Flaw Sensors / Detectors

Viscom Brings S3088 AOI with Quality Uplink to SMTAI
Flaw Sensors / Detectors

Viscom Brings S3088 AOI with Quality Uplink to SMTAI

Duluth, GA – Viscom today announced that it will exhibit the S3088 AOI system in Booth #427 at the upcoming SMTA International Exhibition, scheduled to take place October 15-16, 2013 at the Fort Worth Convention Center in Texas. The system will be displayed with the unique Quality Uplink feature that provides better defect detection during post-reflow AOI, ensuring the lowest false alarm rates....

Read More »
Defect Inspection System handles wafers up to 300 mm.
Flaw Sensors / Detectors

Defect Inspection System handles wafers up to 300 mm.

Designed for semiconductor, MEMS, and LED facilities, NSX® 220 Automated Macro Defect Inspection System uses gray-scale image analysis with color image capture for inspection and metrology in final manufacturing applications. It can detect scratches, mechanical damage, foreign materials, voids, and probe damage, while also performing 2D measurements on bumps, probe marks, and edge trim...

Read More »
Flaw Sensors / Detectors

TMR Magnetic Sensors are intended for banknote validation.

Tunneling Magnetoresistance (TMR) magnetic pattern recognition sensors MMGB01, MMGB06, and MMGB18 achieve sensitivity and SNR necessary for weak magnetic signal detection on banknotes. While MMGB01Â- offers single-channel detection capability, 6-channel MMGB06 and 18-channel MMGB18 can read multiple signals in parallel. Sensors are suited for use in financial anti-counterfeit...

Read More »
Flaw Detector uses corrosion inspection software.
Flaw Sensors / Detectors

Flaw Detector uses corrosion inspection software.

Available with portable EPOCH 600 Ultrasonic Flaw Detector, Corrosion Module includes automatic ultrasonic setups based on transducer selection, Automatic Gain Control, thickness gage measurement algorithm, V-Path correction, and transducer wear compensation using automatic zero function. Module also features corrosion-style data logger file types, color-coded Grid View, and timed B-scan view for...

Read More »
Inspection System offers application-specific configurations.
Flaw Sensors / Detectors

Inspection System offers application-specific configurations.

With Metrology suite, NSX® 320 Automated Macro Defect Inspection System offers wafer level packaging configuration, whichÂ- measures film thickness, thin remaining silicon thickness, surface topography, copper pillar height, and solder bump height. Advanced wafer level packaging configuration (2.5D) adds measurement of wafer profile, total stack thickness, and thick/thin RST, while...

Read More »
Flaw Sensors / Detectors

KLA-Tencor Announces New Additions to Its Defect Inspection and Review Portfolio

Coupling electron-beam review with optical inspection facilitates rapid defect discovery, identification and sourcing MILPITAS, Calif. -- Today KLA-Tencor Corporation (NASDAQ: KLAC) announced the new 2910 Series optical wafer defect inspection platform with NanoPoint™ technology and the new eDR™-7100 electron-beam wafer defect review system. Meeting IC manufacturers' need for accelerated...

Read More »
Flaw Sensors / Detectors

Flaw Detector Software offers simplified interface.

With single operation mode, every item of Omniscan v4.1 interface is alwaysÂ- accessible. Title bar provides instant access to main display options, and most common functions are available through interactive menus of full-screen mode, offering tablet-like operation. For applications requiring multi-probe configuration, multi-group layouts are optimized so that scanner configuration is...

Read More »
Flaw Detector offers portability and affordability.
Flaw Sensors / Detectors

Flaw Detector offers portability and affordability.

Equipped with 8.4 in.Â- touchscreen for displaying software interface, OmniScan® SX flaw detectors provide solution for linear zero-degree inspections, such as corrosion mapping and composite inspection, as well as weld inspection using one phased array group or one TOFD channel. Model SX PA is 16:64PR phased array unit, which is equipped with UT channel for pulse-echo,...

Read More »
Weld Check System detects defects in minutes.
Flaw Sensors / Detectors

Weld Check System detects defects in minutes.

Consisting of 3-step system, Weld Check™ starts with Weld Check™ Weld Cleaner andÂ- Penetrant Remover, which removes dirt and contaminants from surface to be analyzed. User then applies Weld Check™ red liquid penetrant for non-destructive testing of surfaces and structures. After Weld Check™ Developer is left on surface for 5–15 min, defects will appear red in color. Process can...

Read More »
Flaw Sensors / Detectors

Defect Inspection System monitors defects at optical speed.

Available for 2900 Series of defect inspection systems, NanoPoint™ focuses resources of optical inspection system on critical patterns, as identified by circuit designers or by known defect sites. During chip development, NanoPoint can reveal need for mask re-design within hours, potentially accelerating identification and resolution of design issues from months to days. During volume...

Read More »

All Topics