Sloan Technology Corp.
Goleta, CA 93117
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Scanning Probe Microscope suits imaging applications to 300-
EnviroScope(TM) Atomic Force Microscope System combines hermetically sealed sample chamber with modular environmental controls. It provides atomic force microcopy scanning under non-ambient vacuum, gas, and liquid environments. In addition to inert and reactive environment research, product offers various imaging modes for multiple applications. EnviroScope scanner head includes piezoelectric...
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Surface Profiler offers detailed surface characterization.
DektakÃ-® 6M bench-top stylus surface profiler incorporates Low-Inertia Sensor 3 head to provide step height, surface roughness, and waviness measurements for samples up to 150 mm. Suitable for semiconductor, data storage, and industrial applications, it measures step heights on any surface with programmable stylus force down to 1 mg and Z-height capability to 1 mm. It also delivers...
Read More »Cantilever Sensor works in air or fluids.
Scentris(TM) sensor array, for commercial applications, uses cantilever surface coated with material that has selective affinity for given target substance. When target substance encounters cantilever, it generates mechanical signal that bends or changes resonance frequency of cantilever. Single sensor can be coated to detect array of different chemical agents. It measures cantilever deflections...
Read More »NSOM Microscope interfaces easily to detectors.
Aurora-3(TM) Near-Field Scanning Optical Microscope has open architecture for easy interfacing with detectors and spectrometers. It combines optical characterization with scanning probe microscopy (SPM) technology to overcome diffraction limit problems. Split light path allows user to simultaneously view both transmission and reflection of probe tip and sample. Real-time linearized scanner...
Read More »
Scanning Probe Microscope includes hand-held tool.
MultiMode(TM) PicoForce(TM) Scanning Probe Microscope (SPM) Control System enables force measurements and manipulation of biological/material samples at pico-Newton level. Combined with software developed for force spectroscopy, SPM can view inter- and intra-molecular forces. MultiMode PicoForce utilizes atomic force microscope (AFM), scanner with closed-loop control of Z-axis for sample...
Read More »
Scanning Probe Microscope suits imaging applications to 300-
EnviroScope(TM) Atomic Force Microscope System combines hermetically sealed sample chamber with modular environmental controls. It provides atomic force microcopy scanning under non-ambient vacuum, gas, and liquid environments. In addition to inert and reactive environment research, product offers various imaging modes for multiple applications. EnviroScope scanner head includes piezoelectric...
Read More »
Surface Profiler offers detailed surface characterization.
DektakÃ-® 6M bench-top stylus surface profiler incorporates Low-Inertia Sensor 3 head to provide step height, surface roughness, and waviness measurements for samples up to 150 mm. Suitable for semiconductor, data storage, and industrial applications, it measures step heights on any surface with programmable stylus force down to 1 mg and Z-height capability to 1 mm. It also delivers...
Read More »Cantilever Sensor works in air or fluids.
Scentris(TM) sensor array, for commercial applications, uses cantilever surface coated with material that has selective affinity for given target substance. When target substance encounters cantilever, it generates mechanical signal that bends or changes resonance frequency of cantilever. Single sensor can be coated to detect array of different chemical agents. It measures cantilever deflections...
Read More »NSOM Microscope interfaces easily to detectors.
Aurora-3(TM) Near-Field Scanning Optical Microscope has open architecture for easy interfacing with detectors and spectrometers. It combines optical characterization with scanning probe microscopy (SPM) technology to overcome diffraction limit problems. Split light path allows user to simultaneously view both transmission and reflection of probe tip and sample. Real-time linearized scanner...
Read More »
Scanning Probe Microscope includes hand-held tool.
MultiMode(TM) PicoForce(TM) Scanning Probe Microscope (SPM) Control System enables force measurements and manipulation of biological/material samples at pico-Newton level. Combined with software developed for force spectroscopy, SPM can view inter- and intra-molecular forces. MultiMode PicoForce utilizes atomic force microscope (AFM), scanner with closed-loop control of Z-axis for sample...
Read More »