FEI Co.
Hillsboro, OR 97124
FEI Achieves Milestone for Automated Mineralogy Products
Techniques have experienced wide-spread acceptance for their ability to deliver critical information to optimize exploration and production in mining and oil & gas industries Hillsboro, Ore.- – FEI (NASDAQ: FEIC) today announced that it has reached a milestone of more than 200 automated mineralogy systems installed worldwide. FEI's Mineral Liberation Analysis (MLA) and QEMSCAN® automated...
Read More »FEI Achieves Milestone for Automated Mineralogy Products
Techniques have experienced wide-spread acceptance for their ability to deliver critical information to optimize exploration and production in mining and oil & gas industries Hillsboro, Ore.Ã- – FEI (NASDAQ: FEIC) today announced that it has reached a milestone of more than 200 automated mineralogy systems installed worldwide. FEI's Mineral Liberation Analysis (MLA) and QEMSCANî...
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Particulate Analyzer monitors automotive part cleanliness.
Combining scanning electron microscope and X-ray spectrometer, ASPEX CleanCHK™ Analyzer monitors automotive part cleanliness by providing particulate data within minutes. Advanced software routines automatically detect and count particles and analyze particle size, shape, and composition. Designed for use on production floor, analyzer offers automated sample set-up, calibration, and analysis;...
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Particulate Analyzer monitors automotive part cleanliness.
Combining scanning electron microscope and X-ray spectrometer, ASPEX CleanCHK™ Analyzer monitors automotive part cleanliness by providing particulate data within minutes. Advanced software routines automatically detect and count particles and analyze particle size, shape, and composition. Designed for use on production floor, analyzer offers automated sample set-up, calibration, and analysis;...
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Transmission Electron Microscope aids structural biology research.
Part of integrated workflow, Tecnai Arctica™ incorporates automation, pioneered on FEI’s flagship Titan Krios™ TEM, to elucidate 3D structure of biological macromolecules and molecular complexes. Cryo-sample autoloader, combined automated target identification, and low dose imaging enable unattended acquisition of large SPA data sets. UI and automation of routine operations and set up...
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Transmission Electron Microscope aids structural biology research.
Part of integrated workflow, Tecnai Arctica™ incorporates automation, pioneered on FEI’s flagship Titan Krios™ TEM, to elucidate 3D structure of biological macromolecules and molecular complexes. Cryo-sample autoloader, combined automated target identification, and low dose imaging enable unattended acquisition of large SPA data sets. UI and automation of routine operations and set up...
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FEI QEMSCAN WellSite Expands to Onsite Core Analysis with System Delivery to Kirk Petrophysics
Advanced onsite core analysis provides fast support for critical decisions in formation evaluation and drilling operations. Hillsboro, Ore., USA and Surrey, U.K. - FEI (NASDAQ: FEIC) and Kirk Petrophysics (Surrey, U.K.) today announced that FEI has delivered a QEMSCAN-® WellSite(TM) analysis system to Kirk Petrophysics who will use it to provide rapid onsite analysis of drill cores in oil and...
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FEI QEMSCAN WellSite Expands to Onsite Core Analysis with System Delivery to Kirk Petrophysics
Advanced onsite core analysis provides fast support for critical decisions in formation evaluation and drilling operations. Hillsboro, Ore., USA and Surrey, U.K. - FEI (NASDAQ: FEIC) and Kirk Petrophysics (Surrey, U.K.) today announced that FEI has delivered a QEMSCANÃ-® WellSite(TM) analysis system to Kirk Petrophysics who will use it to provide rapid onsite analysis of drill cores in oil...
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Dual Beam System provides semiconductor failure analysis.
Combining- scanning electron microscope for imaging and focused ion beam for milling and deposition, Helios NanoLab™ 450 F1 DualBeam™ System provides semiconductor manufacturers with optimal images of device architectures. STEM detector delivers material contrast, while FlipStage™ 3 flips sample between thinning and STEM viewing positions, and rotation axis permits viewing from either...
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Dual Beam System provides semiconductor failure analysis.
CombiningÃ- scanning electron microscope for imaging and focused ion beam for milling and deposition, Helios NanoLab™ 450 F1 DualBeam™ System provides semiconductor manufacturers with optimal images of device architectures. STEM detector delivers material contrast, while FlipStage™ 3 flips sample between thinning and STEM viewing positions, and rotation axis permits viewing from either...
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