FEI Co.

SEM can be used with wide range of samples.
Optics & Photonics

SEM can be used with wide range of samples.

With ability to scan variety of samples, including insulated, wet, and dirty samples, Quanta 50 Series scanning electron microscope can be utilized in materials research, mineralogy, chemicals and petroleum, electronics, pharmaceuticals, and biology industries. Beam deceleration optimizes surface imaging capability with low landing energies, while SmartSCAN(TM) technology minimizes noise. Quanta...

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Optics & Photonics

FEI Adds Dual-Axis Automation to Leading Electron Tomography Solution for Life Science Research

Xplore3D now offers automated dual-axis acquisition and reconstruction - extending the capability and accuracy of electron tomography for 3D biological ultrastructure Hillsboro, Ore./November 3, 2008 - FEI Company (Nasdaq: FEIC), a leading provider of high-resolution imaging and analysis solutions, today released its Xplore3D software package, updated to include data acquisition and...

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Software

Software Package automates strain analysis.

Suited for use in semiconductor manufacturing, TrueCrystal Strain Analysis can be installed on Titan(TM) or Tecnai(TM) scanning/transmission electron microscope (S/TEM) system for determining strain along any line in crystalline sample at nanometer level. Package leverages combination of nano-beam diffraction (NBD) in TEM and off-line data analysis package to generate data required for advanced...

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Automated Analyzer optimizes mineral processing operations.
Laboratory and Research Supplies and Equipment

Automated Analyzer optimizes mineral processing operations.

Using scanning electron microscope equipped with field emission gun (FEG) and multiple high-speed energy dispersive X-ray spectrometers (EDS), model MLA 600F mineralogy analyzer acquires image and composition information from large number of samples. Software uses data to acquire and measure characteristics such as mineral type and distribution, liberation and association-essential properties of...

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Optics & Photonics

Electron Microscope is offered with electron source module.

Titan(TM) scanning transmission electron microscopes are available with extreme field emission gun (X-FEG), which combines brightness with stable current of thermally assisted field emission to optimize resolution, speed, and sensitivity. X-FEG can also be combined with technologies such as chromatic or spherical aberration correctors or low accelerating voltages. Operational simplicity, absence...

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Laboratory and Research Supplies and Equipment

FEI Connectivity Solutions Improve and Accelerate TEM Imaging for Semiconductor Manufacturing

Higher-quality results in hours (not days) speed process development and enhance yields Hillsboro, Ore./July 15, - FEI Company (Nasdaq: FEIC), a leading provider of atomic-scale imaging and analysis systems, today announced the Ultimate Throughput(TM) and Ultimate Imaging(TM) Connectivity Solutions. By accelerating and improving the quality of preparation, imaging and analysis of the ultra-thin...

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High Resolution SEM is suited for scientists and engineers.
Optics & Photonics

High Resolution SEM is suited for scientists and engineers.

With optional environmental enclosure to isolate instrument from thermal and acoustic interferences, Magellan XHR SEM enables rapid 3D surface imaging at different angles and at resolutions below 1 nm. Magellan 400 is optimized for scientific research, while Magellan 400L is optimized for semiconductor labs. Magellan 400L has load-lock feature that speeds-up sample throughput, and includes...

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Optics & Photonics

Microscope enables chemical research at the atomic scale.

Able to select electron beam voltages anywhere between 80-300 kV, Titan(TM) 80-300 environmental transmission electron microscope (ETEM) allows researchers to see chemistry and nanoscale catalysis at atomic level. Microscope delivers high-resolution imaging with gas pressures in sample chamber as high as few percent of atmospheric pressure, and gas controller permits precise control of...

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Laboratory and Research Supplies and Equipment

FEI Annouces Joint Research Program with the FOM Foundation

Project Will Focus on Developing Tools for Single-Atom Imaging and Processing of Material Structures HILLSBORO, Ore./December 18, 2007 -- FEI Company (Nasdaq: FEIC) and the Netherlands-based FOM foundation have announced a joint nanotechnology research project. The goal of the Industrial Partnership Program (IPP) is to advance electron microscopes and focused ion beam systems (FIBs) so that the...

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