FEI Co.
Hillsboro, OR 97124
In-Situ Electron Microscopy Tools foster real-time observation.
NanoEx™ holders enable materials scientists and engineers to observe, in real-time, changes at micro, nano, and atomic scale in morphology and dynamic properties- of materials under mechanical, electrical, and thermal stimuli as well as environmental conditions mimicking actual use cases. Specific products include NanoEx i/v- heating solution, which- uses MEMS-based nanoheaters; NanoEx 3D...
Read More »TEM Sample Preparation System aids failure analysis labs.
Available in FX and HX models, Helios™ G4 DualBeam Series offers 7 nm TEM lamella preparation solution for semiconductor manufacturing and failure analysis applications. Flexible FX system delivers STEM resolution down to sub-three à ngströms and enables images to be obtained within minutes of completing lamella. HX model, geared specifically for high-throughput TEM lamella production,...
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Plasma Focused Ion Beam cuts analysis from days to hours.
Built on DualBeam™ Plasma FIB platform with integrated SEM and nanoprobing capabilities, Helios PFIB EFI delivers site-specific sample preparation with in-situ SEM end-pointing and low-beam energy SEM-based transistor characterization. It includes electron-beam absorbed current- for interconnect-level electrical fault isolation and electron-beam induced current analysis for diffusion...
Read More »FEI Partners with the George Washington University to Equip New Science and Engineering Hall
Suite of new high-performance microscopes will be used for cutting-edge experiments at GW’s new research facility. WASHINGTON –- FEI (NASDAQ: FEIC) and the George Washington University (GW) are pleased to announce that they are partnering to install several new high-performance microscopes at GW’s Science and Engineering Hall. The new, $275 million, 500,000-square-foot research facility...
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Okinawa Institute of Science and Technology Graduate University Completes Installation of New Talos Arctica Cryo-TEM from FEI
Highly-automated system is designed to encourage cross over use by researchers with expertise in adjacent technologies, such as X-ray crystallography, seeking better understanding of critical biological structures down to the molecular level. Hillsboro, Ore.- – FEI (NASDAQ: FEIC) has completed the installation of a new Talos Arctica™ cryo-transmission electron microscope (TEM) at the Okinawa...
Read More »FEI Joins University of Ulm and CEOS on SALVE Project Research Collaboration
The Sub-à ngström Low Voltage Electron (SALVE) microscope should improve contrast and reduce damage on bio-molecules and two-dimensional nanomaterials, such as graphene. Hillsboro, Ore.- – FEI (NASDAQ: FEIC) announced today that it has entered into an agreement with Germany's University of Ulm and Heidelberg-based CEOS GmbH to develop a sub-angström low-voltage electron microscope, in...
Read More »Advanced Imaging System targets oil and gas industry.
Part of multi-scale imaging solution, HeliScan™ microCT System provides accurate 3D imaging for analysis of reservoir rocks in hydrocarbon assets, allowing geoscientists and engineers to gain insight into reservoir heterogeneity and petrophysical properties. System delivers distortion-free imaging by combining proprietary methods, such as dynamic auto focus and drift correction, which...
Read More »FEI and Oregon Health and Science University Install a Complete Correlative Microscopy Workflow in Newly Built Collaborative Science Facility
Installation is part of an expansion of the OHSU/FEI Living Lab for Cell Biology collaboration; a complete correlative microscopy solution will enable new approaches for cancer and related disease research Portland, Ore. –- FEI (NASDAQ: FEIC) and Oregon Health and Science University (OHSU) today announced an expansion of their Living Lab for Cell Biology agreement that includes the...
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Characterization System aids materials science research.
Capable of seeing structure and composition and adding/removing material at nanometer scale, Helios NanoLab™ G3 DualBeam™ allows scientists to explore fundamental relationships between structure and function. CX configuration offers versatile sample handling and positioning for flexible analysis, sample preparation, and characterization, while UC configuration delivers increased sensitivity...
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Scanning Electron Microscope delivers 3D volume imaging.
Integrating SEM with VolumeScope™ in-chamber microtome and analytical software, Teneo VS™ provides fully automated, large-volume reconstructions with optimized Z-axis resolution. VolumeScope uses serial block face imaging to acquire 3D volume from block of tissue or cells. ThruSight multi-energy deconvolution resolves features at different depths within each slice, while MAPS software uses...
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