Flaw Sensors / Detectors

Flaw Detector uses corrosion inspection software.
Flaw Sensors / Detectors

Flaw Detector uses corrosion inspection software.

Available with portable EPOCH 600 Ultrasonic Flaw Detector, Corrosion Module includes automatic ultrasonic setups based on transducer selection, Automatic Gain Control, thickness gage measurement algorithm, V-Path correction, and transducer wear compensation using automatic zero function. Module also features corrosion-style data logger file types, color-coded Grid View, and timed B-scan view for...

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Inspection System offers application-specific configurations.
Flaw Sensors / Detectors

Inspection System offers application-specific configurations.

With Metrology suite, NSX® 320 Automated Macro Defect Inspection System offers wafer level packaging configuration, whichÂ- measures film thickness, thin remaining silicon thickness, surface topography, copper pillar height, and solder bump height. Advanced wafer level packaging configuration (2.5D) adds measurement of wafer profile, total stack thickness, and thick/thin RST, while...

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Flaw Sensors / Detectors

KLA-Tencor Announces New Additions to Its Defect Inspection and Review Portfolio

Coupling electron-beam review with optical inspection facilitates rapid defect discovery, identification and sourcing MILPITAS, Calif. -- Today KLA-Tencor Corporation (NASDAQ: KLAC) announced the new 2910 Series optical wafer defect inspection platform with NanoPoint™ technology and the new eDR™-7100 electron-beam wafer defect review system. Meeting IC manufacturers' need for accelerated...

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Flaw Sensors / Detectors

Flaw Detector Software offers simplified interface.

With single operation mode, every item of Omniscan v4.1 interface is alwaysÂ- accessible. Title bar provides instant access to main display options, and most common functions are available through interactive menus of full-screen mode, offering tablet-like operation. For applications requiring multi-probe configuration, multi-group layouts are optimized so that scanner configuration is...

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The Next Wave of Intelligent Design Automation
Sponsored

The Next Wave of Intelligent Design Automation

In the amount of time it takes to set up a meeting to discuss just one design, engineers can now explore designs exponentially. Generative design has catalyzed a paradigm shift in product development. This shift not only drastically decreases the time it takes to design a product. It also opens the door to design options that might never have been imagined by engineers on their own.

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Flaw Detector offers portability and affordability.
Flaw Sensors / Detectors

Flaw Detector offers portability and affordability.

Equipped with 8.4 in.Â- touchscreen for displaying software interface, OmniScan® SX flaw detectors provide solution for linear zero-degree inspections, such as corrosion mapping and composite inspection, as well as weld inspection using one phased array group or one TOFD channel. Model SX PA is 16:64PR phased array unit, which is equipped with UT channel for pulse-echo,...

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Weld Check System detects defects in minutes.
Flaw Sensors / Detectors

Weld Check System detects defects in minutes.

Consisting of 3-step system, Weld Check™ starts with Weld Check™ Weld Cleaner andÂ- Penetrant Remover, which removes dirt and contaminants from surface to be analyzed. User then applies Weld Check™ red liquid penetrant for non-destructive testing of surfaces and structures. After Weld Check™ Developer is left on surface for 5–15 min, defects will appear red in color. Process can...

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Flaw Sensors / Detectors

Defect Inspection System monitors defects at optical speed.

Available for 2900 Series of defect inspection systems, NanoPoint™ focuses resources of optical inspection system on critical patterns, as identified by circuit designers or by known defect sites. During chip development, NanoPoint can reveal need for mask re-design within hours, potentially accelerating identification and resolution of design issues from months to days. During volume...

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Rudolph's NSX Macro Defect Inspection System Selected by Merit Sensor Systems
Flaw Sensors / Detectors

Rudolph's NSX Macro Defect Inspection System Selected by Merit Sensor Systems

The automated inspection system will assure quality of pressure sensors used in critical applications. Flanders, New Jersey -- Rudolph Technologies, Inc. (NASDAQ: RTEC), a leading provider of process characterization equipment and software for the semiconductor and related industries,announced today that it has sold an NSX®Series macro defect inspection system to Merit Sensor Systems, Inc.,...

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Defect Detection System locates flaws in leather.
Flaw Sensors / Detectors

Defect Detection System locates flaws in leather.

Suited for use with conveyor and static cutting systems as well as manual cutting machines, LeatherPRO™ offers digital defect marking and allows up to 2 operators to simultaneously mark imperfections on hide. System can handle up to 6 defect types and 6 pattern quality zone types. Defects are marked with projected virtual lines using light pen, eliminating chalk and tape residue. Maximum yields...

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Flaw Detector provides numerous TOFD capabilities.
Flaw Sensors / Detectors

Flaw Detector provides numerous TOFD capabilities.

OmniScan MX2 supports 2-channel conventional ultrasound module (UT2), whichÂ- can be used for TOFD (Time-of-Flight Diffraction) inspections, and onboard software featuring TOFD-specific capabilities/features. In addition to pulser voltages (340 V), PRF capabilities, and SNR, features include TOFD wizard, PCS calibration tool, multiple TOFD screen layouts, Lateral Wave...

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