k-Space Associates, Inc.
2182 Bishop Circle East
Dexter, MI 48130
New kSA ACE Monitors Flux and Growth Rate of Atomic Species
Uses conventional hollow cathode lamps (HCLs) to generate the atomic emission for the elements. Utilizes two high-sensitivity, UV-optimized solid-state spectrometers, one to monitor absorption and other to monitor signal drift from HCLs. Ideal for applications in fabrication of III-V and II-V compounds, semiconductor devices, thin film sensors, solar cells, optical coatings, x-ray optics and flat...
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New kSA ACE Monitors Flux and Growth Rate of Atomic Species
Uses conventional hollow cathode lamps (HCLs) to generate the atomic emission for the elements. Utilizes two high-sensitivity, UV-optimized solid-state spectrometers, one to monitor absorption and other to monitor signal drift from HCLs. Ideal for applications in fabrication of III-V and II-V compounds, semiconductor devices, thin film sensors, solar cells, optical coatings, x-ray optics and flat...
Read More »
New Emissometer Performs In-Depth Analysis
Designed to generate high-resolution diffuse and specular reflectance and total emissivity maps of MOCVD carriers. Displays the number of defects it detected and summarizes the number of the pocket, web and halo-region defects. Early defect detection and detects quality issues before shipping the carrier to end user.
Read More »
New Emissometer Performs In-Depth Analysis
Designed to generate high-resolution diffuse and specular reflectance and total emissivity maps of MOCVD carriers. Displays the number of defects it detected and summarizes the number of the pocket, web and halo-region defects. Early defect detection and detects quality issues before shipping the carrier to end user.
Read More »
New Reflectance and Color Monitoring Integrates QC Systems and PLCs
Available with optics head attached to a dual linear-stage system to scan the panel. Provides real-time feedback for process control of color and reflectance. Measures spectral reflectance and color for consistency across reflective surfaces for glass lites.
Read More »
New Reflectance and Color Monitoring Integrates QC Systems and PLCs
Available with optics head attached to a dual linear-stage system to scan the panel. Provides real-time feedback for process control of color and reflectance. Measures spectral reflectance and color for consistency across reflective surfaces for glass lites.
Read More »
New X-Ray Fluorescence Measures Layer Thickness of Metal and Dielectric Films
Provides inline measurements for films on substrates, glass and solar panels. Includes X-ray tube with high voltage generator and X-ray detector system. Measures atomic species based on the customer’s coating formula and measurement needs.
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New X-Ray Fluorescence Measures Layer Thickness of Metal and Dielectric Films
Provides inline measurements for films on substrates, glass and solar panels. Includes X-ray tube with high voltage generator and X-ray detector system. Measures atomic species based on the customer’s coating formula and measurement needs.
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New kSA SpectR Metrology Solution for Measuring Absolute Spectral Reflectance
Measures custom spectral features such as reflectance minima, maxima, inflection points, or baseline scatter level. Configured in a specular reflectance geometry as well as capable to work on complex thin-film structures. Ideal for in situ monitoring and process control including VCSELs, DBRs and other complex device structures.
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New kSA SpectR Metrology Solution for Measuring Absolute Spectral Reflectance
Measures custom spectral features such as reflectance minima, maxima, inflection points, or baseline scatter level. Configured in a specular reflectance geometry as well as capable to work on complex thin-film structures. Ideal for in situ monitoring and process control including VCSELs, DBRs and other complex device structures.
Read More »k-Space Associates, Inc. Achieves Record Thin-Film Metrology Sales
[Dexter, MI, Jan. 11, 2022] -- k-Space Associates, Inc., a leader in metrology tools for research and production facilities, increased its 2021 thin-film metrology sales by 30% compared to 2020, making it a record-breaking sales year. This increase was in part due to robust sales of the kSA MOS UltraScan. The kSA MOS UltraScan ex situ metrology tool is a high-resolution scanning system that...
Read More »k-Space Associates, Inc. Achieves Record Thin-Film Metrology Sales
[Dexter, MI, Jan. 11, 2022] -- k-Space Associates, Inc., a leader in metrology tools for research and production facilities, increased its 2021 thin-film metrology sales by 30% compared to 2020, making it a record-breaking sales year. This increase was in part due to robust sales of the kSA MOS UltraScan. The kSA MOS UltraScan ex situ metrology tool is a high-resolution scanning system that...
Read More »
New kSA ACE Monitors Flux and Growth Rate of Atomic Species
Uses conventional hollow cathode lamps (HCLs) to generate the atomic emission for the elements. Utilizes two high-sensitivity, UV-optimized solid-state spectrometers, one to monitor absorption and other to monitor signal drift from HCLs. Ideal for applications in fabrication of III-V and II-V compounds, semiconductor devices, thin film sensors, solar cells, optical coatings, x-ray optics and flat...
Read More »
New kSA ACE Monitors Flux and Growth Rate of Atomic Species
Uses conventional hollow cathode lamps (HCLs) to generate the atomic emission for the elements. Utilizes two high-sensitivity, UV-optimized solid-state spectrometers, one to monitor absorption and other to monitor signal drift from HCLs. Ideal for applications in fabrication of III-V and II-V compounds, semiconductor devices, thin film sensors, solar cells, optical coatings, x-ray optics and flat...
Read More »
New Emissometer Performs In-Depth Analysis
Designed to generate high-resolution diffuse and specular reflectance and total emissivity maps of MOCVD carriers. Displays the number of defects it detected and summarizes the number of the pocket, web and halo-region defects. Early defect detection and detects quality issues before shipping the carrier to end user.
Read More »
New Emissometer Performs In-Depth Analysis
Designed to generate high-resolution diffuse and specular reflectance and total emissivity maps of MOCVD carriers. Displays the number of defects it detected and summarizes the number of the pocket, web and halo-region defects. Early defect detection and detects quality issues before shipping the carrier to end user.
Read More »k-Space Received a Large Solar Panel Edge Profile Metrology Order
[Dexter, MI, Nov. 9, 2021] ‑ k-Space Associates, Inc. is excited to announce that they recently received a large order for solar panel edge profile metrology systems. The non-contact, inline glass metrology tool measures the edge of the solar panels using proven optical triangulation technology and 405nm laser technology to resolve glass panel edge profiles. The system measures edge radius...
Read More »k-Space Received a Large Solar Panel Edge Profile Metrology Order
[Dexter, MI, Nov. 9, 2021] ‑ k-Space Associates, Inc. is excited to announce that they recently received a large order for solar panel edge profile metrology systems. The non-contact, inline glass metrology tool measures the edge of the solar panels using proven optical triangulation technology and 405nm laser technology to resolve glass panel edge profiles. The system measures edge radius...
Read More »
New Reflectance and Color Monitoring Integrates QC Systems and PLCs
Available with optics head attached to a dual linear-stage system to scan the panel. Provides real-time feedback for process control of color and reflectance. Measures spectral reflectance and color for consistency across reflective surfaces for glass lites.
Read More »
New Reflectance and Color Monitoring Integrates QC Systems and PLCs
Available with optics head attached to a dual linear-stage system to scan the panel. Provides real-time feedback for process control of color and reflectance. Measures spectral reflectance and color for consistency across reflective surfaces for glass lites.
Read More »