Signal Tester features RF analysis capabilities.

Press Release Summary:

Sapphire(TM) D-40 test system is offered with Modulated Vector Network Analysis (MVNA(TM)) RF measurement option, which adds wireless test capabilities for mobile phone, WLAN, WiMaX, and Zigbee devices. Available in 16- and 32-port RF versions, MVNA RF option has 4-8 parallel receivers to address demands of multi-site applications through 6 GHz. Architecture uses distributed signal processing and encapsulated measurement algorithms to aid test program development.

Original Press Release:

Credence Delivers Advanced RF Test Capabilities with the MVNA RF Option for its New Sapphire D-40

MILPITAS, -- Credence Systems Corporation (NASDAQ:CMOS), a leading provider of test solutions from design to production for the worldwide semiconductor industry, today announced its Modulated Vector Network Analysis (MVNA(TM)) RF measurement option for the new Sapphire(TM) D-40 test system. The MVNA RF option further expands the capabilities of the Sapphire D series by adding wireless test capabilities for mobile phone, WLAN, WiMaX, and Zigbee devices.

The dramatic growth of mobile communication, mobile computing, and wireless personal area networks (WPAN) continues to bring stringent cost pressures to device manufacturers. The increasing complexity of the advanced single chip and system-in-package (SiP) designs used in today's wireless applications demands test systems to be massively parallel, flexible and expandable to meet industry test-cost and time-to-market requirements. The Sapphire D-40 system with the MVNA RF option meets these emerging test challenges, delivering four times the parallelism of competing test systems on the market today.

"The MVNA RF option for the Sapphire D-40 test system leverages Credence's leading-edge MVNA technology, while significantly expanding the number of test sites to address the demands of multi-site applications through 6 GHz," said Dave Ranhoff, president and chief executive officer of Credence Systems Corporation. "The Sapphire D-40 offers both 16 and 32 port RF options, allowing our customers to move beyond the traditional dual and quad site test configurations common in today's wireless device testing."

The MVNA RF option from Credence builds upon its widespread adoption first introduced in the ASL 3000RF. The MVNA RF architecture is a proprietary integration of technologies, including distributed signal processing, encapsulated measurement algorithms, and high performance front end electronics to deliver the utmost RF measurement accuracy with the extremely short test times. The MVNA RF option provides highly efficient test program development with advanced signal processing algorithms that include modulation waveforms and EVM measurements for a wide range of wireless communication standards such as W-CDMA, WiMax, 802.11n, and others.

Available in both 16 and 32 port versions, the MVNA RF option offers frequency coverage through 6 GHz. With 4 to 8 parallel receivers, the MVNA RF option allows efficient multi-site testing, taking advantage of its DSP engine per receiver architecture to deliver parallelism with truly parallel processing. Its innovative RF source multiplexer technology enables full flexibility for ease of multi-site application development utilizing up to 4 RF sources.

The MVNA RF option for the Sapphire D-40 is shipping and available today.

About Sapphire D-40

The latest addition to its industry-leading Sapphire platform, the Sapphire D-40 combines analog, digital, mixed-signal and RF test instrumentation. Offering from 10 to 40 slots, the Sapphire D-40 can support pin counts to well over 3000 pins for the most demanding multi-site applications. Leveraging the proprietary Credence integration technologies first introduced in the award-winning Sapphire D-10, its expandable data path architecture and high density instruments combine to offer tremendous throughput with the utmost economics.

About Credence

Credence Systems Corporation is a leading provider of debug, characterization and ATE solutions for the global semiconductor industry. With a commitment to applying innovative technology to lower the cost-of-test, Credence delivers competitive cost and performance advantages to integrated device manufacturers (IDMs), wafer foundries, outsource assembly and test (OSAT) suppliers and fabless chip companies worldwide. A global, ISO 9001- certified company with a presence in 20 countries, Credence is headquartered in Milpitas, California. More information is available at

Credence is a registered trademark, and Credence Systems, Sapphire and MVNA are trademarks of Credence Systems Corporation. Other trademarks that may be mentioned in this release are the intellectual property of their respective owners.

Media Relations Contact:
Judy Dale
Vice President, Marketing Communications and Investor Relations
Credence Systems Corporation
Phone: 408-635-4309
FAX: 408-635-4986

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