Scanning Electron Microscope handles broad range of samples.
Press Release Summary:
Nova NanoSEM(TM) 30 Series SEM enables surface characterization and analysis of samples such as nanoparticles, insulating substrates, porous materials, metals, and composites. It provides prototyping capabilities based on electron beam lithography, electron beam induced deposition, and in-situ experimentation for manipulation and testing. Models 230 and 430 feature 50 x 50 mm and 100 x 100 mm 5-axis motorized stages, while model 630 features 5-axis 150 x 150 mm piezo stage.
Original Press Release:
FEI Introduces NOVA NanoSEM(TM) 30 Series
Versatile System Will Bring Ultra-High Resolution Imaging to a Broad Spectrum of Samples
HILLSBORO, Ore./August 6, 20007 - FEI (Nasdaq: FEIC) today introduced its latest and most powerful scanning electron microscope (SEM), the Nova NanoSEM(TM) 30 series. This high-end, versatile field emission SEM series features new low kV performance for enhanced surface characterization, high current for compositional analysis capabilities and the world's only high-resolution operation in low vacuum to characterize uncoated and even insulating samples.
The advanced performance of the Nova NanoSEM 30 series enables the characterization and analysis of a large range of samples, including demanding ones such as nanoparticles, insulating substrates such as glass or polymers, porous materials, metals and composites.
Beyond its new imaging and analytical performance, the NOVA NanoSEM 30 series also provides researchers with novel prototyping capabilities based on electron beam lithography, electron beam induced deposition and in-situ experimentation for manipulation and testing.
The three instruments of the Nova NanoSEM 30 Series owe their superior performance to the newly introduced Schottky gun and beam deceleration technologies. The 230 and 430 systems feature 50 x 50 mm and 100 x 100 mm 5-axis motorized stages, respectively. The 630 system is equipped with a 5-axis high precision and stability 150 x 150 mm piezo stage.
"The NOVA NanoSEM 30 Series builds on FEI's expertise in field emission scanning electron microscopy and low vacuum SEM technology and brings unprecedented capabilities to researchers in the nanotechnology space, delivering best performance in characterization and prototyping tasks for a wide variety of nanomaterials and devices," said Dominique Hubert, vice president of FEI's NanoResearch division. "Joining the world's most powerful S/TEM, the Titan(TM), and the world's smallest and easiest-to- use tabletop SEM, the Phenom(TM), the NOVA NanoSEM 30 Series is an important addition to our innovative range of customer offerings."
Visitors to the Microscopy and Microanalysis Conference this week can see the new NOVA NanoSEM 630 at FEI's exhibit (Booth 414) at the Greater Fort Lauderdale/Broward County Convention Center. Complete information on FEI's activities at the conference can be found at fei.com/mm07.
About FEI
FEI (Nasdaq: FEIC) is a global leader in providing innovative instruments for nanoscale imaging, analysis and prototyping. FEI focuses on delivering solutions that provide groundbreaking results and accelerate research, development and manufacturing cycles for its customers in Semiconductor and Data Storage, Academic and Industrial R&D, and Life Sciences markets. With R&D centers in North America and Europe, and sales and service operations in more than 50 countries around the world, FEI's Tools for Nanotech(TM) are bringing the nanoscale within the grasp of leading researchers and manufacturers. More information can be found online at: www.fei.com.
Contact:
Dan Zenka, APR
FEI Company
+1 503 726 2695
dzenka@feico.com
