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Nov 26, 2009  
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Optics & Photonics -> Optical Measuring Devices, Sensors & Tools -> Scopes -> Electronic Microscopes


Electronic Microscopes



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Digital Computer Microscope features ergonomic design.

Dazor Mfg. Corp.
St. Louis, MO 63146
Oct 28, 2009 Incorporating microscope, camera, computer monitor, and Windows XP OS into one piece of equipment, speckFINDER HD allows users to work with and store images in multiple digital formats and network as needed. With 3 USB outputs and 1 video output, users can also output files to flash drive or project live images to overhead screen. Flat panel display offers 160° horizontal and vertical viewing angle, allowing multiple users to view at once.

Digital Microscope features 16-bit imaging resolution.

Digital Microscope features 16-bit imaging resolution.

Keyence Corporation of America
Woodcliff Lake, NJ 07675
Sep 14, 2009 Along with brightness range covering 65,536 levels and 2.8 Trillion color capacity, VHX-600 Generation II Digital Microscope features High Dynamic Range (HDR) function that enables graphic engine to create images in 16-bit gradation through acquisition of RGB data from each pixel. System's 3CCD Handheld Camera includes pixel-shift actuator, achieving observation with resolution of up to 54 million pixels, and uses flicker-free progressive scan method.

Digital Video Microscope inspects fiber optic connectors.

Lightel Technologies, Inc.
Renton, WA 98057
Aug 31, 2009 Connecting directly to PC through USB port, Model D-1000 features 1-finger focusing, built-in image freeze/capture button, and software-based digital zoom. ConnectorView software provides image display, image capture, auto-calibration, and basic analysis tools. Microscope can also be used with ConnectorView Plus software, which will provide automatic pass/fail analysis and reporting.

Scanning Electron Microscope features variable pressure mode.

Scanning Electron Microscope features variable pressure mode.

Carl Zeiss Microimaging, Inc.
Thornwood, NY 10594-1939
Aug 21, 2009 Featuring GEMINI® column and variable pressure technology, SIGMA VP FE-SEM is compatible with Carl Zeiss BSD and VPSE G3 detectors, which provide imaging of non-conducting specimens. Chamber includes provision for all WDS variants as well as geometry suitable for co-planar EDS and EBSD analysis. System control is by means of SmartSEM® software package with intuitive interface and GEMINI column.

Electron Microscope combines high resolution and analysis.

Electron Microscope combines high resolution and analysis.

Carl Zeiss Microimaging, Inc.
Thornwood, NY 10594-1939
Aug 21, 2009 Based on GEMINI II column, MERLIN(TM) FE-SEM achieves image resolution of 0.8 nm. Sample current up to 300 nA is available for analytical purposes such as EDS and WDS, EBSD, or generation of cathodoluminescence. Complete Detection System consists of in-lens SE detector for surface imaging, in-lens EsB detector for material contrast, and AsB detector for dispersed backscattered electrons. For high-resolution imaging of non-conductive samples, unit includes charge compensation system.

Hand-Held Digital Scope magnifies from 10X to 200X.

Hand-Held Digital Scope magnifies from 10X to 200X.

Aven, Inc.
Ann Arbor, MI 48108
Aug 21, 2009 Equipped with USB interface, Digital Mighty Scope offers fully adjustable focus range and brightness control wheel, which allows fingertip adjustments of illumination from 6 white LEDs to suit interior or exterior environments. Images, interval shots, or video are captured instantly by 1.3-megapixel camera with color CMOS sensor and Microsoft-compatible software on digital models. Unit facilitates color inspection as well as quality assurance checks of large parts.

Microscope Systems offer optical analysis and image sharing.

Aven, Inc.
Ann Arbor, MI 48108
Aug 18, 2009 Combining 3-megapixel camera, touch-screen virtual keyboard, and 12 in. adjustable monitor, plug-and-go iVue and iScope provide image capture, measurement, annotation, and networking capability without external software or hardware. iScope enlarges from 10-44X and has screen magnification up to 166X. Images are captured directly to USB stick or internal hard drive. Brightness controls on LED lighting system provide illumination for each of 4 quadrants on iScope and 3 quadrants on iVue.

Direct Electron Detector handles beam-sensitive materials.

FEI Company
Hillsboro, OR 97124
Aug 04, 2009 Designed for Titan(TM) and Tecnai(TM) transmission electron microscopes, Falcon(TM) Direct Electron Detector enables acquisition of low-noise images of delicate biological samples and other beam-sensitive materials that require low electron dose interactions to prevent radiation damage of material. Offering 4 K x 4 K resolution, detector allows life scientists to see biologically significant detail that could not otherwise be seen.

Electron Microscope targets semiconductor manufacturing.

Electron Microscope targets semiconductor manufacturing.

FEI Co.
Hillsboro, OR 97124-5830
Jul 28, 2009 Suited for high-volume industrial and multi-user research laboratories, 200 kV Tecnai Osiris(TM) scanning/transmission electron microscope features ChemiSTEM technology, which minimizes time required for large field-of-view energy dispersive x-ray elemental mapping. Microscope also includes MultiLoader(TM) sample handling to minimize thermal equilibration time after sample exchanges, FS-1 electron energy loss spectrometer, SmartCam remote control camera, and liquid nitrogen supply.

Microscopy System analyzes full wafers up to 300 mm.

Microscopy System analyzes full wafers up to 300 mm.

FEI Company
Hillsboro, OR 97124
Jul 22, 2009 Helios 1200 Full Wafer DualBeam(TM) System accelerates time to data for failure analysis, process development, and process control in semiconductor and data storage manufacturing. System combines scanning electron microscope image resolution and fast switching between imaging and ion beam milling to deliver cross-sectional analysis of structures and defects. Included iFAST automation software optimizes quality and consistency of multiple, site-specific samples in single session.

Automated System measures micro- and nano-fibers.

Automated System measures micro- and nano-fibers.

FEI Company
Hillsboro, OR 97124
Apr 16, 2009 Powered by Phenom(TM) personal electron microscope, Fibermetric(TM) System discovers and quantifies properties of woven and nonwoven fiber samples in minutes. System automatically collects hundreds of measurements per image, and generates fiber and pore size distribution plots for quality control and for predicting application properties such as filtration efficiency. Magnifications up to 24,000 times produce information on fibers as small as 100 nm in diameter with 97% accuracy.

SEM can be used with wide range of samples.

SEM can be used with wide range of samples.

FEI Company
Hillsboro, OR 97124
Mar 26, 2009 With ability to scan variety of samples, including insulated, wet, and dirty samples, Quanta 50 Series scanning electron microscope can be utilized in materials research, mineralogy, chemicals and petroleum, electronics, pharmaceuticals, and biology industries. Beam deceleration optimizes surface imaging capability with low landing energies, while SmartSCAN(TM) technology minimizes noise. Quanta 50 Series is designed to enable viewing of any sample in its natural state.

Scanning Electron Microscope offers sub-nanometer resolution.

Scanning Electron Microscope offers sub-nanometer resolution.

FEI Company
Hillsboro, OR 97124
Jan 06, 2009 Using Magellen(TM) extreme high-resolution SEM, scientists and engineers can see 3D surface images at many different angles and at resolutions below 1 nm. Unit images samples at low beam energies, avoiding distortions otherwise caused by beam penetrating into material below.

AFM includes SpotOn(TM) automated laser alignment capability.

AFM includes SpotOn(TM) automated laser alignment capability.

Asylum Research
Santa Barbara, CA 93117
Nov 20, 2008 Achieving closed loop atomic resolution using sensors in all 3 axes, Cypher(TM) AFM includes integrated enclosure which provides acoustic and vibration isolation, as well as thermal control for image and measurement stability. Additional capabilities include interchangeable light source modules that allow laser spot sizes down to 3 µm for broad application and scan mode flexibility, as well as support for high-speed AC imaging with cantilevers smaller than 10 µm.

Handheld Digital Microscope offers 1.3 megapixel imaging.

Handheld Digital Microscope offers 1.3 megapixel imaging.

Aven, Inc.
Ann Arbor, MI 48108
Oct 13, 2008 Mighty Scope 6 LED microscope with USB interface plugs into PC and can be used for science and engineering work, dermatology, repair, assembly, and quality control. Magnification is adjustable from 10-200x, LEDs can be turned on and off, and brightness can be adjusted using control wheel, all on compact lens. Microtouch shutter trigger enables image capture, and 1 lb unit includes measurement tool and software for capture of images or video.

Electron Microscope is offered with electron source module.

FEI Company
Hillsboro, OR 97124
Sep 10, 2008 Titan(TM) scanning transmission electron microscopes are available with extreme field emission gun (X-FEG), which combines brightness with stable current of thermally assisted field emission to optimize resolution, speed, and sensitivity. X-FEG can also be combined with technologies such as chromatic or spherical aberration correctors or low accelerating voltages. Operational simplicity, absence of tip cleaning requirements, and extended tip lifetimes (12 months) boost productivity.

High Resolution SEM is suited for scientists and engineers.

High Resolution SEM is suited for scientists and engineers.

FEI Company
Hillsboro, OR 97124
Jul 18, 2008 With optional environmental enclosure to isolate instrument from thermal and acoustic interferences, Magellan XHR SEM enables rapid 3D surface imaging at different angles and at resolutions below 1 nm. Magellan 400 is optimized for scientific research, while Magellan 400L is optimized for semiconductor labs. Magellan 400L has load-lock feature that speeds-up sample throughput, and includes retractable solid state backscatter electron detector and S2 compliance kit.

Microscope enables chemical research at the atomic scale.

FEI Company
Hillsboro, OR 97124
Jul 01, 2008 Able to select electron beam voltages anywhere between 80-300 kV, Titan(TM) 80-300 environmental transmission electron microscope (ETEM) allows researchers to see chemistry and nanoscale catalysis at atomic level. Microscope delivers high-resolution imaging with gas pressures in sample chamber as high as few percent of atmospheric pressure, and gas controller permits precise control of composition as well as pressure. Heating and cooling holders provide control over range of temperatures.

Raman Microscope meets cGMP and FDA regulatory requirements.

Raman Microscope meets cGMP and FDA regulatory requirements.

Thermo Fisher Scientific
Waltham, MA 02454
Mar 10, 2008 Designed for broad range of applications, DXR Raman microscope helps non-specialist users achieve rapid sampling and analysis of particles, down to 1 micron spatial resolution. Interchangeable SMART® components require no operator adjustment and ensure automated system configuration, while auto alignment and auto calibration ensure reliable results. Microscope utilizes ValPro® complete system validation package, and comes with fiber probe option for remote sampling.

Digital Microscope features 3D imaging capability.

Digital Microscope features 3D imaging capability.

Keyence Corporation of America
Woodcliff Lake, NJ 07675
Feb 07, 2008 Featuring 54-megapixel 3CCD Mode camera, the KEYENCE VHX-600 Digital Microscope offers a selection of high-resolution RZ optical design zoom lenses with up to 5,000x magnification. Targets can be freely observed with camera/lens unit, handheld or mounted in multiangle viewing stand, and observation can be performed at all angles without manipulating target. Capable of real-time measurements via mouse operations, device includes 160 Gb HDD, CD-R/RW, UXGA 15 in. LCD, and built-in LAN.




(Showing headlines 1 - 20)   more ....



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