Electronic Microscopes

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Optics & Photonics

Aven Cyclops HDMI Digital Microscope

Jun 01, 2017

The innovative Cyclops HDMI Digital Microscope connects directly to any monitor through a convenient 1080p HDMI output allowing operators to see high quality images while looking straight ahead at a large screen. This system reduces eye strain and neck fatigue associated with frequent microscope use. Operators may connect their Cyclops to any HD monitor to study 1080p images (monitor not... Read More

Optics & Photonics

HDMI Digital Microscope comes with 2-megapixel sensor.

May 09, 2017

Designed to connect directly to any monitor through 1080p HDMI output, Cyclops HDMI Digital Microscope with heavy-duty aluminum stand provide high resolution and HD picture quality. Offering magnification range of up to 132x on 21.5 in. HD monitor, unit provides optical zoom, brightness, sharpness, freeze frame, video control, snapshot setting options. Product comes with LED illumination with... Read More

Optics & Photonics

Global Leader in Advanced Materials Improves Quality and Cuts Costs with a Digital Microscopy System from Keyence

Apr 21, 2017

- VHX-5000 digital microscope

Imagine sorting through individual grains of sand on a beach, or searching for the largest bits of powder in a bag of flour; without an easy way to do so, your days would be long indeed. But that tedious job is similar to what lab technician Ricky Sapp once faced each workday, manually inspecting metal welding powders and the sieves used to sort them. That... Read More

Optics & Photonics

Cyclops HDMI Digital Microscope provides adjustable illumination.

Feb 01, 2017

Reducing eye strain and neck fatigue due to frequent microscope use, Cyclops HDMI Digital Microscope provides high quality images on large screen. Digital Microscope offers magnification range up to 132x on 21.5 in. HD monitor. Featuring HDMI output, 2-megapixel sensor, unit offers crisp, high resolution, stunning and HD picture quality. Product comes with infrared remote control to set... Read More

Optics & Photonics

SharpVue Digital Microscope System provides shadow-free illumination

Nov 09, 2016

Capable of inspecting large and small objects with built in LED lighting, SharpVue Digital Microscope System features auto focus HD camera with optical magnification up to 30x and digital up to 300x. With working distance of 9 inches, unit offers remote access for function control like grid mode, brightness control and auto focus. System is suitable for inspecting circuit boards, analysis of... Read More

Optics & Photonics, Test & Measuring Instruments, Vision Systems

Digital 2D Microscope operates without PC.

Oct 07, 2016

Delivering video-image quality at 60 fps, Omni HD 2D Digital Microscope and Measurement System can remain in calibration over entire zoom range, making it suitable for quality control, testing, rework, assembly, and inspection tasks. Custom-designed mouse or GUI provides intuitive operation of entire system. To ensure sharp, high-contrast imaging, separate camera control station allows manual... Read More

Optics & Photonics, Test & Measuring Instruments

ZEISS Highlights Latest Microscopy Innovations and Advancements at International Manufacturing Technology Show

Aug 29, 2016

Visit Booth # E-5502 for demonstrations of the newest microscope instruments for manufacturing applications ZEISS announces they will be showcasing the latest microscopy innovations and advancements at the International Manufacturing Technology Show (IMTS), September 12-17, 2016, at McCormick Place, in Chicago, IL. ZEISS experts will be on hand at Booth # E-5502 to highlight and demonstrate ZEISS... Read More

Optics & Photonics

Ergonomic 120 kV S/TEM targets life and materials sciences.

Aug 25, 2016

Offering users access to scientific results regardless of experience, Talos™ L120C transmission/scanning transmission electron microscope (S/TEM) provides Hi-Res, 3D imaging and analysis capabilities. Automation and directed workflows foster facilitated adoption path and accelerate results without compromising performance. Along with ultra-stable optics, this 120 kV LaB6 S/TEM features MAPS™... Read More

Optics & Photonics, Sensors Monitors & Transducers

FEI and Cornell University Collaborate to Commercialize New EMPAD Detector

Jul 27, 2016

Speed, sensitivity and dynamic range will enable multichannel atomic-scale imaging and analysis of material properties such as electric and magnetic fields Hillsboro, Ore. and Ithaca, NY — FEI (NASDAQ: FEIC) and Cornell University have entered an agreement to commercialize a new high dynamic range detector for FEI’s electron microscopes. It promises to enable new kinds of multichannel imaging... Read More

Optics & Photonics

Automated S/TEM delivers high-performance imaging, analysis.

Jul 18, 2016

Themis™ Z scanning/transmission electron microscope (S/TEM) offers system stability and automated tuning routines that promote reproducible image resolution at high and low beam energies in both STEM and TEM modes. Energy dispersive x-ray systems let users configure system based on primary characterization needs, and iDPC detector, by using up to 90% of transmitted electrons, offers high... Read More

Chemicals & Chemical Processing, Optics & Photonics, Plant Furnishings & Accessories

Microscopy Systems support materials science applications.

Jun 29, 2016

Featuring advanced scanning electron microscope and focused ion beam technology, Helios™ G4 DualBeam Series offers automated sample preparation for transmission electron microscopy and 3D sample characterization. Phoenix FIB column offers low-voltage performance for ultra-low sample damage, while Elstar electron column with UC+ technology offers 4x more monochromated current than previous... Read More

Chemicals & Chemical Processing, Machinery & Machining Tools, Optics & Photonics, Test & Measuring Instruments

FEI Launches Three New Tools for Next-Generation Semiconductor Manufacturing

Jun 20, 2016

New solutions are designed to address the challenges of 7nm technology node metrology and defect/failure analysis.  Hillsboro, Ore. - FEI (NASDAQ: FEIC) announced today the release of three new tools for process control and defect/failure analysis in advanced semiconductor manufacturing. Two of the tools are specifically targeted at the 7nm node, and all are designed to allow manufacturers to... Read More

Optics & Photonics, Software

FIB/SEM Systems utilize 3D reconstruction software.

Jun 17, 2016

Designed to work with all DualBeam focused ion beam/scanning electron microscope platforms, Auto Slice & View v4.0 software enables 3D structure and composition of samples at nanometer scale. Imaging can be combined with analytical capabilities, such as energy dispersive x-ray spectrometry and electron backscatter diffraction, to ensure that no information is lost in sectioning of sample.... Read More

Optics & Photonics

Scanning Electron Microscope supports diverse applications.

May 05, 2016

With compound final lens, Apreo™Â offers resolution down to 1.0 nm at 1 kV, without need for beam deceleration, for optimal performance on sample even if it is tilted or topographic. Backscatter detection is offered at lowest beam currents, at any tilt angle, on sensitive samples, and at TV-rate imaging to maximize materials contrast, and detector segments can be individually addressed to... Read More

Optics & Photonics, Test & Measuring Instruments

Digital Microscope offers full-HD 360-degree rotating views.

Apr 28, 2016

Designed for quality control, testing, inspection, and documentation, rotating viewer accessory for EVO Cam Digital Microscope delivers oblique view of subject that can be rotated 360° around central point. User can seamlessly switch between 360° rotating view to conventional direct top view. Then, with touch of button, capture full-HD images. EVO Cam provides live video streaming, 1080p/60... Read More

Optics & Photonics

FEI and CEOS Deliver First Sub-Angstrom, Low-Voltage Electron (SALVE) Microscope to the University of Ulm

Apr 28, 2016

Developed in the frame of University Ulm's SALVE project, the microscope provides high-contrast, atomic-scale imaging of radiation-sensitive samples, such as graphene and organic materials. Hillsboro, Ore. and Heidelberg, Germany — FEI (NASDAQ: FEIC) and CEOS announced today that they have delivered the first sub-Ã…ngstrom, low-voltage electron (SALVE) microscope to the University of... Read More

Optics & Photonics, Test & Measuring Instruments, Vision Systems

Portable USB Microscope offers reflection-free surface imaging.

Mar 02, 2016

Connecting to PC via USB, MC-TLD6182 offers 20X–200X magnification to determine fine structure of surfaces. Digital camera, included, lets operator take 2.0 MP pictures, which can be interpolated to 5.0 MP pictures. Used in direct contact to surface or at larger distances, microscope also features 8 integrated, adjustable-strength, white LED lights and software for editing and... Read More

Chemicals & Chemical Processing, Optics & Photonics

TEM Sample Preparation System aids failure analysis labs.

Nov 05, 2015

Available in FX and HX models, Helios™ G4 DualBeam Series offers 7 nm TEM lamella preparation solution for semiconductor manufacturing and failure analysis applications. Flexible FX system delivers STEM resolution down to sub-three Ã…ngströms and enables images to be obtained within minutes of completing lamella. HX model, geared specifically for high-throughput TEM lamella production,... Read More

Optics & Photonics, Sensors Monitors & Transducers, Test & Measuring Instruments

Microscopy System analyzes multi-scale and multi-modal images.

Aug 11, 2015

Consisting of hardware and software package, ZEISS Atlas 5 extends capacity of SEMs and FIB-SEMs. System streamlines automatic image acquisition, enabling navigation and correlation of images from any source including light and X-ray microscopes. Users can acquire large sets of 2D or 3D microscope images for hours, or even days, without operator supervision. Correlative workspace brings... Read More

Optics & Photonics, Thermal & Heating Equipment

Edge Heating System optimizes TEM performance.

Aug 03, 2015

Combining Aduro semiconductor-based thermal sample supports with redesigned TEM holder, Aduro with Edge technology optimizes thermal accuracy and uniformity for in situ heating experiments while minimizing thermal drift. Edge technology maximizes performance of Transmission Electron Microscope by allowing scientists to visualize materials at nano and atomic scale while at accurate and uniform... Read More