Flaw Sensors / Detectors

Rudolph's NSX Macro Defect Inspection System Selected by Merit Sensor Systems
Flaw Sensors / Detectors

Rudolph's NSX Macro Defect Inspection System Selected by Merit Sensor Systems

The automated inspection system will assure quality of pressure sensors used in critical applications. Flanders, New Jersey -- Rudolph Technologies, Inc. (NASDAQ: RTEC), a leading provider of process characterization equipment and software for the semiconductor and related industries,announced today that it has sold an NSX®Series macro defect inspection system to Merit Sensor Systems, Inc.,...

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Defect Detection System locates flaws in leather.
Flaw Sensors / Detectors

Defect Detection System locates flaws in leather.

Suited for use with conveyor and static cutting systems as well as manual cutting machines, LeatherPRO™ offers digital defect marking and allows up to 2 operators to simultaneously mark imperfections on hide. System can handle up to 6 defect types and 6 pattern quality zone types. Defects are marked with projected virtual lines using light pen, eliminating chalk and tape residue. Maximum yields...

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Flaw Detector provides numerous TOFD capabilities.
Flaw Sensors / Detectors

Flaw Detector provides numerous TOFD capabilities.

OmniScan MX2 supports 2-channel conventional ultrasound module (UT2), whichÂ- can be used for TOFD (Time-of-Flight Diffraction) inspections, and onboard software featuring TOFD-specific capabilities/features. In addition to pulser voltages (340 V), PRF capabilities, and SNR, features include TOFD wizard, PCS calibration tool, multiple TOFD screen layouts, Lateral Wave...

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Olympus NDT Introduces New Phased Array and Ultrasound Modules, NDT SetupBuilder, and OmniPC Software to Expand the Capabilities of the OmniScan MX2 Flaw Detector
Flaw Sensors / Detectors

Olympus NDT Introduces New Phased Array and Ultrasound Modules, NDT SetupBuilder, and OmniPC Software to Expand the Capabilities of the OmniScan MX2 Flaw Detector

Olympus NDT, the leader in industrial ultrasound phased array instrumentation, is pleased to introduce the latest hardware and software advances for the innovative OmniScan MX2 flaw detector. Olympus now offers the PA2 second generation Phased Array module with a UT channel, and the UT2 two-channel conventional ultrasound module that can be used for TOFD (Time-of-Flight Diffraction), as well as...

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Choosing the Right Material for Your Project
Sponsored

Choosing the Right Material for Your Project

When choosing an appropriate metal material, the range of options is so broad that selecting the correct material for your unique application can be challenging. Different metals have characteristics that can affect weldability, ductility, and formability. Our new eBook outlines the unique properties and applications of popular metals including: Stainless Steel Brass Aluminum Copper Titanium

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Flaw Detector utilizes phased array and ultrasound modules.
Flaw Sensors / Detectors

Flaw Detector utilizes phased array and ultrasound modules.

For expanded capabilities, OmniScan MX2 Flaw Detector is available withÂ- PA2 Phased Array module with UT channel, and UT2 two-channel conventional ultrasound module that can be used for Time-of-Flight Diffraction. NDT SetupBuilder software can create inspection setups based on configuration of component or part to be inspected, while OmniPC software revision provides comprehensive data...

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Reticle Inspection Systems cover nodes to 20 nm and beyond.
Flaw Sensors / Detectors

Reticle Inspection Systems cover nodes to 20 nm and beyond.

IC fab-based inspection systems X5.2(TM) and Teron(TM) 611 comprise Total ReQual(TM) solution for monitoring defectivity and pattern degradation resulting from cleaning or exposure. While sensitivity of Teron 611 is optimized for 20 nm node and beyond, X5.2 works on full mask sets at 28 nm and larger design nodes as well as 20 nm node. Both systems offer fifth-generation STARlight®...

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Flaw Sensors / Detectors

Qcept Technologies Receives Order for ChemetriQ 5000 Non-Visual Defect Inspection System for 2X-nm and 1X-nm Process Development and Integration

ATLANTA - Qcept Technologies Inc. today announced that it has received an order for its ChemetriQ® 5000 non-visual defect (NVD) inspection system from a leading semiconductor technology innovator headquartered in North America. The ChemetriQ® 5000 system will be used to support the company's unit process development and process integration activities for advanced nodes, including...

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Double Metal Sheet Detector detects ferrous metal thickness.
Flaw Sensors / Detectors

Double Metal Sheet Detector detects ferrous metal thickness.

Integrated into robotic End-of-Arm Tooling and used for blank feeding press, Model DSD-36 permits double metal detection with minimal magnetic attraction of sheet or blank up to single thickness of 0.25 in. Presence of double sheet produces output to stop machine or to signal operator, eliminating die/machine damage from receiving too many sheets. Comprising control module in sheet metal housing...

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Flaw Sensors / Detectors

Large Assembly and Test Facility Selects Rudolph NSX Series to Meet Advanced Packaging Demand

Wafer-level packaging drives inspection market growth - as demonstrated by this large order for 14 NSX Inspection Systems Flanders, New Jersey - Rudolph Technologies, Inc. (NASDAQ: RTEC), the leader in the high-growth market for back-end macro defect inspection, announced today that a large OSAT (outsourced semiconductor assembly and test) company has placed orders for 14 NSX® Series 320...

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Flaw Sensors / Detectors

Corrosion Sensors detect corrosion under insulation.

Offered in 3 types, CUI Corrosion Monitoring Sensors may be customized to meet requirements. Continuous Insulated Braid Wire Sensor, using insulated carbon steel wire as corrosion fuse, detects corrosion over large area. Inserted Probe Array Sensor acts as corrosion fuse detector that provides indication of corrosion occurring at pipe surface. Consisting of individual electrical resistance probe,...

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