Software addresses memory-related yield issues.
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Press Release Summary:
Leveraging detailed manufacturing test data, Yield Insight provides detailed sub-die level failure and performance monitoring capabilities to help accelerate yield ramps. It analyzes sub-die data captured across multiple die, wafers, and lots to identify systematic yield issues and to provide actionable information to design, fab, and test functions to help remedy issues. Graphical analysis and scripting capabilities allow users to automate and standardize yield analysis processes.
Original Press Release:
LogicVision Expands Yield Learning Product Line with Yield Insight(TM)
Yield Insight Unites LogicVision's Industry Leading Embedded Test and Automated Yield Analysis Technologies to Offer Unique Yield Improvement Capabilities
SAN JOSE, Calif., Oct. 23 // -- LogicVision, Inc. (NASDAQ:LGVN), a leading provider of test and yield learning capabilities for the semiconductor industry today announced Yield Insight, a new yield learning product. Yield Insight is a systematic yield learning solution that leverages detailed manufacturing test data, available from LogicVision's industry- leading embedded test products, to provide detailed sub-die level failure and performance monitoring capabilities to help accelerate yield ramps and improve overall yields.
The shift to nanometer-scale designs in systems-on-chips (SoCs) has challenged semiconductor vendors with increasing variability in the manufacturing processes and growing design-process interactions that lead to an increasing number of yield, performance and quality issues. These issues result in longer yield ramp-up times, unexpected yield excursions during production, and reliability issues in the end product. Yield analysis techniques must be extended to look at sub-die level information to study how design components are interacting with the manufacturing process to affect product yields.
Yield Insight has been specifically created to comprehend the large volumes of available semiconductor manufacturing and test data, especially sub-die level failure and performance information. Yield Insight analyzes this sub-die data, captured across multiple die, wafers and lots, to identify systematic yield issues and to provide actionable information to the design, fab and test functions to help remedy these issues.
"Yield Insight combines LogicVision's embedded test and post-silicon diagnostics capabilities with automated yield analysis to address a critical issue for the SoC design community," said Jim Healy, president and CEO of LogicVision. "It will enable customers to better understand the issues that lead to slower yield ramps and sub-optimal yields and help remove these yield limiters."
Yield Insight Capabilities
The number of embedded memories in SoCs is growing and consuming ever larger percentages of silicon die area. The first release of Yield Insight will specifically address memory-related yield issues by allowing LogicVision customers to leverage their investment in Memory BIST intellectual property (IP). Users will be able to analyze yield issues down to individual memories, rows, columns and bits and correlate failures to different environmental conditions. Yield Insight will also enable users to analyze and optimize memory redundancy schemes by analyzing redundancy-element utilization, resulting in higher yields and better yield-redundancy tradeoffs. Future releases of Yield Insight will use manufacturing test data from Logic BIST and ATPG to isolate and correlate failure data down to the logic gate and net levels.
Yield Insight provides powerful graphical analysis and scripting capabilities that allow users to automate and standardize their yield analysis processes. Users can create data-mining rules that sift through the test and yield data to automatically identify potential issues. Yield Insight offers a structured and highly effective yield learning platform that can be used during the entire semiconductor manufacturing and test cycle, starting from silicon bring-up and characterization, and extending into the yield ramp and volume manufacturing stages.
Availability of Yield Insight is planned for Q1 2007.
About LogicVision, Inc.
LogicVision, Inc. (NASDAQ:LGVN), provides unique test and yield learning capabilities in the design for manufacturing space. These capabilities enable its customers, leading semiconductor companies, to more quickly and efficiently learn to improve product yields. The company's advanced Design for Test (DFT) product line, ETCreate, works together with ETAccess and Yield Insight yield learning applications to improve profit margins by reducing device field returns, reducing test costs, and accelerating both time to market and time to yield. LogicVision solutions are used in the development of semiconductor ICs for products ranging from digital consumer goods to wireless communications devices and satellite systems. LogicVision was founded in 1992 and is headquartered in San Jose, Calif. For more information visit http://www.logicvision.com/.
CONTACT:
Kirsten McMullen
LogicVision, Inc.
+1-408-453-0146
kirsten@logicvision.com
Web site: http://www.logicvision.com/
