FEI Co.

Laboratory and Research Supplies and Equipment

FEI Celebrates Shipment of 1,000th Helios DualBeam System

FEI’s Helios Family has lead the DualBeam technology race and is widely used across the semiconductor, materials science, life sciences and oil gas industries Hillsboro, Ore. — FEI (NASDAQ: FEIC) today announced a milestone of the 1,000th Helios™ DualBeam system shipped since the product family was introduced in 2006. The 1,000th system was manufactured in FEI’s Brno plant and was shipped...

Read More »
Ergonomic 120 kV S/TEM targets life and materials sciences.
Optics & Photonics

Ergonomic 120 kV S/TEM targets life and materials sciences.

Offering users access to scientific results regardless of experience, Talos™ L120C transmission/scanning transmission electron microscope (S/TEM) provides Hi-Res, 3D imaging and analysis capabilities. Automation and directed workflows foster facilitated adoption path and accelerate results without compromising performance. Along with ultra-stable optics, this 120 kV LaB6 S/TEM features MAPS™...

Read More »
Optics & Photonics

FEI and Cornell University Collaborate to Commercialize New EMPAD Detector

Speed, sensitivity and dynamic range will enable multichannel atomic-scale imaging and analysis of material properties such as electric and magnetic fields Hillsboro, Ore. and Ithaca, NY — FEI (NASDAQ: FEIC) and Cornell University have entered an agreement to commercialize a new high dynamic range detector for FEI’s electron microscopes. It promises to enable new kinds of multichannel imaging...

Read More »
Automated S/TEM delivers high-performance imaging, analysis.
Optics & Photonics

Automated S/TEM delivers high-performance imaging, analysis.

Themis™ Z scanning/transmission electron microscope (S/TEM) offers system stability and automated tuning routines that promote reproducible image resolution at high and low beam energies in both STEM and TEM modes. Energy dispersive x-ray systems let users configure system based on primary characterization needs, and iDPC detector, by using up to 90% of transmitted electrons, offers high...

Read More »
Microscopy Systems support materials science applications.
Optics & Photonics

Microscopy Systems support materials science applications.

Featuring advanced scanning electron microscope and focused ion beam technology, Helios™ G4 DualBeam Series offers automated sample preparation for transmission electron microscopy and 3D sample characterization. Phoenix FIB column offers low-voltage performance for ultra-low sample damage, while Elstar electron column with UC+ technology offers 4x more monochromated current than previous...

Read More »
Computer Hardware & Peripherals

FEI Launches Three New Tools for Next-Generation Semiconductor Manufacturing

New solutions are designed to address the challenges of 7nm technology node metrology and defect/failure analysis.Â-  Hillsboro, Ore. - FEI (NASDAQ: FEIC) announced today the release of three new tools for process control and defect/failure analysis in advanced semiconductor manufacturing. Two of the tools are specifically targeted at the 7nm node, and all are designed to allow manufacturers...

Read More »
Optics & Photonics

FIB/SEM Systems utilize 3D reconstruction software.

Designed to work with all DualBeam focused ion beam/scanning electron microscope platforms, Auto Slice & View v4.0 software enables 3D structure and composition of samples at nanometer scale. Imaging can be combined with analytical capabilities, such as energy dispersive x-ray spectrometry and electron backscatter diffraction, to ensure that no information is lost in sectioning of sample....

Read More »
Scanning Electron Microscope supports diverse applications.
Optics & Photonics

Scanning Electron Microscope supports diverse applications.

With compound final lens, Apreo™Ã‚- offers resolution down to 1.0 nm at 1 kV, without need for beam deceleration, for optimal performance on sample even if it is tilted or topographic. Backscatter detection is offered at lowest beam currents, at any tilt angle, on sensitive samples, and at TV-rate imaging to maximize materials contrast, and detector segments can be individually...

Read More »
FEI and CEOS Deliver First Sub-Angstrom, Low-Voltage Electron (SALVE) Microscope to the University of Ulm
Optics & Photonics

FEI and CEOS Deliver First Sub-Angstrom, Low-Voltage Electron (SALVE) Microscope to the University of Ulm

Developed in the frame of University Ulm's SALVE project, the microscope provides high-contrast, atomic-scale imaging of radiation-sensitive samples, such as graphene and organic materials. Hillsboro, Ore. and Heidelberg, Germany — FEI (NASDAQ: FEIC) and CEOS announced today that they have delivered the first sub-Ã-...ngstrom, low-voltage electron (SALVE) microscope to the University of...

Read More »
Mining, Oil Drilling, Refining Products & Equipment

Digital Rock Software aids oil and gas exploration.

Consisting of petrophysics, pore statistics, and core profile modules, PerGeos™ helps geoscientists rapidly interpret and model digital rock imagery so that exploration and production engineers can quickly obtain meaningful, actionable data.Â- Multi-scale, microscopic imagery and advanced digital rock modeling provides direct measurement for analyzing critical structural characteristics...

Read More »
Laboratory and Research Supplies and Equipment

FEI Celebrates Shipment of 1,000th Helios DualBeam System

FEI’s Helios Family has lead the DualBeam technology race and is widely used across the semiconductor, materials science, life sciences and oil gas industries Hillsboro, Ore. — FEI (NASDAQ: FEIC) today announced a milestone of the 1,000th Helios™ DualBeam system shipped since the product family was introduced in 2006. The 1,000th system was manufactured in FEI’s Brno plant and was shipped...

Read More »
Ergonomic 120 kV S/TEM targets life and materials sciences.
Optics & Photonics

Ergonomic 120 kV S/TEM targets life and materials sciences.

Offering users access to scientific results regardless of experience, Talos™ L120C transmission/scanning transmission electron microscope (S/TEM) provides Hi-Res, 3D imaging and analysis capabilities. Automation and directed workflows foster facilitated adoption path and accelerate results without compromising performance. Along with ultra-stable optics, this 120 kV LaB6 S/TEM features MAPS™...

Read More »
Optics & Photonics

FEI and Cornell University Collaborate to Commercialize New EMPAD Detector

Speed, sensitivity and dynamic range will enable multichannel atomic-scale imaging and analysis of material properties such as electric and magnetic fields Hillsboro, Ore. and Ithaca, NY — FEI (NASDAQ: FEIC) and Cornell University have entered an agreement to commercialize a new high dynamic range detector for FEI’s electron microscopes. It promises to enable new kinds of multichannel imaging...

Read More »
Automated S/TEM delivers high-performance imaging, analysis.
Optics & Photonics

Automated S/TEM delivers high-performance imaging, analysis.

Themis™ Z scanning/transmission electron microscope (S/TEM) offers system stability and automated tuning routines that promote reproducible image resolution at high and low beam energies in both STEM and TEM modes. Energy dispersive x-ray systems let users configure system based on primary characterization needs, and iDPC detector, by using up to 90% of transmitted electrons, offers high...

Read More »
Microscopy Systems support materials science applications.
Optics & Photonics

Microscopy Systems support materials science applications.

Featuring advanced scanning electron microscope and focused ion beam technology, Helios™ G4 DualBeam Series offers automated sample preparation for transmission electron microscopy and 3D sample characterization. Phoenix FIB column offers low-voltage performance for ultra-low sample damage, while Elstar electron column with UC+ technology offers 4x more monochromated current than previous...

Read More »
Computer Hardware & Peripherals

FEI Launches Three New Tools for Next-Generation Semiconductor Manufacturing

New solutions are designed to address the challenges of 7nm technology node metrology and defect/failure analysis.Â-  Hillsboro, Ore. - FEI (NASDAQ: FEIC) announced today the release of three new tools for process control and defect/failure analysis in advanced semiconductor manufacturing. Two of the tools are specifically targeted at the 7nm node, and all are designed to allow manufacturers...

Read More »
Optics & Photonics

FIB/SEM Systems utilize 3D reconstruction software.

Designed to work with all DualBeam focused ion beam/scanning electron microscope platforms, Auto Slice & View v4.0 software enables 3D structure and composition of samples at nanometer scale. Imaging can be combined with analytical capabilities, such as energy dispersive x-ray spectrometry and electron backscatter diffraction, to ensure that no information is lost in sectioning of sample....

Read More »
Scanning Electron Microscope supports diverse applications.
Optics & Photonics

Scanning Electron Microscope supports diverse applications.

With compound final lens, Apreo™Ã‚- offers resolution down to 1.0 nm at 1 kV, without need for beam deceleration, for optimal performance on sample even if it is tilted or topographic. Backscatter detection is offered at lowest beam currents, at any tilt angle, on sensitive samples, and at TV-rate imaging to maximize materials contrast, and detector segments can be individually...

Read More »
FEI and CEOS Deliver First Sub-Angstrom, Low-Voltage Electron (SALVE) Microscope to the University of Ulm
Optics & Photonics

FEI and CEOS Deliver First Sub-Angstrom, Low-Voltage Electron (SALVE) Microscope to the University of Ulm

Developed in the frame of University Ulm's SALVE project, the microscope provides high-contrast, atomic-scale imaging of radiation-sensitive samples, such as graphene and organic materials. Hillsboro, Ore. and Heidelberg, Germany — FEI (NASDAQ: FEIC) and CEOS announced today that they have delivered the first sub-Ã-...ngstrom, low-voltage electron (SALVE) microscope to the University of...

Read More »
Mining, Oil Drilling, Refining Products & Equipment

Digital Rock Software aids oil and gas exploration.

Consisting of petrophysics, pore statistics, and core profile modules, PerGeos™ helps geoscientists rapidly interpret and model digital rock imagery so that exploration and production engineers can quickly obtain meaningful, actionable data.Â- Multi-scale, microscopic imagery and advanced digital rock modeling provides direct measurement for analyzing critical structural characteristics...

Read More »

All Topics