Asylum Research
Santa Barbara, CA 93117
Nov 20, 2008 Achieving closed loop atomic resolution using sensors in all 3 axes, Cypher(TM) AFM includes integrated enclosure which provides acoustic and vibration isolation, as well as thermal control for image and measurement stability. Additional capabilities include interchangeable light source modules that allow laser spot sizes down to 3 µm for broad application and scan mode flexibility, as well as support for high-speed AC imaging with cantilevers smaller than 10 µm.

Aven, Inc.
Ann Arbor, MI 48108
Oct 13, 2008 Mighty Scope 6 LED microscope with USB interface plugs into PC and can be used for science and engineering work, dermatology, repair, assembly, and quality control. Magnification is adjustable from 10-200x, LEDs can be turned on and off, and brightness can be adjusted using control wheel, all on compact lens. Microtouch shutter trigger enables image capture, and 1 lb unit includes measurement tool and software for capture of images or video.

FEI Company
Hillsboro, OR 97124
Sep 10, 2008 Titan(TM) scanning transmission electron microscopes are available with extreme field emission gun (X-FEG), which combines brightness with stable current of thermally assisted field emission to optimize resolution, speed, and sensitivity. X-FEG can also be combined with technologies such as chromatic or spherical aberration correctors or low accelerating voltages. Operational simplicity, absence of tip cleaning requirements, and extended tip lifetimes (12 months) boost productivity.

FEI Company
Hillsboro, OR 97124
Jul 18, 2008 With optional environmental enclosure to isolate instrument from thermal and acoustic interferences, Magellan XHR SEM enables rapid 3D surface imaging at different angles and at resolutions below 1 nm. Magellan 400 is optimized for scientific research, while Magellan 400L is optimized for semiconductor labs. Magellan 400L has load-lock feature that speeds-up sample throughput, and includes retractable solid state backscatter electron detector and S2 compliance kit.

FEI Company
Hillsboro, OR 97124
Jul 01, 2008 Able to select electron beam voltages anywhere between 80-300 kV, Titan(TM) 80-300 environmental transmission electron microscope (ETEM) allows researchers to see chemistry and nanoscale catalysis at atomic level. Microscope delivers high-resolution imaging with gas pressures in sample chamber as high as few percent of atmospheric pressure, and gas controller permits precise control of composition as well as pressure. Heating and cooling holders provide control over range of temperatures.

Thermo Fisher Scientific
Waltham, MA 02454
Mar 10, 2008 Designed for broad range of applications, DXR Raman microscope helps non-specialist users achieve rapid sampling and analysis of particles, down to 1 micron spatial resolution. Interchangeable SMART® components require no operator adjustment and ensure automated system configuration, while auto alignment and auto calibration ensure reliable results. Microscope utilizes ValPro® complete system validation package, and comes with fiber probe option for remote sampling.

Keyence Corporation of America
Woodcliff Lake, NJ 07675
Feb 07, 2008 Featuring 54-megapixel 3CCD Mode camera, the KEYENCE VHX-600 Digital Microscope offers a selection of high-resolution RZ optical design zoom lenses with up to 5,000x magnification. Targets can be freely observed with camera/lens unit, handheld or mounted in multiangle viewing stand, and observation can be performed at all angles without manipulating target. Capable of real-time measurements via mouse operations, device includes 160 Gb HDD, CD-R/RW, UXGA 15 in. LCD, and built-in LAN.

Carl Zeiss Microimaging, Inc.
Thornwood, NY 10594-1939
Jan 16, 2008 CENTRA(TM) 100 TEM features max resolution down to 0.2 nm, making it suited for biomedical/clinical laboratory environments. Microscope offers choice between 2 imaging modes, high resolution and high contrast. Four lens elements in projection system enable rotation-free imaging while magnification is being changed. Additional deflection systems support image-fine-shift that allows generation of panorama images.

Applied Materials, Inc.
Santa Clara, CA 95054
Jan 14, 2008 SEMVision(TM) G4 includes SEM column technology and multi-perspective SEM imaging system that deliver 2 nm physical resolution images at one defect-per-second review rate. It rapidly analyzes and classifies defects as small as 30 nm in most sensitive device layers. Featuring EDXtreme, unit extends chemical characterization of defects to sub-50 nm particle sizes. SEM column can rotate and tilt up to 45° relative to wafer to provide 3D data for defect visualization and classification.

WITec Instruments Corp
Savoy, IL 61874
Jan 14, 2008 Intended for automated Confocal Raman Imaging and Atomic Force Microscopy (AFM) on large samples, Models alpha500 and alpha700 offer 3D chemical as well as high resolution structural imaging. Motorized sample stage, with travel range of 150 x 100 mm for alpha500 and 350 x 300 mm for alpha700, allows multi-area/multi-point measurements or overview scans on arbitrary, user-defined number of measurement points.

FEI Company
Hillsboro, OR 97124
Oct 23, 2007 Featuring fully enclosed profile, Titan³(TM) 80-300 combines 2 Cs-aberration correctors and monochromator on single instrument. Scientists can study how atoms combine to form materials, how materials grow, and how they respond to variety of external factors. Equipped with digital remote control interface, system operates from 80-300 kV, providing optimized imaging of wide variety of materials, from ultra-light carbon compounds to ultra-dense heavy metal samples.

Veeco Instruments Inc. Corporate Headquarters
Woodbury, NY 11797
Oct 02, 2007 Providing low-noise, closed-loop scanning, Innova SPM delivers better than 1 micron resolution. Optics are completely contained within protective instrument cover, allowing probe and sample to be viewed at any time while still isolating optical and electrical components from environment. Incorporating real-time signal diagnostics and processing options, SPMlab-v7.0 software offers direct and intuitive access to scan and feedback parameters.

FEI Company
Hillsboro, OR 97124
Aug 17, 2007 Nova NanoSEM(TM) 30 Series SEM enables surface characterization and analysis of samples such as nanoparticles, insulating substrates, porous materials, metals, and composites. It provides prototyping capabilities based on electron beam lithography, electron beam induced deposition, and in-situ experimentation for manipulation and testing. Models 230 and 430 feature 50 x 50 mm and 100 x 100 mm 5-axis motorized stages, while model 630 features 5-axis 150 x 150 mm piezo stage.

FEI Co.
Hillsboro, OR 97124-5830
Jul 06, 2007 Facilitating operation via interactive touchscreen, Phenom(TM) can be used in most locations and does not require specialized facilities. Solution yields magnification up to 20,000x in compact design to bring high-resolution imaging to industrial as well as academic applications. Example areas of use include quality assurance, product development, research, and teaching.

FEI Co.
Hillsboro, OR 97124-5830
Apr 12, 2007 Combination of Quanta(TM) scanning electron microscope (SEM) and JKTech's Mineral Liberation Analyzer (MLA) software allows evaluation of exploration targets for mining operations. Automated stage control and image acquisition of Quanta SEM enable analysis of at least 5,000 individual particles for concentrated samples and 50,000 or more particles for tailings or low-grade materials. MLA can analyze up to 16 different samples overnight without operator.

FEI Co.
Hillsboro, OR 97124-5830
Mar 05, 2007 Eliminating boundaries imposed by existing high vacuum systems, DualBeam(TM) Quanta(TM) 3D FEG features high-current ion column for rapid, site-specific cross-sections of samples to reveal sub-surface structures and features. System's electron source optimizes SEM imaging, while electron beam current enables high throughput spectroscopy.

FEI Company
Hillsboro, OR 97124
Dec 14, 2006 NanoLab(TM) 400/400S feature high resolution field emission scanning electron microscope column combined with Sidewinder(TM) focused ion beam column and gas chemistries. Suited for sub-65 nm node devices, DualBeams(TM) systems offer low-kV SEM resolution to support 3D cross-sectional imaging and analysis. NanoLab 400 comes with high resolution stage/load lock, while Model 400S is equipped with flip stage for precise sample localization to bridge SEM-TEM gap.

Luxo Corporation
Elmsford, NY 10523
Dec 07, 2006 Featuring heavy-duty aluminum housings, System 273 Binocular and System 373 Trinocular Microscopes come standard with 10x, 23 mm widefield eyepieces and eyeshields, and rotate 360° in their focus mounts. Both units have zoom range of 0.7-4.5, giving them magnification range of 7-45x. Zoom ratio of 7:1 is adjusted via dual graduated control knobs located on side of head. Microscopes can be used with single boom stands or dual boom ball-bearing stands.

FEI Co.
Hillsboro, OR 97124-5830
Sep 01, 2006 Helios NanoLab(TM) DualBeam(TM) features ultra-high resolution field emission scanning electron microscope (SEM) column combined with Sidewinder(TM) focused ion beam (FIB) column and gas chemistries to provide imaging resolution and contrast in DualBeam system. Small DualBeam platform enables 3D characterization, analysis, and image reconstruction applications, nano-prototyping (fabrication and testing) capabilities, and advanced sample preparation abilities.

Leica Microsystems, Inc.
Bannockburn, IL 60015
Oct 21, 2005 Fully manual Model DMI3000 B is tailored for micromanipulation, while Model DMI4000 B provides modular platform for adding automation based on experimental needs. Both include fluorescence turret equipped with up to 6 filter cubes that can be moved into position without vibration. Internal filter wheel supports changing excitation of fluorochromes in less than 20 ms, while Fluorescence Intensity Manager minimizes light stress for living cells.