Agilent Technologies Introduces Deepest Memory Logic Analyzer with New Applications
Five New Products Offer Largest Display Size, Deepest Memory and Unique Applications for PCI Express and Altera FPGA Debug SANTA CLARA, Calif., Nov. 1, 2006 -- Agilent Technologies Inc. (NYSE: A) today expanded its industry-leading logic analyzer portfolio with a new modular mainframe, two new logic analyzer modules offering up to 4X the available memory in the industry, and new applications for...
Read More »Probe is for serial bus validation and compliance testing.
Used for HDMI 1.3 and PCI-Express 2.0, Model P7313SMA differential probe features 13 GHz bandwidth and extended termination voltage range. SMA probes enable users to connect to 2 SMA connectors on device under test and bring those 2 signals into differential probe that converts them into one single-ended signal. Suited for measuring differential signals in 50-omega signaling environment, unit can...
Read More »Test Probe gets into hard-to-reach areas.
Designed to probe surface mount device contacts, SMD Microtip Test Probe features stainless steel needle tip that is curved to aid in probing hard-to-reach areas. Probe is rated 1,200 Vrms max for hands-free testing in controlled environments. It is not intended for handheld use at voltages above 33 Vrms/70 Vdc.
Read More »Test Probe Kit protects measurements from interference.
Speeding test connections, BNC Shielded Test Probe Kit includes shielded test probe, Minigator with 6-32 thread for ground lead, insulated flex boot for Minigator, MinigrabberÃ-® test clip with 6-32 thread for ground lead, and replaceable stainless steel dog-leg probe tip. Probe's shield extends to within 1.5 in. of probe tip and is compatible with DMM banana plug inputs when using Pomona...
Read More »Thinking About Manufacturing Automation?
Check out this white paper to learn how cobots are able to automate manual processes.
Read More »Digitaltest at ATE Test Expo Chicago, Booth 5320, 26-28 October 2006
Concord, Ca.- August 2006 - Digitaltest GmbH is using the ATE Expo in Chicago to demonstrate its range of hardware and software test solutions for electronics manufacturers. Highlights of the show will be the company's innovative testers: Condor Flying Probe system, the MTS300 Sigma and the MTS 180 -both with new features. MTS 300 SIGMA In-Circuit Tester This system has been designed by...
Read More »AR Worldwide Redesigns Laser Probe to Meet New IEC 6 GHz Requirement
Model FL7006 Now 0.1 MHz - 6 GHz / 0.5 - 800 V/m Souderton, PA - 6/28/06 - AR Worldwide RF/Microwave Instrumentation has redesigned one of its Starprobe(TM) laser-powered e-field probes to meet the new IEC 6 GHz requirement. This new Starprobe, Model FL7006, replaces Model FL7004. Like the Starprobe Model FL7030 (5 kHz - 30 MHz / 1.5 - 300 V/m)- the FL7006 is designed and manufactured by AR...
Read More »Electrical Field Probe features measurement down to 1 V/m.
Capable of noise reduction and temperature compensation, Model FL7018 (3 MHz-18 GHz / 1-1,000 V/m) 18 GHz laser-powered probe delivers isotropic response of Ã-
Read More »Oscilloscope Probe displays signals from 100 mV to 20 V.
USB 2.0-powered and connected, PicoScope 2105 USB Pen Scope and software convert laptop or desktop PC into oscilloscope without additional probes or power supplies. PicoScope features equivalent time sampling (ETS) that works on repeating, stable signals by building up waveform from successive acquisitions. ETS sample rate for stable signals is up to 2 GS/s. Probe offers 24 kS buffer and 100 MS/s...
Read More »Probe evaluates electrical properties of LSI packages.
Fiber-optic electric field probe consists of optical fiber and lead zirconate titanate (PZT) electro-optical film on edge of fiber that acts as field sensor. With lateral size of ~125 Ã-µm, product can be inserted into narrow spaces for evaluation of electrical characteristics of high-density packaged electronic circuits on PCBs. This microscale electric field probe does not disturb...
Read More »Probe suits BGA, LGA, QFN, and QFP packages.
Designed for use with test sockets, miniature 0.4 mm Probe is available with 4-point crown, concave, or 120 single point tip. Geometry of tip is optimized to meet most application requirements. Higher force spring is available for lead-free and highly contaminated environments.
Read More »Trotec Laser Offers Customizable Industrial Laser Marking Solutions for Any Application
Trotec's laser marking solutions provide your company with configurable workstations and intuitive, customizable software. Check out our video to learn more.
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