k-Space Associates, Inc.

New kSA ACE Monitors Flux and Growth Rate of Atomic Species
Test & Measurement

New kSA ACE Monitors Flux and Growth Rate of Atomic Species

Uses conventional hollow cathode lamps (HCLs) to generate the atomic emission for the elements. Utilizes two high-sensitivity, UV-optimized solid-state spectrometers, one to monitor absorption and other to monitor signal drift from HCLs. Ideal for applications in fabrication of III-V and II-V compounds, semiconductor devices, thin film sensors, solar cells, optical coatings, x-ray optics and flat...

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New Emissometer Performs In-Depth Analysis
Test & Measurement

New Emissometer Performs In-Depth Analysis

Designed to generate high-resolution diffuse and specular reflectance and total emissivity maps of MOCVD carriers. Displays the number of defects it detected and summarizes the number of the pocket, web and halo-region defects. Early defect detection and detects quality issues before shipping the carrier to end user.

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k-Space Ships 5 Glass Breakage Metrology Systems
Test & Measurement

k-Space Ships 5 Glass Breakage Metrology Systems

[Dexter, MI, January 26] -  k-Space Associates, Inc. is proud to announce that they shipped five glass breakage and defect detection metrology systems to the U.S. and Asia for a large international manufacturing customer. The kSA Glass Breakage and Defect Detection tool is an inline vision-based metrology system that determines Go/No-Go (Pass/Fail) conditions for every glass-based panel that...

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Company News

k-Space Associates, Inc. Achieves Record Thin-Film Metrology Sales

[Dexter, MI, Jan. 11, 2022] -- k-Space Associates, Inc., a leader in metrology tools for research and production facilities, increased its 2021 thin-film metrology sales by 30% compared to 2020, making it a record-breaking sales year. This increase was in part due to robust sales of the kSA MOS UltraScan. The kSA MOS UltraScan ex situ metrology tool is a high-resolution scanning system that...

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New kSA ACE Monitors Flux and Growth Rate of Atomic Species
Test & Measurement

New kSA ACE Monitors Flux and Growth Rate of Atomic Species

Uses conventional hollow cathode lamps (HCLs) to generate the atomic emission for the elements. Utilizes two high-sensitivity, UV-optimized solid-state spectrometers, one to monitor absorption and other to monitor signal drift from HCLs. Ideal for applications in fabrication of III-V and II-V compounds, semiconductor devices, thin film sensors, solar cells, optical coatings, x-ray optics and flat...

Read More »
New Emissometer Performs In-Depth Analysis
Test & Measurement

New Emissometer Performs In-Depth Analysis

Designed to generate high-resolution diffuse and specular reflectance and total emissivity maps of MOCVD carriers. Displays the number of defects it detected and summarizes the number of the pocket, web and halo-region defects. Early defect detection and detects quality issues before shipping the carrier to end user.

Read More »
Company News

k-Space Received a Large Solar Panel Edge Profile Metrology Order

[Dexter, MI, Nov. 9, 2021] ­‑ k-Space Associates, Inc. is excited to announce that they recently received a large order for solar panel edge profile metrology systems. The non-contact, inline glass metrology tool measures the edge of the solar panels using proven optical triangulation technology and 405nm laser technology to resolve glass panel edge profiles. The system measures edge radius...

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k-Space Ships 5 Glass Breakage Metrology Systems
Test & Measurement

k-Space Ships 5 Glass Breakage Metrology Systems

[Dexter, MI, January 26] -  k-Space Associates, Inc. is proud to announce that they shipped five glass breakage and defect detection metrology systems to the U.S. and Asia for a large international manufacturing customer. The kSA Glass Breakage and Defect Detection tool is an inline vision-based metrology system that determines Go/No-Go (Pass/Fail) conditions for every glass-based panel that...

Read More »

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