Aprima Medical Software, Inc
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Laundry Cart Features Rugged, Lockable Cover to Protect Linens
MODRoto 72S with Rotomolded Lid, Door Guards Against Theft, Weather Madison, IN, USA: The Poly-Trux(R) 72S bulk laundry cart from laundry product manufacturer MODRoto, Madison, IN (MODRoto.com) features a rugged, lockable lid and door (optional) to protect linens from theft and from exposure to inclement weather while keeping them secure and in place during storage and transportation....
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Laundry Cart Features Rugged, Lockable Cover to Protect Linens
MODRoto 72S with Rotomolded Lid, Door Guards Against Theft, Weather Madison, IN, USA: The Poly-Trux(R) 72S bulk laundry cart from laundry product manufacturer MODRoto, Madison, IN (MODRoto.com) features a rugged, lockable lid and door (optional) to protect linens from theft and from exposure to inclement weather while keeping them secure and in place during storage and transportation....
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SHELL FLEET NAVIGATORTM CARD TO PROVIDE CONTROL, SAVINGS AND CONVENIENCE FOR FLEET OF 3,000 DRIVERS CALGARY, Nov. 14, 2016 - Shell Canada, a major player in the fuel and fleet space, today announced a multi-year agreement to provide Shell Fleet NavigatorTM Card services to Purolator, a leading integrated freight and parcel solutions provider in Canada. Further expanding the footprint of Shell...
Read More »Shell Canada Signs Fleet Card Agreement with Purolator Inc
SHELL FLEET NAVIGATORTM CARD TO PROVIDE CONTROL, SAVINGS AND CONVENIENCE FOR FLEET OF 3,000 DRIVERS CALGARY, Nov. 14, 2016 - Shell Canada, a major player in the fuel and fleet space, today announced a multi-year agreement to provide Shell Fleet NavigatorTM Card services to Purolator, a leading integrated freight and parcel solutions provider in Canada. Further expanding the footprint of Shell...
Read More »Synopsys Advances Test and Yield Analysis Solution for 7-nm Process Node
Increases Test Quality by Targeting Subtle Defects in FinFETs and Emerging Processes Highlights: Innovative slack-based cell-aware test for 7-nm designs increases defect coverage FinFET SRAM defect modeling and test algorithms enable efficient test and repair of 7-nm memories New diagnostics and yield analysis support for 7-nm reduce turnaround time Synopsys, Inc. (Nasdaq: SNPS) today announced...
Read More »Synopsys Advances Test and Yield Analysis Solution for 7-nm Process Node
Increases Test Quality by Targeting Subtle Defects in FinFETs and Emerging Processes Highlights: Innovative slack-based cell-aware test for 7-nm designs increases defect coverage FinFET SRAM defect modeling and test algorithms enable efficient test and repair of 7-nm memories New diagnostics and yield analysis support for 7-nm reduce turnaround time Synopsys, Inc. (Nasdaq: SNPS) today announced...
Read More »Synopsys Test Solution Deployed by Leading Automotive IC Suppliers for Higher Quality, Reliability and Functional Safety
New Capabilities Accelerate Time to Automotive Test Goals and ISO 26262 Certification Highlights: Leading automotive semiconductor suppliers successfully deploy Synopsys' synthesis-based test solution to meet their stringent test goals for higher levels of quality, reliability and functional safety New capabilities include physically-aware test points, pattern reduction, high-performance fault...
Read More »Synopsys Test Solution Deployed by Leading Automotive IC Suppliers for Higher Quality, Reliability and Functional Safety
New Capabilities Accelerate Time to Automotive Test Goals and ISO 26262 Certification Highlights: Leading automotive semiconductor suppliers successfully deploy Synopsys' synthesis-based test solution to meet their stringent test goals for higher levels of quality, reliability and functional safety New capabilities include physically-aware test points, pattern reduction, high-performance fault...
Read More »Cadence Modus Test Solution Enables Support for Safety-Critical SoC Designs Using ARM MBIST Interface
Highlights: - Collaboration helps customers reduce the need for manual work and speed time to market - Cadence and ARM complete silicon validation using ARM Cortex-A73 processor SAN JOSE, Calif., Nov. 14, 2016 - Cadence Design Systems, Inc. (NASDAQ: CDNS) today announced that the Cadence® Modus™ Test Solution now supports the ARM® Memory Built-In Self Test (MBIST) interface, enabling...
Read More »Cadence Modus Test Solution Enables Support for Safety-Critical SoC Designs Using ARM MBIST Interface
Highlights: - Collaboration helps customers reduce the need for manual work and speed time to market - Cadence and ARM complete silicon validation using ARM Cortex-A73 processor SAN JOSE, Calif., Nov. 14, 2016 - Cadence Design Systems, Inc. (NASDAQ: CDNS) today announced that the Cadence® Modus™ Test Solution now supports the ARM® Memory Built-In Self Test (MBIST) interface, enabling...
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