ProductionLine Testers, Inc.
Tracy, CA 95304
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New Production Line System Runs More Than 1,000 IC Tests per Second
April 19, 2007 (Pleasanton, CA) - ProductionLine Testers (PLT) announces that it will introduce a smaller integrated circuit test system that is twice as fast as its fastest current model at the Semicon West 2007 conference in San Francisco in July. (See it in booth 7862.) The PLT1000 is designed to test low-to-medium complexity wafers or packaged IC's at production-line rates of 1,000 tests per...
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Test System checks low pin-count ICs.
Measuring 11 x 12 in., benchtop Model IC-100 fits on top of most handlers and probers and offers GUI software interface for end-of-line testing. Three different test heads are available. Most internal calculations are pre-compiled before actually testing device, and many setups and housekeeping tasks are done during prober/handler cycle time. Test program development is done using intuitive...
Read More »
Integrated Circuit Tester can be customized for application.
Model IC240 bench top test system combines software interface with configurable hardware core, providing freedom to fully expand/migrate capabilities as needed. It is not limited by preprogrammed software or built-in components. Prototyping board comes with decoder, buffers and software drivers for fast bread-boarding of custom instruments. System is built around C-sized card chassis with variety...
Read More »
Linear Device Tester tests op amps and comparators.
Model IC443 bench top, integrated-circuit test system interfaces directly with handlers and probers for wafer probing or final assembly testing. Specifications are input into Excel-like spreadsheet, and test is compiled. Unit includes slew rate window comparator, sine wave generator, and 16-bit setting and measurement accuracy. Each analog pin has precision 4-quadrant VI-source with programmable...
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Continuity Test System is self-contained.
Model OS-32 plug-n-go, auto programming test system provides 16-bit accuracy on both source and measurement and fast measurement switching on up to 1000 pins. Test speed is rated at 1 msec/pin. Built-in rack mount enclosure, system measures 11 x 13 x 14 in. (D x H x W, max 400 pins) and 20 x 13 x 20 in. (D x H x W, max 1,000 pins). Unit has built-in 10/100 network interface, touch screen, and 50...
Read More »
New Production Line System Runs More Than 1,000 IC Tests per Second
April 19, 2007 (Pleasanton, CA) - ProductionLine Testers (PLT) announces that it will introduce a smaller integrated circuit test system that is twice as fast as its fastest current model at the Semicon West 2007 conference in San Francisco in July. (See it in booth 7862.) The PLT1000 is designed to test low-to-medium complexity wafers or packaged IC's at production-line rates of 1,000 tests per...
Read More »
Test System checks low pin-count ICs.
Measuring 11 x 12 in., benchtop Model IC-100 fits on top of most handlers and probers and offers GUI software interface for end-of-line testing. Three different test heads are available. Most internal calculations are pre-compiled before actually testing device, and many setups and housekeeping tasks are done during prober/handler cycle time. Test program development is done using intuitive...
Read More »
Integrated Circuit Tester can be customized for application.
Model IC240 bench top test system combines software interface with configurable hardware core, providing freedom to fully expand/migrate capabilities as needed. It is not limited by preprogrammed software or built-in components. Prototyping board comes with decoder, buffers and software drivers for fast bread-boarding of custom instruments. System is built around C-sized card chassis with variety...
Read More »
Linear Device Tester tests op amps and comparators.
Model IC443 bench top, integrated-circuit test system interfaces directly with handlers and probers for wafer probing or final assembly testing. Specifications are input into Excel-like spreadsheet, and test is compiled. Unit includes slew rate window comparator, sine wave generator, and 16-bit setting and measurement accuracy. Each analog pin has precision 4-quadrant VI-source with programmable...
Read More »
Continuity Test System is self-contained.
Model OS-32 plug-n-go, auto programming test system provides 16-bit accuracy on both source and measurement and fast measurement switching on up to 1000 pins. Test speed is rated at 1 msec/pin. Built-in rack mount enclosure, system measures 11 x 13 x 14 in. (D x H x W, max 400 pins) and 20 x 13 x 20 in. (D x H x W, max 1,000 pins). Unit has built-in 10/100 network interface, touch screen, and 50...
Read More »