Metrology Equipment

k-Space Ships 5 Glass Breakage Metrology Systems
Metrology Equipment

k-Space Ships 5 Glass Breakage Metrology Systems

[Dexter, MI, January 26] -  k-Space Associates, Inc. is proud to announce that they shipped five glass breakage and defect detection metrology systems to the U.S. and Asia for a large international manufacturing customer. The kSA Glass Breakage and Defect Detection tool is an inline vision-based metrology system that determines Go/No-Go (Pass/Fail) conditions for every glass-based panel that...

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Onto Innovation Announces First Customer Qualification of New Aspect® IRCD System
Metrology Equipment

Onto Innovation Announces First Customer Qualification of New Aspect® IRCD System

Wilmington, Mass., December 16, 2020 – Onto Innovation Inc. (NYSE: ONTO) today announced the first customer acceptance and purchase of its new product, the Aspect® System, at one of the top three memory manufacturers of leading-edge 3D-NAND devices. After successful factory demonstrations, additional Aspect systems are shipping this quarter and in the first quarter of 2021 for evaluations...

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KLA Introduces Two New Systems That Take on Semiconductor Manufacturing's Toughest Problems
Inspection Equipment

KLA Introduces Two New Systems That Take on Semiconductor Manufacturing's Toughest Problems

PWG5™ attacks 3D NAND process issues while Surfscan® SP7XP tackles 3nm logic defectivity Milpitas, Calif., Dec. 10, 2020 /PRNewswire/ -- Today KLA Corporation (NASDAQ: KLAC) announced two new products: the PWG5™ wafer geometry system and the Surfscan® SP7XP wafer defect inspection system. The new systems are designed to address exceedingly difficult issues in the manufacture of...

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New IC Metrology Systems are Ideal for 5G, AI, Data Centers and Edge Computing Applications
Metrology Equipment

New IC Metrology Systems are Ideal for 5G, AI, Data Centers and Edge Computing Applications

Available in Archer™ 750 overlay and SpectraShape™ 11k optical critical dimension models. Archer 750 overlay metrology system generates accurate and robust measurements of overlay error in the presence of process variation. SpectraShape 11k CD and dimensional shape metrology system provides sensitivity and productivity that accommodates materials, structures and wafer shapes.

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New Electronic Digital Height Master from Starrett Features Digital Readout Display
Metrology Equipment

New Electronic Digital Height Master from Starrett Features Digital Readout Display

Starrett introduces the new Digi-Check No. 258 series height masters with a digital readout able to display an instant readout to .0001" or 0.001mm.  The product features a precision micrometer head as well as a digital readout display. Capabilities include settings for checking bore gages, inside micrometers, end measuring rods and other gages, and height measurement of parts.

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Latest 6DoF Laser Trackers Meet IEC Standards for Shock, Vibration and Extreme Thermal Conditions
Metrology Equipment

Latest 6DoF Laser Trackers Meet IEC Standards for Shock, Vibration and Extreme Thermal Conditions

The 6DoF Laser Trackers are available in Vantage E6 and Vantage S6 models with an operating range of 35 and 80 m respectively. The units are offered with a capacity to measure and scan over tens of meters without loss in accuracy and line of sight issues. They are suitable for use in applications such as automotive, aerospace, construction, heavy equipment and shipbuilding industries. The...

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We are using the power of our platform to aid in the mass shortage of critical supplies. If your company can help provide supplies, capabilities, or materials for products such as N-95 Masks and Tyvek SuitsPlease let us know.

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