level packaged devices in DC, functional, and AC parametric domains. Geometry and components provide high bandpass (8 GHz @ -1 dB insertion loss) and low resistance (160 mΩ)....

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Electrical / Electronic Probes

High Performance Spring Probes for In-circuit and Functional PCBA Test

ECT's EDGE probe combines leading architecture and materials for lead free applications Fontana, California- – Everett Charles Technologies' (ECT) EDGE probes are the answer to poor first pass yield, short probe life and excessive cleaning cycles, when caused by oxide layer build up or debris, particularly in lead free applications. In volume manufacturing the impact worsens as cycle count...

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Electrical / Electronic Probes

High Performance Spring Probes for In-circuit and Functional PCBA Test

ECT's EDGE probe combines leading architecture and materials for lead free applications Fontana, CaliforniaÂ- – Everett Charles Technologies' (ECT) EDGE probes are the answer to poor first pass yield, short probe life and excessive cleaning cycles, when caused by oxide layer build up or debris, particularly in lead free applications. In volume manufacturing the impact worsens as cycle count...

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Electrical / Electronic Probes

Oscilloscopes automate PAM-4 pre-compliance testing.

Used with the S-Series, 90000A, V-Series, 90000 X- and Z-Series real-time oscilloscope platforms and 86100D DCA-X Infiniium sampling oscilloscope, N8836A- and N1085A PAM-4 Analysis Software applications generate comprehensive pass/fail reports in minutes. Programs deliver linearity and output voltage measurements including level separation mismatch ratio, eye width and eye height, even-odd...

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Electrical / Electronic Probes

Oscilloscopes automate PAM-4 pre-compliance testing.

Used with the S-Series, 90000A, V-Series, 90000 X- and Z-Series real-time oscilloscope platforms and 86100D DCA-X Infiniium sampling oscilloscope, N8836AÂ- and N1085A PAM-4 Analysis Software applications generate comprehensive pass/fail reports in minutes. Programs deliver linearity and output voltage measurements including level separation mismatch ratio, eye width and eye height,...

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