FEI Co.
Hillsboro, OR 97124
FEI Launches Three New Tools for Next-Generation Semiconductor Manufacturing
New solutions are designed to address the challenges of 7nm technology node metrology and defect/failure analysis.- Hillsboro, Ore. - FEI (NASDAQ: FEIC) announced today the release of three new tools for process control and defect/failure analysis in advanced semiconductor manufacturing. Two of the tools are specifically targeted at the 7nm node, and all are designed to allow manufacturers to...
Read More »FEI Launches Three New Tools for Next-Generation Semiconductor Manufacturing
New solutions are designed to address the challenges of 7nm technology node metrology and defect/failure analysis.Ã- Hillsboro, Ore. - FEI (NASDAQ: FEIC) announced today the release of three new tools for process control and defect/failure analysis in advanced semiconductor manufacturing. Two of the tools are specifically targeted at the 7nm node, and all are designed to allow manufacturers...
Read More »FIB/SEM Systems utilize 3D reconstruction software.
Designed to work with all DualBeam focused ion beam/scanning electron microscope platforms, Auto Slice & View v4.0 software enables 3D structure and composition of samples at nanometer scale. Imaging can be combined with analytical capabilities, such as energy dispersive x-ray spectrometry and electron backscatter diffraction, to ensure that no information is lost in sectioning of sample....
Read More »FIB/SEM Systems utilize 3D reconstruction software.
Designed to work with all DualBeam focused ion beam/scanning electron microscope platforms, Auto Slice & View v4.0 software enables 3D structure and composition of samples at nanometer scale. Imaging can be combined with analytical capabilities, such as energy dispersive x-ray spectrometry and electron backscatter diffraction, to ensure that no information is lost in sectioning of sample....
Read More »
Scanning Electron Microscope supports diverse applications.
With compound final lens, Apreo™- offers resolution down to 1.0 nm at 1 kV, without need for beam deceleration, for optimal performance on sample even if it is tilted or topographic. Backscatter detection is offered at lowest beam currents, at any tilt angle, on sensitive samples, and at TV-rate imaging to maximize materials contrast, and detector segments can be individually addressed to...
Read More »
Scanning Electron Microscope supports diverse applications.
With compound final lens, Apreo™Ã- offers resolution down to 1.0 nm at 1 kV, without need for beam deceleration, for optimal performance on sampleàeven if it is tilted or topographic. Backscatter detection is offered at lowest beam currents, at any tilt angle, on sensitive samples, and at TV-rate imaging to maximize materials contrast, and detector segments can be individually...
Read More »
FEI and CEOS Deliver First Sub-Angstrom, Low-Voltage Electron (SALVE) Microscope to the University of Ulm
Developed in the frame of University Ulm's SALVE project, the microscope provides high-contrast, atomic-scale imaging of radiation-sensitive samples, such as graphene and organic materials. Hillsboro, Ore. and Heidelberg, Germany — FEI (NASDAQ: FEIC) and CEOS announced today that they have delivered the first sub-Ångstrom, low-voltage electron (SALVE) microscope to the University of Ulm. The...
Read More »
FEI and CEOS Deliver First Sub-Angstrom, Low-Voltage Electron (SALVE) Microscope to the University of Ulm
Developed in the frame of University Ulm's SALVE project, the microscope provides high-contrast, atomic-scale imaging of radiation-sensitive samples, such as graphene and organic materials. Hillsboro, Ore. and Heidelberg, Germany — FEI (NASDAQ: FEIC) and CEOS announced today that they have delivered the first sub-Ãâ¦ngstrom, low-voltage electron (SALVE) microscope to the University of...
Read More »Digital Rock Software aids oil and gas exploration.
Consisting of petrophysics, pore statistics, and core profile modules, PerGeos™ helps geoscientists rapidly interpret and model digital rock imagery so that exploration and production engineers can quickly obtain meaningful, actionable data.- Multi-scale, microscopic imagery and advanced digital rock modeling provides direct measurement for analyzing critical structural characteristics and...
Read More »Digital Rock Software aids oil and gas exploration.
Consisting of petrophysics, pore statistics, and core profile modules, PerGeos™ helps geoscientists rapidly interpret and model digital rock imagery so that exploration and production engineers can quickly obtain meaningful, actionable data.Ã- Multi-scale, microscopic imagery and advanced digital rock modeling provides direct measurement for analyzing critical structural characteristics and...
Read More »