Fischer Technology, Inc.
Windsor, CT 06095
Flexible Solution for Coating Thickness Measurement
The FMP Series is the most recent addition to the Fischer product line. The new instruments are the DUALSCOPEÃ-® FMP20, DELTASCOPEÃ-® FMP30, ISOSCOPEÃ-® FMP30, DUALSCOPEÃ-® FMP40, and DUALSCOPEÃ-® FMP100 coating thickness gauges. These easy to use and versatile instruments offer a large and bright graphic display with an extremely durable shock resistant casing. A large...
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Material Analyzers help meet RoHS and WEEE requirements.
XAN and XDAL instruments measure toxic metals in plastics to meet EU directives RoHS and WEEE, which state that electronic goods and waste may only contain lead, cadmium, mercury, chromium, and bromine up to legally permitted limit. XAN provides results within 30 sec, while XDAL system is suited for programmed measurements of several samples or scanning of larger specimens. Both instruments...
Read More »
Spectrometer analyzes elements and measures thickness.
Energy-dispersive X-ray fluorescence spectrometer FischerscopeÃ-® X-Ray XDAL performs quantitative element analysis and thickness measurements. System analyzes solid samples, powders, paste-like materials, and liquids for 24 elements. Utilizing semiconductor detector with Peltier cooling and WinFTMÃ-® v6 software, tube features adjustable high voltage of 10, 30, and 50 kV. Large...
Read More »
X-Ray Analyzer measures microstructures.
FischerscopeÃ-® X-Ray XDVMÃ-®-u uses X-ray fluorescence and micro-focus X-ray optics to measure and analyze microstructure coatings on structures as narrow as tens of microns. It can analyze thickness and composition of multiple coatings containing up to 24 individual elements, either in pure element or alloy coatings. Applications include testing and measuring miniaturized electronics,...
Read More »
Conductivity Meter offers 16 measurements/second.
SIGMASCOPE(R) SMP10 measures electrical conductivity of non-ferrous metals, which provides information about the material's composition, microstructure, and mechanical properties. It offers 4 measurement frequencies of 60, 120, 240, and 480 kHz without changing measurement probe. Menu-driven software stores 100 application memories for calibrations and 20,000 measurements. Measurement range is...
Read More »
Surface Hardness Evaluator offers automated measurement.
Computer-controlled FISCHERSCOPEÃ-® H100C measures microhardness and evaluates material properties. One-spot measurement provides information about surface hardness and hardness patterns within boundary layers. Three instrument models are available: H100C S contains measuring head, PC and WIN-HCUÃ-® 32Bit WindowsÃ-® program; H100C XYm is equipped with positioning device with manual XY...
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Coating Probe measures small parts.
Handheld EGA06H probe measures nonmagnetic coatings, including zinc, chrome, copper, tin, paint and enamel on ferromagnetic base material using magnetic induction method according to DIN 50981. Measuring range is 0 to 28 msec. Small field effect is suited for measuring small parts or areas, such as nuts, bolts, screws and other fasteners. Smallest surface probe can measure is 0.08 in. dia., 0.04...
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PCB Measuring Instruments use three test methods.
X-Ray XDLM-®, MMS-® SR, and CU-SCOPE(TM) provide non-destructive measurement of copper coating on PC boards using X-ray fluorescence, electrical resistance, and eddy current test methods. XDLM features micro-focal X-ray tube and high speed programmable XY measuring stage with travel distance of 10 in. and 5.8 in. respectively. MMS-® SR accepts wide array of measuring probes. CU-SCOPE hand-held...
Read More »New FISCHER Chicago Sales and Service Facility
Exciting things are happening at Fischer Technology. FISCHER is proud to announce the opening of our Chicago Sales and Service facility. Craig Kuchta, the new Fischer Representative and Technical Advisor for this office, has 20+ years of technical instrumentation sales & support of products by manufacturers such as Siemens, Honeywell and Wika. Please contact him for any measurement problems you...
Read More »Fischer Technology Opens Sales Office in Livonia, Michigan
WINDSOR, CT –Ã- Fischer Technology, Inc., manufacturer of coating thickness, material testing, nanoindentation and material analysis instrumentation, is expanding with a new office in Livonia, Michigan. This office will provide technical sales and service support for the Michigan area. Jeff Stoner has been appointed as the Field Sales Engineer for Michigan and brings a wealth of measurement...
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Flexible Solution for Coating Thickness Measurement
The FMP Series is the most recent addition to the Fischer product line. The new instruments are the DUALSCOPEÃ-® FMP20, DELTASCOPEÃ-® FMP30, ISOSCOPEÃ-® FMP30, DUALSCOPEÃ-® FMP40, and DUALSCOPEÃ-® FMP100 coating thickness gauges. These easy to use and versatile instruments offer a large and bright graphic display with an extremely durable shock resistant casing. A large...
Read More »
Material Analyzers help meet RoHS and WEEE requirements.
XAN and XDAL instruments measure toxic metals in plastics to meet EU directives RoHS and WEEE, which state that electronic goods and waste may only contain lead, cadmium, mercury, chromium, and bromine up to legally permitted limit. XAN provides results within 30 sec, while XDAL system is suited for programmed measurements of several samples or scanning of larger specimens. Both instruments...
Read More »
Spectrometer analyzes elements and measures thickness.
Energy-dispersive X-ray fluorescence spectrometer FischerscopeÃ-® X-Ray XDAL performs quantitative element analysis and thickness measurements. System analyzes solid samples, powders, paste-like materials, and liquids for 24 elements. Utilizing semiconductor detector with Peltier cooling and WinFTMÃ-® v6 software, tube features adjustable high voltage of 10, 30, and 50 kV. Large...
Read More »
X-Ray Analyzer measures microstructures.
FischerscopeÃ-® X-Ray XDVMÃ-®-u uses X-ray fluorescence and micro-focus X-ray optics to measure and analyze microstructure coatings on structures as narrow as tens of microns. It can analyze thickness and composition of multiple coatings containing up to 24 individual elements, either in pure element or alloy coatings. Applications include testing and measuring miniaturized electronics,...
Read More »
Conductivity Meter offers 16 measurements/second.
SIGMASCOPE(R) SMP10 measures electrical conductivity of non-ferrous metals, which provides information about the material's composition, microstructure, and mechanical properties. It offers 4 measurement frequencies of 60, 120, 240, and 480 kHz without changing measurement probe. Menu-driven software stores 100 application memories for calibrations and 20,000 measurements. Measurement range is...
Read More »
Surface Hardness Evaluator offers automated measurement.
Computer-controlled FISCHERSCOPEÃ-® H100C measures microhardness and evaluates material properties. One-spot measurement provides information about surface hardness and hardness patterns within boundary layers. Three instrument models are available: H100C S contains measuring head, PC and WIN-HCUÃ-® 32Bit WindowsÃ-® program; H100C XYm is equipped with positioning device with manual XY...
Read More »
Coating Probe measures small parts.
Handheld EGA06H probe measures nonmagnetic coatings, including zinc, chrome, copper, tin, paint and enamel on ferromagnetic base material using magnetic induction method according to DIN 50981. Measuring range is 0 to 28 msec. Small field effect is suited for measuring small parts or areas, such as nuts, bolts, screws and other fasteners. Smallest surface probe can measure is 0.08 in. dia., 0.04...
Read More »
PCB Measuring Instruments use three test methods.
X-Ray XDLM-®, MMS-® SR, and CU-SCOPE(TM) provide non-destructive measurement of copper coating on PC boards using X-ray fluorescence, electrical resistance, and eddy current test methods. XDLM features micro-focal X-ray tube and high speed programmable XY measuring stage with travel distance of 10 in. and 5.8 in. respectively. MMS-® SR accepts wide array of measuring probes. CU-SCOPE hand-held...
Read More »