Analyzer Probes are compatible with multiple finishes.

Analyzer Probes are compatible with multiple finishes.

Pro Series soft touch, logic analyzer probes enable direct connection from probe to targets on PCB without use of connector. They use micro spring-pin technology with 4-point crown tip that can pierce any contamination on board and provide redundant contact. Top-mount retention module accommodates varying PCB thicknesses. Probes are compatible with lead-free finishes such as organic-coated...

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Resistivity System determines presence of oil and gas.

Centerfire(TM) Resistivity System provides formation evaluation data while hole is being drilled. MWD probe mounted above resistivity collar facilitates retrieval and data transmission to surface. Tool combines multiple transmitter spacings and separate frequencies for accurate and stable readings, and is available in sizes with 4.75, 6.75, and 8.25 in. OD. System operates at temperatures to...

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CMM Probe offers high-speed pointcloud processing.

CMM Probe offers high-speed pointcloud processing.

Metris LC50/100(TM) digitizing, non-contact probe aids in 3D part scanning, inspection, and reverse engineering. Its PH-10M/PH-10Q interface enables non-contact scanning to 19,200 points/sec, while adjustable camera and laser intensity settings ensure quality of data acquisition from different surfaces/environments. Bundled with COSMOS CMM and CADCompare(TM) software, product handles large...

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Hand-held Probe inspects surface-mount devices.

SolView allows evaluation of PCB without removing it from line. SolView-90 is placed beside components, allowing inspection under surface mount devices to determine solder bond integrity. Portable eyepiece has entrance pupil height of 0.3 mm, wide field of view optical inspection system, and high intensity LED illumination. SolView-00 direct viewing instrument facilitates general component...

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Touch Trigger Probes offer indexable operation.

Touch Trigger Probes offer indexable operation.

Available in 2 versions, TESASTARÂ-® Touch Trigger Probes feature adjustable measuring force to prevent inadvertent triggering when long stylus is used. TESASTAR-IÂ-® Indexable Touch Trigger Probe is adjustable to 168 positions in 15Â-º increments. TESASTAR probes can be rotated through infinite number of positions for flexibility in measuring complex components. Clockwise rotation...

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Test Probes have screw-on alligator clips.

Test Probes have screw-on alligator clips.

Model 6723 Test Probes with screw-on alligator clips have 8-32-UNC 2A-threaded tips designed for secure attachment to test probes, providing stable measurements for consistent test results. Silicone-insulated leads are rated at IEC1010 1000 V CAT III for probe alone, and screw-on alligator clip Model 6723 is rated at 300 V CAT II with 10 A current max. Temperature range is 14 to 221Â-

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Dynamic Probe helps debug FPGAs.

Dynamic Probe helps debug FPGAs.

Model B4655A interacts with on-chip virtual probing technology, enabling logic analyzers to measure up to 64 internal FPGA signals for each debug pin. Engineers can select groups of internal signals to probe without requiring design recompiles. State and timing analysis modes allow designers to look at single circuits or correlate multiple circuits. Probe provides mapping of internal signal names...

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