Metrology Equipment

k-Space Ships 5 Glass Breakage Metrology Systems

k-Space Ships 5 Glass Breakage Metrology Systems

[Dexter, MI, January 26] -  k-Space Associates, Inc. is proud to announce that they shipped five glass breakage and defect detection metrology systems to the U.S. and Asia for a large international manufacturing customer. The kSA Glass Breakage and Defect Detection tool is an inline vision-based metrology system that determines Go/No-Go (Pass/Fail) conditions for every glass-based panel that...

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Onto Innovation Announces First Customer Qualification of New Aspect® IRCD System

Onto Innovation Announces First Customer Qualification of New Aspect® IRCD System

Wilmington, Mass., December 16, 2020 – Onto Innovation Inc. (NYSE: ONTO) today announced the first customer acceptance and purchase of its new product, the Aspect® System, at one of the top three memory manufacturers of leading-edge 3D-NAND devices. After successful factory demonstrations, additional Aspect systems are shipping this quarter and in the first quarter of 2021 for evaluations...

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KLA Introduces Two New Systems That Take on Semiconductor Manufacturing's Toughest Problems

KLA Introduces Two New Systems That Take on Semiconductor Manufacturing's Toughest Problems

PWG5™ attacks 3D NAND process issues while Surfscan® SP7XP tackles 3nm logic defectivity Milpitas, Calif., Dec. 10, 2020 /PRNewswire/ -- Today KLA Corporation (NASDAQ: KLAC) announced two new products: the PWG5™ wafer geometry system and the Surfscan® SP7XP wafer defect inspection system. The new systems are designed to address exceedingly difficult issues in the manufacture of...

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New Control Metrology Systems for Advanced Device Manufacturing

Atlas V metrology system helps to measure several key steps that include buried features, not visible by CD-SEM and other techniques. IMPULSE V system work seamlessly with CMP systems to provide high throughput run-to-run control for critical process steps. Aspect metrology system designed for the current and future challenges of advanced 3D NAND devices.

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New Electronic Digital Height Master from Starrett Features Digital Readout Display

New Electronic Digital Height Master from Starrett Features Digital Readout Display

Starrett introduces the new Digi-Check No. 258 series height masters with a digital readout able to display an instant readout to .0001 or 0.001mm.  The product features a precision micrometer head as well as a digital readout display. Capabilities include settings for checking bore gages, inside micrometers, end measuring rods and other gages, and height measurement of parts.

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