New Reflectance and Color Monitoring Integrates QC Systems and PLCs
Available with optics head attached to a dual linear-stage system to scan the panel. Provides real-time feedback for process control of color and reflectance. Measures spectral reflectance and color for consistency across reflective surfaces for glass lites.
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New Reflectance and Color Monitoring Integrates QC Systems and PLCs
Available with optics head attached to a dual linear-stage system to scan the panel. Provides real-time feedback for process control of color and reflectance. Measures spectral reflectance and color for consistency across reflective surfaces for glass lites.
Read More »
New kSA SpectR Metrology Solution for Measuring Absolute Spectral Reflectance
Measures custom spectral features such as reflectance minima, maxima, inflection points, or baseline scatter level. Configured in a specular reflectance geometry as well as capable to work on complex thin-film structures. Ideal for in situ monitoring and process control including VCSELs, DBRs and other complex device structures.
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New kSA SpectR Metrology Solution for Measuring Absolute Spectral Reflectance
Measures custom spectral features such as reflectance minima, maxima, inflection points, or baseline scatter level. Configured in a specular reflectance geometry as well as capable to work on complex thin-film structures. Ideal for in situ monitoring and process control including VCSELs, DBRs and other complex device structures.
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Smart Pricing Labels for Smart Retailers
To learn more about ESLs and how companies like ZDA Communications can help, download this whitepaper now.
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Latest Metrology Tool Comes with Accessory to Viewports of Various Sizes
Allows researchers and operators to view wafers and platen from within the k-Space software. Utilizes high-resolution color camera and is plug-and play compatible with all k-Space thin-film metrology software. Offers zoom lens that allows for focus over large range of working distances.
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Latest Metrology Tool Comes with Accessory to Viewports of Various Sizes
Allows researchers and operators to view wafers and platen from within the k-Space software. Utilizes high-resolution color camera and is plug-and play compatible with all k-Space thin-film metrology software. Offers zoom lens that allows for focus over large range of working distances.
Read More »
k-Space Ships 5 Glass Breakage Metrology Systems
[Dexter, MI, January 26] - k-Space Associates, Inc. is proud to announce that they shipped five glass breakage and defect detection metrology systems to the U.S. and Asia for a large international manufacturing customer. The kSA Glass Breakage and Defect Detection tool is an inline vision-based metrology system that determines Go/No-Go (Pass/Fail) conditions for every glass-based panel that...
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k-Space Ships 5 Glass Breakage Metrology Systems
[Dexter, MI, January 26] - k-Space Associates, Inc. is proud to announce that they shipped five glass breakage and defect detection metrology systems to the U.S. and Asia for a large international manufacturing customer. The kSA Glass Breakage and Defect Detection tool is an inline vision-based metrology system that determines Go/No-Go (Pass/Fail) conditions for every glass-based panel that...
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Onto Innovation Announces First Customer Qualification of New Aspect® IRCD System
Wilmington, Mass., December 16, 2020 – Onto Innovation Inc. (NYSE: ONTO) today announced the first customer acceptance and purchase of its new product, the Aspect® System, at one of the top three memory manufacturers of leading-edge 3D-NAND devices. After successful factory demonstrations, additional Aspect systems are shipping this quarter and in the first quarter of 2021 for evaluations at...
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Onto Innovation Announces First Customer Qualification of New Aspect-® IRCD System
Wilmington, Mass., December 16, 2020 – Onto Innovation Inc. (NYSE: ONTO) today announced the first customer acceptance and purchase of its new product, the Aspect® System, at one of the top three memory manufacturers of leading-edge 3D-NAND devices. After successful factory demonstrations, additional Aspect systems are shipping this quarter and in the first quarter of 2021 for evaluations at...
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More performance and functionality for Sinumerik 828D CNC
Siemens new SINUMERIK 828D ADVANCED, SINUMERIK 828D and SINUMERIK 828D BASIC sets the standard for productivity enhancements of turning and milling operations on standardized machines and simplify the automation of grinding machines. See our video to learn all about it.
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