FEI Co.
Hillsboro, OR 97124
In-Situ Electron Microscopy Tools foster real-time observation.
NanoEx™ holders enable materials scientists and engineers to observe, in real-time, changes at micro, nano, and atomic scale in morphology and dynamic properties- of materials under mechanical, electrical, and thermal stimuli as well as environmental conditions mimicking actual use cases. Specific products include NanoEx i/v heating solution, which uses MEMS-based nanoheaters; NanoEx 3D...
Read More »In-Situ Electron Microscopy Tools foster real-time observation.
NanoEx™ holders enable materials scientists and engineers to observe, in real-time, changes at micro, nano, and atomic scale in morphology and dynamic propertiesÃ- of materials under mechanical, electrical, and thermal stimuli as well as environmental conditions mimicking actual use cases. Specific products include NanoEx i/vÃÂ heating solution, whichÃÂ uses MEMS-based...
Read More »TEM Sample Preparation System aids failure analysis labs.
First 7nm TEM preparation solution available to failure analysis labs and the only DualBeam of its kind to achieve sub-three Ångström resolution. Hillsboro, Ore. – FEI (NASDAQ: FEIC) today announced the new Helios™ G4 DualBeam series, which offers the highest throughput ultra-thin TEM lamella preparation for leading-edge semiconductor manufacturing and failure analysis applications. The...
Read More »TEM Sample Preparation System aids failure analysis labs.
Available in FX and HX models, Helios™ G4 DualBeam Series offers 7 nm TEM lamella preparation solution for semiconductor manufacturing and failure analysis applications. Flexible FX system delivers STEM resolution down to sub-three Ãâ¦ngstrÃ-¶ms and enables images to be obtained within minutes of completing lamella. HX model, geared specifically for high-throughput TEM lamella...
Read More »
Plasma Focused Ion Beam cuts analysis from days to hours.
Built on DualBeam™ Plasma FIB platform with integrated SEM and nanoprobing capabilities, Helios PFIB EFI delivers site-specific sample preparation with in-situ SEM end-pointing and low-beam energy SEM-based transistor characterization. It includes electron-beam absorbed current- for interconnect-level electrical fault isolation and electron-beam induced current analysis for diffusion...
Read More »
Plasma Focused Ion Beam cuts analysis from days to hours.
Built on DualBeam™ Plasma FIB platform with integrated SEM and nanoprobing capabilities, Helios PFIB EFI delivers site-specific sample preparation with in-situ SEM end-pointing and low-beam energy SEM-based transistor characterization. It includes electron-beam absorbed currentÃ- for interconnect-level electrical fault isolation and electron-beam induced current analysis for diffusion...
Read More »FEI Partners with the George Washington University to Equip New Science and Engineering Hall
Suite of new high-performance microscopes will be used for cutting-edge experiments at GW’s new research facility. WASHINGTON –- FEI (NASDAQ: FEIC) and the George Washington University (GW) are pleased to announce that they are partnering to install several new high-performance microscopes at GW’s Science and Engineering Hall. The new, $275 million, 500,000-square-foot research facility...
Read More »FEI Partners with the George Washington University to Equip New Science and Engineering Hall
Suite of new high-performance microscopes will be used for cutting-edge experiments at GW’s new research facility. WASHINGTON –Ã- FEI (NASDAQ: FEIC) and the George Washington University (GW) are pleased to announce that they are partnering to install several new high-performance microscopes at GW’s Science and Engineering Hall. The new, $275 million, 500,000-square-foot research...
Read More »
Okinawa Institute of Science and Technology Graduate University Completes Installation of New Talos Arctica Cryo-TEM from FEI
Highly-automated system is designed to encourage cross over use by researchers with expertise in adjacent technologies, such as X-ray crystallography, seeking better understanding of critical biological structures down to the molecular level. Hillsboro, Ore.- – FEI (NASDAQ: FEIC) has completed the installation of a new Talos Arctica™ cryo-transmission electron microscope (TEM) at the Okinawa...
Read More »
Okinawa Institute of Science and Technology Graduate University Completes Installation of New Talos Arctica Cryo-TEM from FEI
Highly-automated system is designed to encourage cross over use by researchers with expertise in adjacent technologies, such as X-ray crystallography, seeking better understanding of critical biological structures down to the molecular level. Hillsboro, Ore.Ã- – FEI (NASDAQ: FEIC) has completed the installation of a new Talos Arctica™ cryo-transmission electron microscope (TEM) at the...
Read More »