New Electron Microscope Includes Energy-dispersive X-Ray Analysis System
Spectra ultra offers structural and chemical insight on a wide range of materials at atomic-scale resolution. Provides atomic-level analysis for the fundamental development and improvement of materials. Constant power lens and optics design enable users to rapidly tune the instrument to the optimal voltage for their job.
Read More »
New OLS5100 Laser Microscope Scans Samples According to Customized Experiment Plan
Simplifies experiment workflows and delivers high-quality data. Smart experiment manager helps users to manage the planning, acquisition and analysis phases of their experiments. Smart lens advisor takes the guesswork out of selecting the right objective lens when measuring surface roughness.
Read More »
New Scanning Electron Microscope Comes with Auto-Alignment and Auto-Focus Technology
Features ChemiSEM technology that offers instant quantitative elemental information. Includes always-on energy dispersive spectroscopy (EDS) analysis. Provides faster access to the compositional data necessary for accurate failure analysis and defect discovery.
Read More »
New CellChek20 Specular Microscope is FDA 510(k) Cleared and CE Marked
Acquires images of both eyes and the automated analysis with fully-automated Center Method™. Features larger imaged area, superior image clarity as well as guttata recognition and redaction from cellular calculations. Ideal for ophthalmology, optometry, and eye banking that assesses the density and morphology of the cornea’s inner-most layer, the endothelium.
Read More »
All About Cable Drag Chains
This ebook provides an in-depth overview into cable drag chains.
Read More »
New Helios 5 PFIBs Ion Beam Scanning Electron Microscopes Provide Scientists with Higher Throughput and Higher Quality Characterization
Offer faster, easier, and more precise sample preparation and higher-quality subsurface and 3D analysis for the widest range of materials and biological samples. Allow materials scientists to discover and design new materials and analyze their structures and properties. Suitable for labs that conduct both materials and life science research.
Read More »
Oxford Instruments Asylum Research Releases New Application Note: Atomic Force Microscopy Investigation of Tribofilm Formation
April 2,2020 (Santa Barbara, CA) Friction between the surfaces of mechanical systems is a costly global problem. It is not just that the resulting wear leads to premature equipment failures. Friction is also one of the leading factors that reduce energy efficiency, thought to account for more than 20% of worldwide energy consumption. Scientists and engineers in the field of tribology look for...
Read More »
New Scanning Transmission Electron Microscope Features Smart Alignment Software
Metrios AX-S/TEM qllows lab operators to generate accurate and precise data, while minimizing the need for operator training. Obtains sub-angstrom resolution images with high contrast and keeps the microscope automatically aligned for peak performance. Includes high sensitivity Panther S/TEM detector infrastructure and improved (SCORR) corrector technology.
Read More »
MultiFiber Inspection Microscope from Sumix Receives Gold in 2019 Cabling Installation & Maintenance Innovators Awards
Oceanside, CA, October 7, 2019 – Sumix Corporation, fiber optic inspection equipment manufacturer, announced today that its Manta-W+ fiber microscope for MPO inspection was recognized among the best in the industry by the 2019 Cabling Installation & Maintenance Innovators Awards. The stellar third-party judging panel included cabling and communications system specifiers, designers, integrators...
Read More »
New Phenom ParticleX Desktop SEM Comes with Automation Software Package
Provides automotive suppliers and additive manufacturing companies quality control analyses of materials. Identifies faults in materials or gauge impact development and production changes have on final product. Additive manufacturers can characterize size distribution, particle homogeneity and foreign contaminants whereas industrial manufacturers uses to confirm whether components fulfill VDA19...
Read More »
New Multiplex Mode for ZEISS Airyscan 2 Delivers More Information in Less Time
Smart illumination and detection schemes allow parallel pixel acquisition for fast and gentle confocal microscopy. Provides more options to fit imaging speeds and resolution to experimental needs. Multiplex mode is available for ZEISS LSM 980 with multiphoton and superresolution capabilities and ZEISS LSM 900 to delivers image quality without complexity.
Read More »
Acoustic and Thermal Solutions for Original Equipment Manufacturers
Technicon's products solve the most complex noise pollution and thermal problems and improve product marketability. Check out the video to learn more.
Read More »
