Credence Systems Corp.
Milpitas, CA 95035
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Credence Sapphire Test Platform Wins Semiconductor International 2007 Editors' Choice Best Product Award
Industry-leading ATE Solution Sets New Standard for Performance, Investment Flexibility MILPITAS, Calif., July 10 - Credence Systems (NASDAQ:CMOS), provider of industry-leading test solutions to semiconductor manufacturers worldwide, has garnered Semiconductor International magazine's prestigious 2007 Editors' Choice Award. The publication's editors are conferring awards for excellence upon 21...
Read More »Signal Tester features RF analysis capabilities.
Sapphire(TM) D-40 test system is offered with Modulated Vector Network Analysis (MVNA(TM)) RF measurement option, which adds wireless test capabilities for mobile phone, WLAN, WiMaX, and Zigbee devices. Available in 16- and 32-port RF versions, MVNA RF option has 4-8 parallel receivers to address demands of multi-site applications through 6 GHz. Architecture uses distributed signal processing and...
Read More »Signal Analyzer is designed for advanced consumer devices.
Combining analog, digital, mixed-signal, and RF test instrumentation, Sapphire(TM) D-40 is designed to move test data from devices under test, through instruments, and into test processors. Scalable data infrastructure allows users to grow data path bandwidth and power availability in segments as test needs grow. Utilizing high-density technology, device leverages cPCI standards and offers data...
Read More »Instruments provide 6.4 Gbps semiconductor testing.
Functioning in multiple time domains, Model D-6436 has 128 Mb of full depth acquisition memory and offers 36 differential channels, 4 of which can be configured as source synchronous clocks. SERDES-per-pin architecture supports existing and emerging bus protocols. Model D-6408 offers fully differential I/O, and with sequencer-per-pin timing flexibility, edge placement accuracy across all pins is...
Read More »Credence Sapphire Test Platform Wins Semiconductor International 2007 Editors' Choice Best Product Award
Industry-leading ATE Solution Sets New Standard for Performance, Investment Flexibility MILPITAS, Calif., July 10 - Credence Systems (NASDAQ:CMOS), provider of industry-leading test solutions to semiconductor manufacturers worldwide, has garnered Semiconductor International magazine's prestigious 2007 Editors' Choice Award. The publication's editors are conferring awards for excellence upon 21...
Read More »Signal Tester features RF analysis capabilities.
Sapphire(TM) D-40 test system is offered with Modulated Vector Network Analysis (MVNA(TM)) RF measurement option, which adds wireless test capabilities for mobile phone, WLAN, WiMaX, and Zigbee devices. Available in 16- and 32-port RF versions, MVNA RF option has 4-8 parallel receivers to address demands of multi-site applications through 6 GHz. Architecture uses distributed signal processing and...
Read More »Signal Analyzer is designed for advanced consumer devices.
Combining analog, digital, mixed-signal, and RF test instrumentation, Sapphire(TM) D-40 is designed to move test data from devices under test, through instruments, and into test processors. Scalable data infrastructure allows users to grow data path bandwidth and power availability in segments as test needs grow. Utilizing high-density technology, device leverages cPCI standards and offers data...
Read More »Instruments provide 6.4 Gbps semiconductor testing.
Functioning in multiple time domains, Model D-6436 has 128 Mb of full depth acquisition memory and offers 36 differential channels, 4 of which can be configured as source synchronous clocks. SERDES-per-pin architecture supports existing and emerging bus protocols. Model D-6408 offers fully differential I/O, and with sequencer-per-pin timing flexibility, edge placement accuracy across all pins is...
Read More »