LogicVision, Inc.
San Jose, CA 95110
At-Speed DFT Solution optimizes nanometer design efficiency.
ScanBurst(TM) combines Mentor's automatic test pattern generation (ATPG) and embedded compression products, FastScan(TM) and TestKompressÃ-®, to promote accuracy and effectiveness in detecting subtle delay defects prevalent in nanometer SoC designs. This integrated DFT (Design-for-Test) solution complements existing ATPG-based DFT techniques by providing environment to insert scan and clock...
Read More »Software addresses memory-related yield issues.
Leveraging detailed manufacturing test data, Yield Insight provides detailed sub-die level failure and performance monitoring capabilities to help accelerate yield ramps. It analyzes sub-die data captured across multiple die, wafers, and lots to identify systematic yield issues and to provide actionable information to design, fab, and test functions to help remedy issues. Graphical analysis and...
Read More »Sequoia Communications Adopts LogicVision's SiVision Yield Analysis Solution
Automation Enables Faster Time-to-Yield and Improved End-Product Quality SAN JOSE, Calif., Oct. 3 // -- LogicVision, Inc. (NASDAQ:LGVN), a leading provider of semiconductor test and yield learning solutions, today announced that Sequoia Communications, the RF semiconductor company setting new benchmarks in multi-mode design and integration, has adopted its SiVision Yield Analysis application. We...
Read More »Software automates semiconductor yield analysis.
SiVision v4.0 utilizes SmartPEÃ-® component-based analysis model and scripting capabilities that let users automate and standardize analysis processes. Users can create yield data analysis environments tailored to unique needs, allowing automatic identification of yield limiters in characterization and yield ramp phases. Software also facilitates identification and remediation of issues...
Read More »LogicVision to Present at the 4th Annual Winter Technology Conference Hosted by Security Research Associates
SAN JOSE, Calif., Feb. 5 -- LogicVision, Inc. (NASDAQ:LGVN), a leading provider of test and yield learning solutions, will present at the 4th Annual Winter Technology Conference hosted by Security Research Associates at the Omni Hotel in San Francisco. Mr. James T. Healy, LogicVision's president and CEO, and Mr. Bruce M. Jaffe, LogicVision's chief financial officer, are scheduled to present on...
Read More »LogicVision to Present at the 10th Annual Needham Growth Stock Conference
SAN JOSE, Calif., Jan. 3 / -- LogicVision, Inc. (NASDAQ:LGVN), a leading provider of test and yield learning capabilities for the semiconductor industry, will present at the 10th Annual Needham Growth Stock Conference in New York. Mr. James T. Healy, LogicVision's president and CEO, and Mr. Bruce M. Jaffe, LogicVision's chief financial officer, are scheduled to present on Friday, January 11,...
Read More »LogicVision Expands Presence in Japan with the Addition of Noah Corporation as Distributor in Japan
SAN JOSE, Calif., March 20: LogicVision, Inc. (NASDAQ:LGVN), a leading provider of test and yield learning capabilities, today announced the addition of Noah Corporation as distributor for LogicVision products in Japan. Noah Corporation is a provider of semiconductor analysis and test equipment to the Japanese semiconductor companies. Noah complements LogicVision's existing sales and field...
Read More »At-Speed DFT Solution optimizes nanometer design efficiency.
ScanBurst(TM) combines Mentor's automatic test pattern generation (ATPG) and embedded compression products, FastScan(TM) and TestKompressÃ-®, to promote accuracy and effectiveness in detecting subtle delay defects prevalent in nanometer SoC designs. This integrated DFT (Design-for-Test) solution complements existing ATPG-based DFT techniques by providing environment to insert scan and clock...
Read More »Software addresses memory-related yield issues.
Leveraging detailed manufacturing test data, Yield Insight provides detailed sub-die level failure and performance monitoring capabilities to help accelerate yield ramps. It analyzes sub-die data captured across multiple die, wafers, and lots to identify systematic yield issues and to provide actionable information to design, fab, and test functions to help remedy issues. Graphical analysis and...
Read More »Sequoia Communications Adopts LogicVision's SiVision Yield Analysis Solution
Automation Enables Faster Time-to-Yield and Improved End-Product Quality SAN JOSE, Calif., Oct. 3 // -- LogicVision, Inc. (NASDAQ:LGVN), a leading provider of semiconductor test and yield learning solutions, today announced that Sequoia Communications, the RF semiconductor company setting new benchmarks in multi-mode design and integration, has adopted its SiVision Yield Analysis application. We...
Read More »LogicVision, GDA Technologies Partner on High-Speed I/O Test IP
SAN FRANCISCO, July 26, 2006 -- Design Automation Conference (DAC) -- LogicVision, Inc. (NASDAQ: LGVN), a leading provider of test and yield learning capabilities, and GDA Technologies, Inc., a leading supplier of Intellectual Property (IP) and Electronic Design Services (EDS), today announced an alliance to deliver design services for high-speed I/O test with LogicVision's comprehensive at-speed...
Read More »Software automates semiconductor yield analysis.
SiVision v4.0 utilizes SmartPEÃ-® component-based analysis model and scripting capabilities that let users automate and standardize analysis processes. Users can create yield data analysis environments tailored to unique needs, allowing automatic identification of yield limiters in characterization and yield ramp phases. Software also facilitates identification and remediation of issues...
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