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The innovative Cyclops HDMI Digital Microscope connects directly to any monitor through a convenient 1080p HDMI output allowing operators to see high quality images while looking straight ahead at a large screen. This system reduces eye strain and neck fatigue associated with frequent microscope use. Operators may connect their Cyclops to any HD monitor to study 1080p images (monitor not... Read More
Designed to connect directly to any monitor through 1080p HDMI output, Cyclops HDMI Digital Microscope with heavy-duty aluminum stand provide high resolution and HD picture quality. Offering magnification range of up to 132x on 21.5 in. HD monitor, unit provides optical zoom, brightness, sharpness, freeze frame, video control, snapshot setting options. Product comes with LED illumination with... Read More
Global Leader in Advanced Materials Improves Quality and Cuts Costs with a Digital Microscopy System from KeyenceApr 21, 2017
- VHX-5000 digital microscope
Imagine sorting through individual grains of sand on a beach, or searching for the largest bits of powder in a bag of flour; without an easy way to do so, your days would be long indeed. But that tedious job is similar to what lab technician Ricky Sapp once faced each workday, manually inspecting metal welding powders and the sieves used to sort them. That... Read More
Reducing eye strain and neck fatigue due to frequent microscope use, Cyclops HDMI Digital Microscope provides high quality images on large screen. Digital Microscope offers magnification range up to 132x on 21.5 in. HD monitor. Featuring HDMI output, 2-megapixel sensor, unit offers crisp, high resolution, stunning and HD picture quality. Product comes with infrared remote control to set... Read More
Capable of inspecting large and small objects with built in LED lighting, SharpVue Digital Microscope System features auto focus HD camera with optical magnification up to 30x and digital up to 300x. With working distance of 9 inches, unit offers remote access for function control like grid mode, brightness control and auto focus. System is suitable for inspecting circuit boards, analysis of... Read More
Delivering video-image quality at 60 fps, Omni HD 2D Digital Microscope and Measurement System can remain in calibration over entire zoom range, making it suitable for quality control, testing, rework, assembly, and inspection tasks. Custom-designed mouse or GUI provides intuitive operation of entire system. To ensure sharp, high-contrast imaging, separate camera control station allows manual... Read More
ZEISS Highlights Latest Microscopy Innovations and Advancements at International Manufacturing Technology ShowAug 29, 2016
Visit Booth # E-5502 for demonstrations of the newest microscope instruments for manufacturing applications ZEISS announces they will be showcasing the latest microscopy innovations and advancements at the International Manufacturing Technology Show (IMTS), September 12-17, 2016, at McCormick Place, in Chicago, IL. ZEISS experts will be on hand at Booth # E-5502 to highlight and demonstrate ZEISS... Read More
Offering users access to scientific results regardless of experience, Talos™ L120C transmission/scanning transmission electron microscope (S/TEM) provides Hi-Res, 3D imaging and analysis capabilities. Automation and directed workflows foster facilitated adoption path and accelerate results without compromising performance. Along with ultra-stable optics, this 120 kV LaB6 S/TEM features MAPS™... Read More
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Speed, sensitivity and dynamic range will enable multichannel atomic-scale imaging and analysis of material properties such as electric and magnetic fields Hillsboro, Ore. and Ithaca, NY — FEI (NASDAQ: FEIC) and Cornell University have entered an agreement to commercialize a new high dynamic range detector for FEI’s electron microscopes. It promises to enable new kinds of multichannel imaging... Read More
Themis™ Z scanning/transmission electron microscope (S/TEM) offers system stability and automated tuning routines that promote reproducible image resolution at high and low beam energies in both STEM and TEM modes. Energy dispersive x-ray systems let users configure system based on primary characterization needs, and iDPC detector, by using up to 90% of transmitted electrons, offers high... Read More
Featuring advanced scanning electron microscope and focused ion beam technology, Helios™ G4 DualBeam Series offers automated sample preparation for transmission electron microscopy and 3D sample characterization. Phoenix FIB column offers low-voltage performance for ultra-low sample damage, while Elstar electron column with UC+ technology offers 4x more monochromated current than previous... Read More
New solutions are designed to address the challenges of 7nm technology node metrology and defect/failure analysis.Â Hillsboro, Ore. - FEI (NASDAQ: FEIC) announced today the release of three new tools for process control and defect/failure analysis in advanced semiconductor manufacturing. Two of the tools are specifically targeted at the 7nm node, and all are designed to allow manufacturers to... Read More
Designed to work with all DualBeam focused ion beam/scanning electron microscope platforms, Auto Slice & View v4.0 software enables 3D structure and composition of samples at nanometer scale. Imaging can be combined with analytical capabilities, such as energy dispersive x-ray spectrometry and electron backscatter diffraction, to ensure that no information is lost in sectioning of sample.... Read More
With compound final lens, Apreo™Â offers resolution down to 1.0 nm at 1 kV, without need for beam deceleration, for optimal performance on sampleÂ even if it is tilted or topographic. Backscatter detection is offered at lowest beam currents, at any tilt angle, on sensitive samples, and at TV-rate imaging to maximize materials contrast, and detector segments can be individually addressed to... Read More
Designed for quality control, testing, inspection, and documentation, rotating viewer accessory for EVO Cam Digital Microscope delivers oblique view of subject that can be rotated 360Â° around central point. User can seamlessly switch between 360Â° rotating view to conventional direct top view. Then, with touch of button, capture full-HD images. EVO Cam provides live video streaming, 1080p/60... Read More
FEI and CEOS Deliver First Sub-Angstrom, Low-Voltage Electron (SALVE) Microscope to the University of UlmApr 28, 2016
Developed in the frame of University Ulm's SALVE project, the microscope provides high-contrast, atomic-scale imaging of radiation-sensitive samples, such as graphene and organic materials. Hillsboro, Ore. and Heidelberg, Germany — FEI (NASDAQ: FEIC) and CEOS announced today that they have delivered the first sub-Ã…ngstrom, low-voltage electron (SALVE) microscope to the University of... Read More
Connecting to PC via USB,Â MC-TLD6182 offers 20X–200X magnification to determine fine structure of surfaces. Digital camera, included, lets operatorÂ take 2.0 MP pictures, whichÂ can be interpolated to 5.0 MP pictures. Used in direct contact to surface or at larger distances, microscope also features 8 integrated, adjustable-strength,Â white LED lights and software for editing and... Read More
Available in FX and HX models, Helios™ G4 DualBeam Series offers 7 nm TEM lamella preparation solution for semiconductor manufacturing and failure analysis applications. Flexible FX system delivers STEM resolution down to sub-three Ã…ngstrÃ¶ms and enables images to be obtained within minutes of completing lamella. HX model, geared specifically for high-throughput TEM lamella production,... Read More
Consisting of hardware and software package, ZEISS Atlas 5 extends capacity of SEMs and FIB-SEMs. System streamlines automatic image acquisition, enabling navigation and correlation of images from any source including light and X-ray microscopes. Users can acquire large sets of 2D or 3D microscope images for hours, or even days, without operator supervision. Correlative workspaceÂ brings... Read More
Combining Aduro semiconductor-based thermal sample supports with redesigned TEM holder, Aduro with Edge technology optimizes thermal accuracy and uniformity for in situ heating experiments while minimizing thermal drift. Edge technology maximizes performance of Transmission Electron Microscope by allowing scientists to visualize materials at nano and atomic scale while at accurate and uniform... Read More