FEI Co.

Automated Mineralogy Analyzer offers turn-key operation.
Laboratory and Research Supplies and Equipment

Automated Mineralogy Analyzer offers turn-key operation.

Extending mineral liberation analysis, MLA EXpress™Ã‚- provides graphic, mineralogical, and textural information from ore needed to make decisions in diverse mining operations. Bench-top unit. Automated mineralogy involves scanning electron microscope (SEM) and X-ray spectrometer, used to obtain microscopic view of structure and composition of ore. There are multiple...

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Surface Inspection System offer analytical and imaging modes.
Laboratory and Research Supplies and Equipment

Surface Inspection System offer analytical and imaging modes.

Versa 3D™ DualBeam™ is available with UniColore (UC) monochromated electron source, which improves fine surface detail imaging capabilities at low accelerating voltages without compromising analytical performance at high voltages and beam currents. By decreasing energy spread among beam electrons, UC sourceÂ- reduces chromatic aberration and permits beam to be focused...

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Material Handling & Storage

FEI Announces New NanoManipulator and Gas Injector Solutions for Industry-Leading DualBeam Systems

New accessories enable improved yield of ultrathin sample preparation and enhance flexibility and control of gas-assisted milling and deposition processes Hillsboro, Ore. - FEI (NASDAQ: FEIC), a leading instrumentation company providing imaging and analysis systems for research and industry, today announced significant performance enhancements for its DualBeam(TM) systems. The new EasyLift(TM)...

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University of Manchester Installs New Ultra-Powerful Microscope from FEI
Optics & Photonics

University of Manchester Installs New Ultra-Powerful Microscope from FEI

The first of its kind in the UK, the Titan G2 80-200 S/TEM is capable of imaging the microstructure of materials at the atomic-scale. Manchester, UK and Hillsboro, Ore.- The University of Manchester and FEI (NASDAQ: FEIC) are pleased to announce the installation of one of the world's most powerful high-resolution microscopes-the Titan(TM) G2 80-200 scanning transmission electron microscope...

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FIB/SEM Systems support TEM sample preparation.
Optics & Photonics

FIB/SEM Systems support TEM sample preparation.

Respectively accommodating up to 100 mm samples and full 300 mm wafers, Helios NanoLab(TM) 450HP and 1200HP DualBeam(TM) systems meet requirements for semiconductor process development at 28 nm device geometry node and below. Systems can prepare 15 nm thick samples with less than 2 nm damage layer in 90 min. QuickFlip grid holders facilitate inverted sample preparation, and iFast(TM) automation...

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Scanning Electron Microscope offers sub-nanometer resolution.
Optics & Photonics

Scanning Electron Microscope offers sub-nanometer resolution.

Verios(TM) XHR SEM provides resolution and contrast needed for precise measurements on beam-sensitive materials in semiconductor manufacturing and materials science applications. When combined with IC3D(TM) software, instrument can provide measurements needed to control processes at 22 nm technology node and below. User can switch between operating conditions, maintain sample cleanliness, and...

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Laboratory and Research Supplies and Equipment

Electron Microscope images dynamic processes at atomic scale.

Titan(TM) ETEM G2 enables time-resolved, in-situ studies of processes and materials exposed to reactive gases and elevated temperatures. With this environmental transmission electron microscope (ETEM), developers of energy and environmental products can study relationships between structure and performance by observing atomic scale processes and gas-solid interactions under conditions that mimic...

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Mining, Oil Drilling, Refining Products & Equipment

FEI Receives Bookings Worldwide from Oil & Gas Companies

FEI's Core-to-Pore workflow and QEMSCAN WellSite solution are helping oil & gas companies and service providers with better reservoir characterization for production optimization Hillsboro, Ore. - FEI (NASDAQ: FEIC) announced today that it has received multiple bookings for its Core-to-Pore" petrography workflow and QEMSCAN® WellSite(TM) analysis solutions. "FEI has made great inroads in...

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Optics & Photonics

Highly Advanced Transmission Electron Microscope from FEI Inaugurated at the Ernst Ruska-Centre in Germany

The Ernst Ruska-Centre has reached a record resolution of 50 picometers (one billionth of a millimeter), which allows scientists to resolve atomic structures to unprecedented levels Hillsboro, Ore.- FEI (NASDAQ: FEIC), a leading instrumentation company providing imaging and analysis systems for research and industry, today announced that a highly advanced microscope has been inaugurated at the...

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Workflow Imaging Software analyzes shale gas reservoirs.
Software

Workflow Imaging Software analyzes shale gas reservoirs.

Core-to-pore petrography workflow includes automated, large-scale, high resolution imaging method for viewing and analyzing petrographic data sets with length scales from centimeters to nanometers. Used for core analysis of unconventional gas reservoirs, solution acquires grid of electron microscope images covering entire sample surface and stitches them together in coherent and correlated image...

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