New Scanning Transmission Electron Microscope Features Smart Alignment Software
Metrios AX-S/TEM qllows lab operators to generate accurate and precise data, while minimizing the need for operator training. Obtains sub-angstrom resolution images with high contrast and keeps the microscope automatically aligned for peak performance. Includes high sensitivity Panther S/TEM detector infrastructure and improved (SCORR) corrector technology.
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Microscopy Systems support materials science applications.
Featuring advanced scanning electron microscope and focused ion beam technology, Helios™ G4 DualBeam Series offers automated sample preparation for transmission electron microscopy and 3D sample characterization. Phoenix FIB column offers low-voltage performance for ultra-low sample damage, while Elstar electron column with UC+ technology offers 4x more monochromated current than previous...
Read More »FEI Launches Three New Tools for Next-Generation Semiconductor Manufacturing
New solutions are designed to address the challenges of 7nm technology node metrology and defect/failure analysis.- Hillsboro, Ore. - FEI (NASDAQ: FEIC) announced today the release of three new tools for process control and defect/failure analysis in advanced semiconductor manufacturing. Two of the tools are specifically targeted at the 7nm node, and all are designed to allow manufacturers to...
Read More »FIB/SEM Systems utilize 3D reconstruction software.
Designed to work with all DualBeam focused ion beam/scanning electron microscope platforms, Auto Slice & View v4.0 software enables 3D structure and composition of samples at nanometer scale. Imaging can be combined with analytical capabilities, such as energy dispersive x-ray spectrometry and electron backscatter diffraction, to ensure that no information is lost in sectioning of sample....
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Advantages of Nylon Washers and Other Non-Metallic Materials
Check out this white paper to learn about the types of non-metallic washers.
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Multiphoton Microscopes are suited for live cell, in-vivo imaging.
FluoView FVMPE-RS series includes multiphoton laser scanning microscopes with gantry frame and inverted microscope frames. Gantry microscope frame features stable, arch-like structure that allows space beneath objective to accommodate experiments of varied sizes. Volume of 640 x 355 x 520 mm is available if stage is removed. Inverted microscope frame is suited for observation of cells in 3D...
Read More »Excelitas Technologies® Exhibits Expanded Portfolio of Innovative Technology Solutions at Photonics West 2015
SAN FRANCISCO, CA – Excelitas Technologies Corp., a global technology leader focused on delivering innovative, customized photonics solutions today announced today it is exhibiting a broad array of its products at the SPIE Photonics West 2015 conference, which takes- place February 10-12 at The Moscone Center in San Francisco, California.- The event marks the first time both Excelitas and...
Read More »FE-SEM System features integrated EDS capabilities.
With integrated silicon-drift X-ray detector, digital multichannel analyzer, and intuitive software, Model 8500B allows users to perform quantitative elemental analysis on arbitrary points, on continuous line scan, or in user-defined regional map. Energy Dispersive Spectroscopy results are analyzed and displayed in real-time and researchers can export data for further off-line analysis. Patented...
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Microscopy System offers expanded options and accessories.
Offering choice of 6 different sub lenses with magnifications of .35X, .5X, .75X, 1X, 1.5X, and 2X, Micro-Video Zoom Objective is suited for industrial robots, machine vision, quality control, and electronics fabrication. Video Adapters expand range of magnifications from low of .17X to high of 18X, while 2X C-Mount Adapter delivers up to 748X enlargement. To shorten overall length between camera...
Read More »Microscopic Force Increased at the University of Limerick Supported by NT-MDT
LIMERICK, Ireland –- The University of Limerick has received one of Europe's most powerful microscopes supported by NT-MDT, a world-leading manufacturer of atomic force based microscopes (AFM). NT-MDT recently installed a unique Atomic Force Microscope with RAMAN, TERS, and SNOM capabilities (NTEGRA Spectra). This is a very rare device that combines AFM with spectroscopy analysis and confocal...
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Toshiba Nanoanalysis Corporation Expands Capabilities with ZEISS Xradia 520 Versa
Thornwood, N.Y. – Carl Zeiss X-ray Microscopy, formerly Xradia, Inc., announced today that Kawasaki, Japan-based Toshiba Nanoanalysis Corporation has selected the recently-introduced ZEISS Xradia 520 Versa 3D X-ray microscope (XRM) to expand the capabilities of its busy analysis lab. Toshiba Nanoanalysis offers imaging services for complex analytical demands in semiconductor, biosciences and...
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Triad's Next-Gen Power Supplies Offer Increased Reliability and Reduced Noise Performance
Triad Magnetics, an established leader in power supply design and manufacturing, is proud to announce their next generation WAU AC and WDU DC Series of power supplies. These linear wall plug-ins offer minimum noise performance without sacrificing reliability or life. See our video to learn more.
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