Aprima Medical Software, Inc

New nProber IV Platform Offers Fast Identification of Defects
Laboratory and Research Supplies and Equipment

New nProber IV Platform Offers Fast Identification of Defects

Provides specific localization and accurate electrical characterization of parametric faults in advanced FinFET transistors. Delivers good levels of automation and precision for semiconductor yield engineers as they perform leading-edge and mid-range logic and memory failure analysis. EBIRCH2 fault localization is combined with the LEEN2 SEM column that can operate at up to 100 nA.

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New nProber IV Platform Offers Fast Identification of Defects
Laboratory and Research Supplies and Equipment

New nProber IV Platform Offers Fast Identification of Defects

Provides specific localization and accurate electrical characterization of parametric faults in advanced FinFET transistors. Delivers good levels of automation and precision for semiconductor yield engineers as they perform leading-edge and mid-range logic and memory failure analysis. EBIRCH2 fault localization is combined with the LEEN2 SEM column that can operate at up to 100 nA.

Read More »

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