FEI Co.
Hillsboro, OR 97124
FEI Celebrates Shipment of 1,000th Helios DualBeam System
FEI’s Helios Family has lead the DualBeam technology race and is widely used across the semiconductor, materials science, life sciences and oil gas industries Hillsboro, Ore. — FEI (NASDAQ: FEIC) today announced a milestone of the 1,000th Helios™ DualBeam system shipped since the product family was introduced in 2006. The 1,000th system was manufactured in FEI’s Brno plant and was shipped...
Read More »FEI Celebrates Shipment of 1,000th Helios DualBeam System
FEI’s Helios Family has lead the DualBeam technology race and is widely used across the semiconductor, materials science, life sciences and oil gas industries Hillsboro, Ore. — FEI (NASDAQ: FEIC) today announced a milestone of the 1,000th Helios™ DualBeam system shipped since the product family was introduced in 2006. The 1,000th system was manufactured in FEI’s Brno plant and was shipped...
Read More »Ergonomic 120 kV S/TEM targets life and materials sciences.
Offering users access to scientific results regardless of experience, Talos™ L120C transmission/scanning transmission electron microscope (S/TEM) provides Hi-Res, 3D imaging and analysis capabilities. Automation and directed workflows foster facilitated adoption path and accelerate results without compromising performance. Along with ultra-stable optics, this 120 kV LaB6 S/TEM features MAPS™...
Read More »Ergonomic 120 kV S/TEM targets life and materials sciences.
Offering users access to scientific results regardless of experience, Talos™ L120C transmission/scanning transmission electron microscope (S/TEM) provides Hi-Res, 3D imaging and analysis capabilities. Automation and directed workflows foster facilitated adoption path and accelerate results without compromising performance. Along with ultra-stable optics, this 120 kV LaB6 S/TEM features MAPS™...
Read More »FEI and Cornell University Collaborate to Commercialize New EMPAD Detector
Speed, sensitivity and dynamic range will enable multichannel atomic-scale imaging and analysis of material properties such as electric and magnetic fields Hillsboro, Ore. and Ithaca, NY — FEI (NASDAQ: FEIC) and Cornell University have entered an agreement to commercialize a new high dynamic range detector for FEI’s electron microscopes. It promises to enable new kinds of multichannel imaging...
Read More »FEI and Cornell University Collaborate to Commercialize New EMPAD Detector
Speed, sensitivity and dynamic range will enable multichannel atomic-scale imaging and analysis of material properties such as electric and magnetic fields Hillsboro, Ore. and Ithaca, NY — FEI (NASDAQ: FEIC) and Cornell University have entered an agreement to commercialize a new high dynamic range detector for FEI’s electron microscopes. It promises to enable new kinds of multichannel imaging...
Read More »Automated S/TEM delivers high-performance imaging, analysis.
Themis™ Z scanning/transmission electron microscope (S/TEM) offers system stability and automated tuning routines that promote reproducible image resolution at high and low beam energies in both STEM and TEM modes. Energy dispersive x-ray systems let users configure system based on primary characterization needs, and iDPC detector, by using up to 90% of transmitted electrons, offers high...
Read More »Automated S/TEM delivers high-performance imaging, analysis.
Themis™ Z scanning/transmission electron microscope (S/TEM) offers system stability and automated tuning routines that promote reproducible image resolution at high and low beam energies in both STEM and TEM modes. Energy dispersive x-ray systems let users configure system based on primary characterization needs, and iDPC detector, by using up to 90% of transmitted electrons, offers high...
Read More »Microscopy Systems support materials science applications.
Featuring advanced scanning electron microscope and focused ion beam technology, Helios™ G4 DualBeam Series offers automated sample preparation for transmission electron microscopy and 3D sample characterization. Phoenix FIB column offers low-voltage performance for ultra-low sample damage, while Elstar electron column with UC+ technology offers 4x more monochromated current than previous...
Read More »Microscopy Systems support materials science applications.
Featuring advanced scanning electron microscope and focused ion beam technology, Helios™ G4 DualBeam Series offers automated sample preparation for transmission electron microscopy and 3D sample characterization. Phoenix FIB column offers low-voltage performance for ultra-low sample damage, while Elstar electron column with UC+ technology offers 4x more monochromated current than previous...
Read More »FEI Celebrates Shipment of 1,000th Helios DualBeam System
FEI’s Helios Family has lead the DualBeam technology race and is widely used across the semiconductor, materials science, life sciences and oil gas industries Hillsboro, Ore. — FEI (NASDAQ: FEIC) today announced a milestone of the 1,000th Helios™ DualBeam system shipped since the product family was introduced in 2006. The 1,000th system was manufactured in FEI’s Brno plant and was shipped...
Read More »FEI Celebrates Shipment of 1,000th Helios DualBeam System
FEI’s Helios Family has lead the DualBeam technology race and is widely used across the semiconductor, materials science, life sciences and oil gas industries Hillsboro, Ore. — FEI (NASDAQ: FEIC) today announced a milestone of the 1,000th Helios™ DualBeam system shipped since the product family was introduced in 2006. The 1,000th system was manufactured in FEI’s Brno plant and was shipped...
Read More »Ergonomic 120 kV S/TEM targets life and materials sciences.
Offering users access to scientific results regardless of experience, Talos™ L120C transmission/scanning transmission electron microscope (S/TEM) provides Hi-Res, 3D imaging and analysis capabilities. Automation and directed workflows foster facilitated adoption path and accelerate results without compromising performance. Along with ultra-stable optics, this 120 kV LaB6 S/TEM features MAPS™...
Read More »Ergonomic 120 kV S/TEM targets life and materials sciences.
Offering users access to scientific results regardless of experience, Talos™ L120C transmission/scanning transmission electron microscope (S/TEM) provides Hi-Res, 3D imaging and analysis capabilities. Automation and directed workflows foster facilitated adoption path and accelerate results without compromising performance. Along with ultra-stable optics, this 120 kV LaB6 S/TEM features MAPS™...
Read More »FEI and Cornell University Collaborate to Commercialize New EMPAD Detector
Speed, sensitivity and dynamic range will enable multichannel atomic-scale imaging and analysis of material properties such as electric and magnetic fields Hillsboro, Ore. and Ithaca, NY — FEI (NASDAQ: FEIC) and Cornell University have entered an agreement to commercialize a new high dynamic range detector for FEI’s electron microscopes. It promises to enable new kinds of multichannel imaging...
Read More »FEI and Cornell University Collaborate to Commercialize New EMPAD Detector
Speed, sensitivity and dynamic range will enable multichannel atomic-scale imaging and analysis of material properties such as electric and magnetic fields Hillsboro, Ore. and Ithaca, NY — FEI (NASDAQ: FEIC) and Cornell University have entered an agreement to commercialize a new high dynamic range detector for FEI’s electron microscopes. It promises to enable new kinds of multichannel imaging...
Read More »Automated S/TEM delivers high-performance imaging, analysis.
Themis™ Z scanning/transmission electron microscope (S/TEM) offers system stability and automated tuning routines that promote reproducible image resolution at high and low beam energies in both STEM and TEM modes. Energy dispersive x-ray systems let users configure system based on primary characterization needs, and iDPC detector, by using up to 90% of transmitted electrons, offers high...
Read More »Automated S/TEM delivers high-performance imaging, analysis.
Themis™ Z scanning/transmission electron microscope (S/TEM) offers system stability and automated tuning routines that promote reproducible image resolution at high and low beam energies in both STEM and TEM modes. Energy dispersive x-ray systems let users configure system based on primary characterization needs, and iDPC detector, by using up to 90% of transmitted electrons, offers high...
Read More »Microscopy Systems support materials science applications.
Featuring advanced scanning electron microscope and focused ion beam technology, Helios™ G4 DualBeam Series offers automated sample preparation for transmission electron microscopy and 3D sample characterization. Phoenix FIB column offers low-voltage performance for ultra-low sample damage, while Elstar electron column with UC+ technology offers 4x more monochromated current than previous...
Read More »Microscopy Systems support materials science applications.
Featuring advanced scanning electron microscope and focused ion beam technology, Helios™ G4 DualBeam Series offers automated sample preparation for transmission electron microscopy and 3D sample characterization. Phoenix FIB column offers low-voltage performance for ultra-low sample damage, while Elstar electron column with UC+ technology offers 4x more monochromated current than previous...
Read More »