LogicVision to Present at the 4th Annual Winter Technology Conference Hosted by Security Research Associates
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SAN JOSE, Calif., Feb. 5 -- LogicVision, Inc. (NASDAQ:LGVN), a leading provider of test and yield learning solutions, will present at the 4th Annual Winter Technology Conference hosted by Security Research Associates at the Omni Hotel in San Francisco. Mr. James T. Healy, LogicVision's president and CEO, and Mr. Bruce M. Jaffe, LogicVision's chief financial officer, are scheduled to present on Monday, February 11, 2008. A webcast of the presentation will be available:
Date: Monday, February 11, 2008
Time: 3:30 P.M. Eastern Time / 12:30 P.M. Pacific Time for the live presentation
Location: On the web at http://investor.shareholder.com/lgvn/events.cfm
Replay: Available one hour after the presentation ends and accessible for 90 days.
About LogicVision Inc.
LogicVision (NASDAQ:LGVN) provides proprietary technologies for embedded test and yield learning that enable more efficient manufacturing test of complex semiconductors. LogicVision's embedded test solutions allow integrated circuit designers to embed test functionality into a semiconductor design that is used during semiconductor production test and throughout the useful life of the chip. The company's advanced Design for Test (DFT) product line, ETCreate, works together with Silicon Insight applications and Yield Insight to improve profit margins by reducing device field returns and test costs, accelerating silicon bring-up times and shortening both time to market and time to yield. For more information on the company and its products, please visit the LogicVision website at www.logicvision.com.
Source: LogicVision, Inc.
CONTACT:
Bruce Jaffe
VP of Finance and CFO of LogicVision, Inc.
+1-408-453-0146
Web site: www.logicvision.com/
http://investor.shareholder.com/lgvn/events.cfm
