Latest Metrology Tool Comes with Accessory to Viewports of Various Sizes

Press Release Summary:

  • Allows researchers and operators to view wafers and platen from within the k-Space software
  • Utilizes high-resolution color camera and is plug-and play compatible with all k-Space thin-film metrology software
  • Offers zoom lens that allows for focus over large range of working distances

Original Press Release:

k-Space Offers a New Accessory for Their In Situ Metrology Tools

k-Space is proud to announce the addition of a new accessory, kSA Insight, for their metrology tools. This tool allows researchers and operators to view their wafers and platen in real-time from within the k-Space software. The imaging system utilizes a high-resolution color camera and is plug-and play compatible with all k-Space thin-film metrology software.

k-Space CEO, Darryl Barlett, stated “Several customers have requested the ability to see their wafers and platen from their computer screen during deposition, so we designed this tool to seamlessly integrate with their existing k-Space software. So, whether you are running kSA 400, kSA BandiT, kSA MOS, or kSA ICE, you can seamlessly view your platen and wafers with this plug in.”

Customers can adapt the accessory to viewports of various sizes, and the included zoom lens allows for focus over a large range of working distances. The live video can be zoomed in or out, and full resolution color images can be snapped and stored at any time from within the k-Space software.

To discover more about kSA Insight please visit https://www.k-space.com/product/accessories/.

About k-Space Associates, Inc.
k-Space Associates, Inc. (www.k-space.com/) is a leading metrology supplier of advanced instrumentation and software for research and production facilities. Founded in 1992, its systems are used for monitoring dimensions, wafer temperature, thin-film stressdeposition rate, thickness, material absorption properties, and Reflection High Energy Electron Diffraction (RHEED). Backed by a commitment to ongoing support, these solutions are currently used worldwide in research and production line monitoring of multiple industries. Extensive input and close collaboration with its worldwide customer base have led to the development of today’s most powerful metrology.

Contact: Kathy Wheeler, k-Space Associates, Inc., kwheeler@k-space.com

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