New Reflectance and Color Monitoring Integrates QC Systems and PLCs
Available with optics head attached to a dual linear-stage system to scan the panel. Provides real-time feedback for process control of color and reflectance. Measures spectral reflectance and color for consistency across reflective surfaces for glass lites.
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New kSA SpectR Metrology Solution for Measuring Absolute Spectral Reflectance
Measures custom spectral features such as reflectance minima, maxima, inflection points, or baseline scatter level. Configured in a specular reflectance geometry as well as capable to work on complex thin-film structures. Ideal for in situ monitoring and process control including VCSELs, DBRs and other complex device structures.
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Latest Metrology Tool Comes with Accessory to Viewports of Various Sizes
Allows researchers and operators to view wafers and platen from within the k-Space software. Utilizes high-resolution color camera and is plug-and play compatible with all k-Space thin-film metrology software. Offers zoom lens that allows for focus over large range of working distances.
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k-Space Ships 5 Glass Breakage Metrology Systems
[Dexter, MI, January 26] - k-Space Associates, Inc. is proud to announce that they shipped five glass breakage and defect detection metrology systems to the U.S. and Asia for a large international manufacturing customer. The kSA Glass Breakage and Defect Detection tool is an inline vision-based metrology system that determines Go/No-Go (Pass/Fail) conditions for every glass-based panel that...
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Declaration of Independence: Why the United States Must End Reliance on Chinese Rare Earth Suppliers
This ebook discusses the significance of rare earth materials for the United States and China's role within the market.
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Onto Innovation Announces First Customer Qualification of New Aspect® IRCD System
Wilmington, Mass., December 16, 2020 – Onto Innovation Inc. (NYSE: ONTO) today announced the first customer acceptance and purchase of its new product, the Aspect® System, at one of the top three memory manufacturers of leading-edge 3D-NAND devices. After successful factory demonstrations, additional Aspect systems are shipping this quarter and in the first quarter of 2021 for evaluations...
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KLA Introduces Two New Systems That Take on Semiconductor Manufacturing's Toughest Problems
PWG5™ attacks 3D NAND process issues while Surfscan® SP7XP tackles 3nm logic defectivity Milpitas, Calif., Dec. 10, 2020 /PRNewswire/ -- Today KLA Corporation (NASDAQ: KLAC) announced two new products: the PWG5™ wafer geometry system and the Surfscan® SP7XP wafer defect inspection system. The new systems are designed to address exceedingly difficult issues in the manufacture of...
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New Materials Metrology Platform Utilizes Raman Spectroscopy Technology
Designed to measure materials properties such as stress, strain and surface. Extract materials properties of in-die structures by fast and non-destructive means. Ideal for both memory and logic applications.
Read More »New Control Metrology Systems for Advanced Device Manufacturing
Atlas V metrology system helps to measure several key steps that include buried features, not visible by CD-SEM and other techniques. IMPULSE V system work seamlessly with CMP systems to provide high throughput run-to-run control for critical process steps. Aspect metrology system designed for the current and future challenges of advanced 3D NAND devices.
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New IC Metrology Systems are Ideal for 5G, AI, Data Centers and Edge Computing Applications
Available in Archer™ 750 overlay and SpectraShape™ 11k optical critical dimension models. Archer 750 overlay metrology system generates accurate and robust measurements of overlay error in the presence of process variation. SpectraShape 11k CD and dimensional shape metrology system provides sensitivity and productivity that accommodates materials, structures and wafer shapes.
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New Electronic Digital Height Master from Starrett Features Digital Readout Display
Starrett introduces the new Digi-Check No. 258 series height masters with a digital readout able to display an instant readout to .0001 or 0.001mm. The product features a precision micrometer head as well as a digital readout display. Capabilities include settings for checking bore gages, inside micrometers, end measuring rods and other gages, and height measurement of parts.
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SEALTITE® Fittings and Cord Grips Offer Longer Lasting Protection
Anamet Electrical's 316 Stainless steel SEALTITE® fittings and UL-listed cord grips protect sensitive wiring components from fluids, corrosive contaminations, bumps, and abrasions with a steel core and liquid tight conduit jacket. Check out this video to learn more.
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