Data and Database Management Software
Software automates semiconductor yield analysis.
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Press Release Summary:
SiVision v4.0 utilizes SmartPE® component-based analysis model and scripting capabilities that let users automate and standardize analysis processes. Users can create yield data analysis environments tailored to unique needs, allowing automatic identification of yield limiters in characterization and yield ramp phases. Software also facilitates identification and remediation of issues during volume production while automating reporting processes.
Original Press Release:
LogicVision Announces Next-Generation Yield Analysis Automation Solution
SiVision 4.0 Uniquely Addresses Growing Need for Reducing Time-to-Yield and Improving End Product Quality for Semiconductor Devices
SAN JOSE, Calif., Feb. 6 / -- LogicVision, Inc. (NASDAQ:LGVN), a leading provider of yield learning capabilities that enable semiconductor companies to quickly and efficiently improve product yields, today announced the product release of SiVision 4.0, its revolutionary next-generation yield analysis automation solution. SiVision 4.0 incorporates new capabilities and an improved usage model that allow customers to realize an increased ROI for nanometer-scale semiconductor designs. SiVision 4.0 enables users to create yield data analysis environments tailored to their unique needs, allowing them to automatically identify yield limiters in the characterization and yield ramp phases, and rapidly identify and remedy any issues during volume production.
With the shift to nanometer-scale designs and the increasing analog content in systems-on-chips (SOCs), semiconductor manufacturers are faced with increasing variability in the manufacturing process and growing process-design interactions, resulting in an increasing number of yield, performance and quality issues. These issues result in longer yield ramp-up times, unexpected yield excursions during production, and quality issues in the end product, which result in greater field returns. By automating repetitive yield analysis and reporting processes, SiVision can dramatically improve the productivity of product and test engineering resources and enable semiconductor vendors to get their products to market on schedule without comprising quality.
SIVISION 4.0 Unique Capabilities
SiVision 4.0 is the latest version of LogicVision's parametric yield analysis technology obtained through the acquisition of SiVerion, Inc. in late 2004. Central to SiVision 4.0 is the new SmartPE(R) component-based analysis model and scripting capabilities that allow users to automate and standardize their analysis processes. SmartPE comes with a set of pre-defined data handling, statistical analysis, visualization and reporting components that can be used with SiVision's scripting capabilities. Users can employ SiVision scripts to:
o Automate their existing yield analysis procedures and to make these processes predictable, repeatable and standard across multiple designs, teams and locations.
o Create data-mining rules that sift through the various permutations and combinations of test and foundry data to automatically identify potential issues. An organization's analysis best practices can be built into SmartPE rules and automatically executed on the yield data. A base set of pre-defined SmartPE rules are included with SiVision 4.0.
"SiVision helps customers improve their yields and lower their field returns, ultimately enhancing their silicon ROI," said Jim Healy, president and CEO of LogicVision. "It takes the yield data analysis function to a whole new level of automation, unmatched by any other competing technology."
SiVision 4.0 is available immediately, as a hosted solution or as an enterprise license that can be deployed on a customer's server.
About LogicVision, Inc.
LogicVision, Inc. provides unique yield learning capabilities in the design for manufacturing space. These capabilities enable its customers, leading semiconductor companies, to more quickly and efficiently learn to improve product yields. The company's advanced Design for Test (DFT) product line, ETCreate, works together with ETAccess and SiVision yield learning applications to enable increased profit by reducing device field returns, reducing test costs, and accelerating both time to market and time to yield. LogicVision solutions are used in the development of semiconductor ICs for products ranging from digital consumer goods to wireless communications devices and satellite systems. LogicVision was founded in 1992 and is headquartered in San Jose, Calif.
For more information visit http://www.logicvision.com/.
CONTACT: Kirsten McMullen of LogicVision, Inc., +1-408-453-0146, kirsten@logicvision.com
