Keithley Instruments, Inc.
Cleveland, OH 44139
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Test System expands semiconductor characterization.
Model 4200-SCS, with integral Keithley Test Environment-Interactive v5.0 software, runs stress-measure and reliability tests for device lifetime analysis and quality assurance. Running in WindowsÃ-® NT or XP environments, KTEI v5.0 brings point-and-click simplicity to current-voltage measurements of devices such as transistors, resistors, and dielectrics, on up to 8 independent channels. It...
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Wafer Test System utilizes parallel test software.
Series S680DC/RF Parametric Test System allows control of 300 mm wafer processes in 200 mm test times. SimulTest(TM) parallel test software option allows measurement of up to 9 devices simultaneously with single probe touchdown. Single-wire 300 mm SECS/GEM automation complies with SEMI and GJG factory standards. Adapt Test Software option allows system to change test plans automatically in...
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Parametric Testers provide 40 GHz RF measurements.
Series S630DC/RF Test Systems deliver accurate characterization of ultra-thin gate dielectrics down to 0.5 nm in semiconductor devices. They incorporate vector network analyzer and DC/RF probe card technology. When used with suitable test structure layout, systems can execute independent DC and RF tests in parallel on separate probes. Inherent DC resolution is 100 aA and 100 nV. Testers also...
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Power Supply allows users to preload voltage setpoints.
Model 2306-VS dual channel fast transient power supply with external triggering allows externally triggered output voltage level changes to reduce execution time compared to traditional GPIB/SCPI command and control. External triggering allows for synchronized and deterministic control of output voltages and measurements. Automated voltage stepping lets users preprogram set of voltage outputs and...
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Test System is customizable and configurable.
System 25 provides light-current-voltage characterization of laser diodes and assembled laser diode modules. It delivers up to 5 A laser drive current, precision voltage measurements, 2 channels of photodetection, selectable photodiode detector types, optional laser diode mount, and up to 2 temperature controllers for laser cooling. Users can select only essential system components needed for...
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Modular Test System suits high channel count test applications.
Model 4500-MTS features expandable test platform built on open PCI backplane architecture with 9 card slots. When fully populated with Quad I-V Cards, system can simultaneously characterize light-current-voltage performance of 36 laser diodes in multi-head test fixture. Unit can be configured to execute up to 8 separate hardware-synchronized test sequences, each running independently, on 8...
Read More »Power Analyzer tests CDMA-based products.
Model 2800 RF Power Analyzer is designed for production test of wireless phones, RFIC power amplifiers, and related RF devices designed to AMPS, cdmaOne, North American digital cellular (TDMA), GSM, GPRS, EDGE, PDC, CDMA2000 1X, and WCDMA standards. Production-oriented instrument accommodates emerging technical requirements for test and measurement.
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Picoammeter combines 500 V source with femtoamp resolution.
Model 6487 Picoammeter/Voltage Source can apply voltage stimulus as high as 500 V to device under test and measure currents as low as 20 fA. It also provides direct readout of resistance measurements up to 5x1016 ohms and offers 5Ã-½ digit resolution and voltage burden of less than 200 Ã-µV on lower measurement ranges. Voltage source ranges are Ã-
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Differential Multiplexers switch up to 20 channels.
Solid-state 7710 multiplexer modules offer automatic cold junction compensation capability for temperature measurement with thermocouples. They accommodate differential signals up to 60 V and 0.1 A and have insertion loss of less than 3 dB up to 2 MHz. Model 7700 differential multiplexers include latching electromechanical relays, which enable signal bandwidths up to 50 MHz. They handle signals...
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DMM/Data Acquisition System is Ethernet-based.
Model 2701, with 22-bit, 6 1/2-digit A/D resolution, utilizes 10/100BaseTX fast Ethernet and TCP/IP protocol. Measurement capabilities include AC and DC voltage and current, digital I/O signals, temperature, frequency, period, resistance, and event counting/totalization. Multiple channels can be scanned at up to 500 channels/sec. Built-in control logic can actuate indicators and relays, and...
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